Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18906 | 464 | 17.5 | 54% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1597 | 6577 | ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | IMAGING ELLIPSOMETRY | Author keyword | 17 | 43% | 6% | 30 |
2 | TOTAL INTERNAL REFLECTION ELLIPSOMETRY | Author keyword | 6 | 48% | 2% | 10 |
3 | ROTATING POLARIZER ANALYZER ELLIPSOMETER | Author keyword | 3 | 100% | 1% | 3 |
4 | IMAGING ELLIPSOMETER | Author keyword | 3 | 50% | 1% | 4 |
5 | TOTAL INTERNAL REFLECTION IMAGING ELLIPSOMETRY | Author keyword | 3 | 60% | 1% | 3 |
6 | ICHTEN GRENZFLACHEN 4 | Address | 2 | 67% | 0% | 2 |
7 | TIN KA PING PHOTON | Address | 2 | 67% | 0% | 2 |
8 | EQUIPMENT TECHNOL | Address | 2 | 50% | 1% | 3 |
9 | OFF NULL ELLIPSOMETRY | Author keyword | 1 | 50% | 0% | 2 |
10 | REAL TIME SPECTROSCOPIC ELLIPSOMETRY SE | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SCANNING ELLIPSOMETER | 19 | 52% | 6% | 26 |
2 | OFF NULL ELLIPSOMETRY | 11 | 78% | 2% | 7 |
3 | ANALYZER ELLIPSOMETERS | 9 | 83% | 1% | 5 |
4 | IMAGING MICROELLIPSOMETRY | 9 | 83% | 1% | 5 |
5 | MICROELLIPSOMETRY | 5 | 63% | 1% | 5 |
6 | OPTICAL PROTEIN CHIP | 4 | 67% | 1% | 4 |
7 | INTERFEROMETRIC ELLIPSOMETRY | 4 | 75% | 1% | 3 |
8 | OPTIMIZING PRECISION | 4 | 46% | 1% | 6 |
9 | INTERNAL REFLECTION ELLIPSOMETRY | 3 | 23% | 3% | 13 |
10 | ROTATING ANALYZER | 3 | 50% | 1% | 4 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Protein microarray biosensors based on imaging ellipsometry techniques and their applications | 2011 | 4 | 44 | 55% |
Multiple-angle-of-incidence ellipsometry | 1999 | 41 | 16 | 31% |
AUTOMATIC ROTATING ELEMENT ELLIPSOMETERS - CALIBRATION, OPERATION, AND REAL-TIME APPLICATIONS | 1990 | 145 | 98 | 14% |
Structure and function of bromodomains in chromatin-regulating complexes | 2001 | 47 | 45 | 4% |
Gene expression by mRNA analysis | 2001 | 2 | 21 | 10% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ICHTEN GRENZFLACHEN 4 | 2 | 67% | 0.4% | 2 |
2 | TIN KA PING PHOTON | 2 | 67% | 0.4% | 2 |
3 | EQUIPMENT TECHNOL | 2 | 50% | 0.6% | 3 |
4 | NML | 1 | 11% | 1.9% | 9 |
5 | GASES 2 1 | 1 | 50% | 0.2% | 1 |
6 | MAT 275 | 1 | 50% | 0.2% | 1 |
7 | MECH MECHATON ENGN | 1 | 50% | 0.2% | 1 |
8 | PROC SCI PLANT SAFETY IND SYST CHEM PROC SA | 1 | 50% | 0.2% | 1 |
9 | SWIETOKRZYSKI BIOBANK | 1 | 50% | 0.2% | 1 |
10 | NANOTECH NANOBION | 0 | 20% | 0.4% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000192497 | NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS |
2 | 0.0000178853 | INFRARED ELLIPSOMETRY//MICROELECT OPT MAT//BERLIN |
3 | 0.0000177649 | MUELLER MATRIX//SHENZHEN MINIMAL INVAS MED TECHNOL//BIOPHYS BIOIMAGING |
4 | 0.0000115246 | ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT |
5 | 0.0000115234 | CEAG//SUR E TREATMENT OPT MAT//VIBRATION STATES |
6 | 0.0000105857 | ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S |
7 | 0.0000099087 | CORROSION ELECTROCHEMICAL CHARACTERISTICS//FIBER OPTICAL SPECTROSCOPY//INFRARED FOURIER SPECTROSCOPY |
8 | 0.0000097146 | OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OIRD//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OI RD |
9 | 0.0000096396 | INSITU ELLIPSOMETRY//AGGREGATED FILMS//THIN COPPER FILMS |
10 | 0.0000088277 | HOMOPHILIC ANTIBODY//ADV DIAGNOST THER EUT//ANTIBODY FAB FRAGMENT |