Class information for:
Level 1: POWER LAW PROCESS//RELIABILITY GROWTH//STAT RELIABIL

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
18339 492 17.6 31%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
549 13894 IEEE TRANSACTIONS ON RELIABILITY//RELIABILITY ENGINEERING & SYSTEM SAFETY//MICROELECTRONICS AND RELIABILITY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 POWER LAW PROCESS Author keyword 27 55% 7% 34
2 RELIABILITY GROWTH Author keyword 13 24% 10% 47
3 STAT RELIABIL Address 9 67% 2% 8
4 REPAIRABLE EQUIPMENT Author keyword 6 100% 1% 4
5 DISCRETE RELIABILITY GROWTH MODEL Author keyword 4 75% 1% 3
6 REPAIRABLE SYSTEMS Author keyword 4 17% 4% 20
7 NON HOMOGENEOUS POISSON PROCESS Author keyword 2 12% 4% 18
8 BINOMIAL SYSTEM Author keyword 2 67% 0% 2
9 CONFORMABILITY ANALYSIS Author keyword 2 67% 0% 2
10 LAPLACE TEST Author keyword 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 POWER LAW PROCESS 27 55% 7% 34 Search POWER+LAW+PROCESS Search POWER+LAW+PROCESS
2 RELIABILITY GROWTH 13 24% 10% 47 Search RELIABILITY+GROWTH Search RELIABILITY+GROWTH
3 REPAIRABLE EQUIPMENT 6 100% 1% 4 Search REPAIRABLE+EQUIPMENT Search REPAIRABLE+EQUIPMENT
4 DISCRETE RELIABILITY GROWTH MODEL 4 75% 1% 3 Search DISCRETE+RELIABILITY+GROWTH+MODEL Search DISCRETE+RELIABILITY+GROWTH+MODEL
5 REPAIRABLE SYSTEMS 4 17% 4% 20 Search REPAIRABLE+SYSTEMS Search REPAIRABLE+SYSTEMS
6 NON HOMOGENEOUS POISSON PROCESS 2 12% 4% 18 Search NON+HOMOGENEOUS+POISSON+PROCESS Search NON+HOMOGENEOUS+POISSON+PROCESS
7 BINOMIAL SYSTEM 2 67% 0% 2 Search BINOMIAL+SYSTEM Search BINOMIAL+SYSTEM
8 CONFORMABILITY ANALYSIS 2 67% 0% 2 Search CONFORMABILITY+ANALYSIS Search CONFORMABILITY+ANALYSIS
9 LAPLACE TEST 2 67% 0% 2 Search LAPLACE+TEST Search LAPLACE+TEST
10 ONE SHOT SYSTEMS 2 67% 0% 2 Search ONE+SHOT+SYSTEMS Search ONE+SHOT+SYSTEMS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 WEIBULL PROCESS 46 82% 5% 27
2 POWER LAW PROCESS 28 64% 5% 27
3 M M 1 QUEUES 7 67% 1% 6
4 REPAIRABLE SYSTEMS 6 21% 5% 27
5 JAJARM BAUXITE MINE 4 75% 1% 3
6 CUMULATIVE INTENSITY FUNCTION 4 44% 1% 7
7 DUANE PLOT 3 100% 1% 3
8 REPAIRABLE EQUIPMENT 3 100% 1% 3
9 NONHOMOGENEOUS POISSON PROCESS 3 20% 2% 11
10 MINING EQUIPMENT 2 67% 0% 2

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MAINTENANCE MANAGEMENT INTERNATIONAL 1 12% 1% 7

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Reliability growth modeling for in-service electronic systems considering latent failure modes 2010 3 18 61%
A survey of discrete reliability-growth models 1996 25 25 44%
Expert elicitation for reliable system design 2006 13 100 13%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 STAT RELIABIL 9 67% 1.6% 8
2 INFORMAT IND SYST ENGN 2 50% 0.6% 3
3 COMP SCI IND SYST ENGN 2 23% 1.4% 7
4 SILICON NANOELECT HOLCOMBE 1 100% 0.4% 2
5 OPERAT MAINTENANCE 1 30% 0.6% 3
6 INFORMAT ENGN ELECT ENGN 1 22% 0.8% 4
7 ABT TECHN UMWELTSOZIOL 1 50% 0.2% 1
8 AUTOMAT CONTROL SYST ELECT DRIVE 1 50% 0.2% 1
9 HUNAN PROV MECH EQUIPMENT HLTH MAINTENANC 1 50% 0.2% 1
10 MIN SERV 1 50% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000169703 MINIMAL REPAIR//GEOMETRIC PROCESS//PREVENTIVE MAINTENANCE
2 0.0000135511 COMMERCIAL RELIABILITY PROGRAM//ELECTRONIC COMPONENT RELIABILITY//INTERNET CALIBRATION
3 0.0000129580 DOWNWARDS INFERENCE//FATAL SET//OVERLAPPING HIERARCHICAL DATA
4 0.0000125840 SOFTWARE RELIABILITY//IMPERFECT DEBUGGING//N VERSION PROGRAMMING
5 0.0000099251 BAYESIAN SEQUENTIAL TEST//INGENIOUS MICROMFG SYST GRP//PROJECTION PURSUIT TYPE STATISTIC
6 0.0000092277 RENEWAL FUNCTION//PARAMETRIC CONFIDENCE INTERVAL//SEQUENTIAL CONFIDENCE INTERVAL
7 0.0000076012 BUCKET WHEEL EXCAVATOR//SPECIAL FE//ANALYSIS AND MODELLING
8 0.0000067789 COMPOSITE HYPOTHESES TESTING//CRAMER MISES SMIRNOV TEST//CRAMER VON MISES SMIRNOV TEST
9 0.0000067081 LAMBDA TAU METHODOLOGY//STANDARDIZAT TRANSPORTAT PROD LOGIST//RISK PRIORITY NUMBER
10 0.0000065529 ELECTROMECHANICAL ACTUATOR EMA//COMPUTER AIDED MAINTAINABILITY PREDICTION//DIRECT DRIVE SERVOVALVE