Class information for:
Level 1: UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
18823 469 18.4 31%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 UNIDIRECTIONAL ERRORS Author keyword 36 65% 7% 34
2 SELF CHECKING CIRCUITS Author keyword 19 56% 5% 23
3 BALANCED CODES Author keyword 12 52% 4% 17
4 TOTALLY SELF CHECKING CHECKER Author keyword 12 86% 1% 6
5 SELF TESTING CHECKER Author keyword 11 100% 1% 6
6 TWO RAIL CODE Author keyword 8 100% 1% 5
7 UNORDERED CODES Author keyword 8 62% 2% 8
8 ASYMMETRIC ERRORS Author keyword 7 40% 3% 14
9 CONCURRENT ERROR DETECTION Author keyword 7 21% 6% 29
10 EMBEDDED CHECKERS Author keyword 6 80% 1% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 UNIDIRECTIONAL ERRORS 36 65% 7% 34 Search UNIDIRECTIONAL+ERRORS Search UNIDIRECTIONAL+ERRORS
2 SELF CHECKING CIRCUITS 19 56% 5% 23 Search SELF+CHECKING+CIRCUITS Search SELF+CHECKING+CIRCUITS
3 BALANCED CODES 12 52% 4% 17 Search BALANCED+CODES Search BALANCED+CODES
4 TOTALLY SELF CHECKING CHECKER 12 86% 1% 6 Search TOTALLY+SELF+CHECKING+CHECKER Search TOTALLY+SELF+CHECKING+CHECKER
5 SELF TESTING CHECKER 11 100% 1% 6 Search SELF+TESTING+CHECKER Search SELF+TESTING+CHECKER
6 TWO RAIL CODE 8 100% 1% 5 Search TWO+RAIL+CODE Search TWO+RAIL+CODE
7 UNORDERED CODES 8 62% 2% 8 Search UNORDERED+CODES Search UNORDERED+CODES
8 ASYMMETRIC ERRORS 7 40% 3% 14 Search ASYMMETRIC+ERRORS Search ASYMMETRIC+ERRORS
9 CONCURRENT ERROR DETECTION 7 21% 6% 29 Search CONCURRENT+ERROR+DETECTION Search CONCURRENT+ERROR+DETECTION
10 EMBEDDED CHECKERS 6 80% 1% 4 Search EMBEDDED+CHECKERS Search EMBEDDED+CHECKERS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 DETECTING CODES 11 60% 3% 12
2 ERROR DETECTING CODES 8 56% 2% 10
3 BALANCED CODES 7 56% 2% 9
4 COST ARITHMETIC CODES 6 100% 1% 4
5 TESTING CHECKERS 4 75% 1% 3
6 TSC CHECKERS 4 56% 1% 5
7 SPECTRAL NULL CODES 3 57% 1% 4
8 OF N CODES 3 100% 1% 3
9 1 OUT OF N CODE 2 67% 0% 2
10 BORDEN CODES 2 67% 0% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
On-line testing for VLSI - A compendium of approaches 1998 75 10 60%
DESIGN FOR TESTABILITY - A REVIEW OF ADVANCED METHODS 1986 2 4 50%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 RELIABLE INTEGRATED SYST GRP 3 60% 0.6% 3
2 DIPARTIMENTO SCI COMUNICAZ 1 21% 1.3% 6
3 DIPARTIMENTO DI TEC 1 100% 0.4% 2
4 IR CWPC 1 100% 0.4% 2
5 SATELLITENKOMMUNIKAT GESELL 1 100% 0.4% 2
6 FAULT TOLERANT COMP GRP 1 30% 0.6% 3
7 COMP COMMUN PLICAT LCA 1 50% 0.2% 1
8 DIPARTIMENTO MET 1 50% 0.2% 1
9 DIPARTIMENTO TEC 1 50% 0.2% 1
10 PROCESSOR DEV 2 1 50% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000210097 SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY
2 0.0000172078 ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL
3 0.0000148756 COMPUTER MEMORY SYSTEMS//HIGH DIMENSIONAL PARITY CHECK CODE//PARALLEL DECODING ARCHITECTURE
4 0.0000087548 WOM CODES//RANK MODULATION//UNIVERSAL CYCLE
5 0.0000073961 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
6 0.0000073676 SINGLE EVENT UPSET SEU//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT
7 0.0000072211 INTEGER CODES//CHECK DIGITS//CHECK DIGIT SYSTEM
8 0.0000068876 MINIHYPER//PERFECT CODES//COVERING CODE
9 0.0000068647 ASYNCHRONOUS CIRCUITS//SIGNAL TRANSITION GRAPH//SIGNAL TRANSITION GRAPHS
10 0.0000068044 ALGORITHM BASED FAULT TOLERANCE//INTERLOCKING TRANSLATION//DATA BROADCAST ELIMINATION