Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18957 | 462 | 21.7 | 49% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
192 | 20771 | JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ION MIRROR | Author keyword | 21 | 90% | 2% | 9 |
2 | ORTHOGONAL ACCELERATION | Author keyword | 8 | 70% | 2% | 7 |
3 | TIME OF FLIGHT DESIGN | Author keyword | 4 | 75% | 1% | 3 |
4 | REFLECTRON | Author keyword | 4 | 33% | 2% | 10 |
5 | MULTI TURN TIME OF FLIGHT MASS SPECTROMETER | Author keyword | 4 | 46% | 1% | 6 |
6 | PERFECT FOCUSING | Author keyword | 3 | 100% | 1% | 3 |
7 | REMOTE LASER MASS SPECTROSCOPY | Author keyword | 2 | 67% | 0% | 2 |
8 | ION OPTICS | Author keyword | 2 | 12% | 3% | 16 |
9 | CURVED FIELD REFLECTRON | Author keyword | 1 | 100% | 0% | 2 |
10 | CYLINDRICAL REFLECTRON | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ION MIRROR | 21 | 90% | 2% | 9 | Search ION+MIRROR | Search ION+MIRROR |
2 | ORTHOGONAL ACCELERATION | 8 | 70% | 2% | 7 | Search ORTHOGONAL+ACCELERATION | Search ORTHOGONAL+ACCELERATION |
3 | TIME OF FLIGHT DESIGN | 4 | 75% | 1% | 3 | Search TIME+OF+FLIGHT+DESIGN | Search TIME+OF+FLIGHT+DESIGN |
4 | REFLECTRON | 4 | 33% | 2% | 10 | Search REFLECTRON | Search REFLECTRON |
5 | MULTI TURN TIME OF FLIGHT MASS SPECTROMETER | 4 | 46% | 1% | 6 | Search MULTI+TURN+TIME+OF+FLIGHT+MASS+SPECTROMETER | Search MULTI+TURN+TIME+OF+FLIGHT+MASS+SPECTROMETER |
6 | PERFECT FOCUSING | 3 | 100% | 1% | 3 | Search PERFECT+FOCUSING | Search PERFECT+FOCUSING |
7 | REMOTE LASER MASS SPECTROSCOPY | 2 | 67% | 0% | 2 | Search REMOTE+LASER+MASS+SPECTROSCOPY | Search REMOTE+LASER+MASS+SPECTROSCOPY |
8 | ION OPTICS | 2 | 12% | 3% | 16 | Search ION+OPTICS | Search ION+OPTICS |
9 | CURVED FIELD REFLECTRON | 1 | 100% | 0% | 2 | Search CURVED+FIELD+REFLECTRON | Search CURVED+FIELD+REFLECTRON |
10 | CYLINDRICAL REFLECTRON | 1 | 100% | 0% | 2 | Search CYLINDRICAL+REFLECTRON | Search CYLINDRICAL+REFLECTRON |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ION MIRROR | 15 | 88% | 2% | 7 |
2 | MULTUM II | 6 | 80% | 1% | 4 |
3 | REFLECTRON | 6 | 29% | 4% | 17 |
4 | ELECTROSTATIC MIRROR | 4 | 75% | 1% | 3 |
5 | ION OPTICS | 4 | 38% | 2% | 8 |
6 | CURVED FIELD REFLECTRON | 3 | 31% | 2% | 8 |
7 | MICROBORE CAPILLARY COLUMN | 2 | 67% | 0% | 2 |
8 | TOFI | 2 | 67% | 0% | 2 |
9 | TOROIDAL CONDENSER | 2 | 67% | 0% | 2 |
10 | CORRELATED DELAYED EXTRACTION | 1 | 100% | 0% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Orthogonal acceleration time-of-flight mass spectrometry | 2000 | 166 | 83 | 23% |
Analysis of paint defects by mass spectroscopy (LAMMA((R))/ToF-SIMS) | 2004 | 3 | 1 | 100% |
ACHIEVING THE MAXIMUM CHARACTERIZING POWER FOR CHROMATOGRAPHIC DETECTION BY MASS-SPECTROMETRY | 1994 | 6 | 6 | 100% |
TIME-OF-FLIGHT MASS ANALYZERS | 1993 | 25 | 23 | 52% |
ELECTROSPRAY-IONIZATION ON A REFLECTING TIME-OF-FLIGHT MASS-SPECTROMETER | 1994 | 20 | 11 | 45% |
Time-of-flight mass spectrometry: State-of-the-art in chemical analysis and molecular science | 1996 | 26 | 58 | 26% |
Hybrid quadrupole/time-of-flight mass spectrometers for analysis of biomolecules | 2005 | 15 | 45 | 16% |
A DUAL-REFLECTRON TANDEM TIME-OF-FLIGHT MASS-SPECTROMETER | 1994 | 1 | 8 | 63% |
THE INTERPRETATION OF REFLECTRON TIME-OF-FLIGHT MASS-SPECTRA | 1994 | 0 | 3 | 67% |
THE EARLY YEARS AS CHRONICLED BY THE EUROPEAN TIME-OF-FLIGHT SYMPOSIA | 1994 | 3 | 13 | 46% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MET MET TECHNOL | 1 | 50% | 0.4% | 2 |
2 | MIDDLE ATLANTIC MASS SPECT | 1 | 40% | 0.4% | 2 |
3 | MIDDLE ATLANTIC MASS SPE OMETRY | 1 | 16% | 1.1% | 5 |
4 | ANAL RUMENT | 1 | 50% | 0.2% | 1 |
5 | CMS FIELD PROD | 1 | 50% | 0.2% | 1 |
6 | INTER IAL ELE OCHEM GRP | 1 | 50% | 0.2% | 1 |
7 | LEHRSTUHL PHYS CHEM ANALYT | 0 | 20% | 0.4% | 2 |
8 | FIS ASTRONOM | 0 | 33% | 0.2% | 1 |
9 | PROBLEMS CONTROL COMPLEX SYST | 0 | 33% | 0.2% | 1 |
10 | MASS SPE | 0 | 25% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000192483 | QUADRUPOLE ION TRAP//RECTILINEAR ION TRAP//RESONANCE EJECTION |
2 | 0.0000160188 | SECOND ORDER FOCUSING//SPACE PLASMA INSTRUMENT//SPHERICAL CONDENSER |
3 | 0.0000146176 | SUPERSONIC JET SPECTROMETRY//SINGLE PHOTON IONIZATION//ABT UMWELT PROZES EM |
4 | 0.0000139690 | CONDENSED GASES//ELECTRONIC SPUTTERING//PLASMA DESORPTION MASS SPECTROMETRY |
5 | 0.0000124931 | CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//ACCURACY OF COMPUTATION |
6 | 0.0000123816 | SALDI//MALDI//IONIC LIQUID MATRICES |
7 | 0.0000116819 | CURL FREE VECTOR POTENTIAL//MACRO SCALE QUANTUM EFFECTS//TRANSITION AMPLITUDE WAVE |
8 | 0.0000113882 | WEDGE AND STRIP ANODE//MICROCHANNEL PLATE//POSITION SENSITIVE ANODE |
9 | 0.0000099348 | LAMMS//LASER MICROPROBE MASS SPECTROMETRY//FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY |
10 | 0.0000085468 | PEPTIDE FRAGMENTATION//COMPUTAT PROTE GRP//PROLINE EFFECT |