Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18600 | 478 | 24.6 | 60% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2274 | 4201 | SURFACE DIFFUSION//ISLAND MORPHOLOGY//LATINOAMER ESTUDIOS ILYA PRIGOGINE |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | AMERG | Address | 2 | 67% | 0% | 2 |
2 | PHYS PROCEDES VIDE | Address | 2 | 67% | 0% | 2 |
3 | INTRINSIC STRESS | Author keyword | 2 | 13% | 3% | 13 |
4 | VOLMER WEBER GROWTH | Author keyword | 2 | 33% | 1% | 4 |
5 | NANOTRON TECHNOL INC | Address | 1 | 100% | 0% | 2 |
6 | SELVEDGE LAYER | Author keyword | 1 | 100% | 0% | 2 |
7 | SPOT RADIUS | Author keyword | 1 | 50% | 0% | 2 |
8 | THIN FILM STRESSES | Author keyword | 1 | 100% | 0% | 2 |
9 | CURVATURE MEASUREMENTS | Author keyword | 1 | 29% | 1% | 4 |
10 | CHROMIUM FILM | Author keyword | 1 | 33% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | INTRINSIC STRESS | 2 | 13% | 3% | 13 | Search INTRINSIC+STRESS | Search INTRINSIC+STRESS |
2 | VOLMER WEBER GROWTH | 2 | 33% | 1% | 4 | Search VOLMER+WEBER+GROWTH | Search VOLMER+WEBER+GROWTH |
3 | SELVEDGE LAYER | 1 | 100% | 0% | 2 | Search SELVEDGE+LAYER | Search SELVEDGE+LAYER |
4 | SPOT RADIUS | 1 | 50% | 0% | 2 | Search SPOT+RADIUS | Search SPOT+RADIUS |
5 | THIN FILM STRESSES | 1 | 100% | 0% | 2 | Search THIN+FILM+STRESSES | Search THIN+FILM+STRESSES |
6 | CURVATURE MEASUREMENTS | 1 | 29% | 1% | 4 | Search CURVATURE+MEASUREMENTS | Search CURVATURE+MEASUREMENTS |
7 | CHROMIUM FILM | 1 | 33% | 1% | 3 | Search CHROMIUM+FILM | Search CHROMIUM+FILM |
8 | AMORPHOUS ALUMINIUM OXIDE | 1 | 50% | 0% | 1 | Search AMORPHOUS+ALUMINIUM+OXIDE | Search AMORPHOUS+ALUMINIUM+OXIDE |
9 | GRAIN BOUNDARY STRESS | 1 | 50% | 0% | 1 | Search GRAIN+BOUNDARY+STRESS | Search GRAIN+BOUNDARY+STRESS |
10 | IN SITU WAFER CURVATURE | 1 | 50% | 0% | 1 | Search IN+SITU+WAFER+CURVATURE | Search IN+SITU+WAFER+CURVATURE |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HARD METAL FILMS | 23 | 86% | 3% | 12 |
2 | INTRINSIC STRESS | 19 | 22% | 16% | 78 |
3 | WEBER THIN FILMS | 18 | 58% | 4% | 21 |
4 | EVAPORATED CHROMIUM | 13 | 80% | 2% | 8 |
5 | INTERNAL STRESS | 10 | 14% | 13% | 64 |
6 | TENSILE STRESSES | 8 | 56% | 2% | 10 |
7 | INTRINSIC STRESSES | 6 | 32% | 3% | 16 |
8 | VAPOR DEPOSITED ALUMINUM | 4 | 75% | 1% | 3 |
9 | INTERNAL STRESS MEASUREMENTS | 3 | 100% | 1% | 3 |
10 | AU NI MULTILAYERS | 3 | 40% | 1% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Role of atomic migration in nanocrystalline stability: Grain size and thin film stress states | 2015 | 1 | 49 | 39% |
A kinetic analysis of residual stress evolution in polycrystalline thin films | 2012 | 14 | 55 | 76% |
Stress and strain in polycrystalline thin films | 2007 | 85 | 49 | 43% |
THE INTRINSIC STRESS OF POLYCRYSTALLINE AND EPITAXIAL THIN METAL-FILMS | 1994 | 259 | 70 | 33% |
INTRINSIC STRESS IN SPUTTER-DEPOSITED THIN-FILMS | 1992 | 327 | 87 | 17% |
STRESSES AND DEFORMATION PROCESSES IN THIN-FILMS ON SUBSTRATES | 1988 | 339 | 46 | 26% |
Structure evolution during processing of polycrystalline films | 2000 | 381 | 71 | 8% |
PHOTOPOLYMER COATINGS FOR OPTICAL DISKS | 1993 | 5 | 5 | 40% |
Mechanical properties of thin films and multilayers | 1996 | 18 | 34 | 21% |
Modeling of internal stresses and interface effects in metals | 1998 | 6 | 51 | 6% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AMERG | 2 | 67% | 0.4% | 2 |
2 | PHYS PROCEDES VIDE | 2 | 67% | 0.4% | 2 |
3 | NANOTRON TECHNOL INC | 1 | 100% | 0.4% | 2 |
4 | KARLSRUHER MICRO NANO IL | 1 | 50% | 0.2% | 1 |
5 | PHYS INTER ES COUCHES MINES | 1 | 50% | 0.2% | 1 |
6 | PHYS MECAN MATENSMASP2MI TELEPORT 2 | 1 | 50% | 0.2% | 1 |
7 | CNRSENSMASP2MI | 1 | 22% | 0.4% | 2 |
8 | MET X | 0 | 33% | 0.2% | 1 |
9 | PHYMATUMR 6630 | 0 | 33% | 0.2% | 1 |
10 | EXCELLENCE NANOMFG PLICAT | 0 | 25% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000186320 | INTERFACIAL SHEARS//NON LOCAL STRESS CURVATURE RELATIONS//NON UNIFORM MISFIT STRAIN |
2 | 0.0000153138 | SHUTTLEWORTH EQUATION//MENDELEEV//LIPPMANN EQUATION |
3 | 0.0000111715 | STRIP BENDING TEST//MEMS PROD//HIGH CYCLE FATIGUE TEST |
4 | 0.0000107678 | SCANDIUM FILM//TI THIN FILM//TI THIN FILMS |
5 | 0.0000095706 | TITANIUM NITRIDE//ZIRCONIUM NITRIDE//ZIRCONIUM OXYNITRIDE |
6 | 0.0000094926 | TUNGSTEN NITRIDE//WNX//GRP MAT ENGN SUPERFICIES |
7 | 0.0000090565 | STAINLESS STEEL FILMS//SCI TECH ROUEN//UFR PHYS MAT CONDENSEE MAT |
8 | 0.0000087640 | END HALL ION GUN//MWIR REGION//LENS ENGN DEV |
9 | 0.0000081414 | AL PT//AMORPHOUS AL2PT//SELF ORGANISED STRUCTURE FORMATION |
10 | 0.0000080044 | GIANT MAGNETOSTRICTION//MAGNETOSTRICTIVE THIN FILM//SAMARIUM IRON |