Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18324 | 492 | 21.4 | 51% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2235 | 4296 | QUANTUM WELL STATES//IMAGE POTENTIAL STATES//MAT FIS SAILA |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SECONDARY ELECTRON EMISSION SPECTRA | Author keyword | 6 | 100% | 1% | 4 |
2 | AA GALKIN DONETSK PHYS TECHNOL | Address | 5 | 34% | 3% | 13 |
3 | CONJUGATED ORGANIC MOLECULES | Author keyword | 3 | 50% | 1% | 5 |
4 | TARGET CURRENT SPECTRA | Author keyword | 3 | 100% | 1% | 3 |
5 | INELASTIC ELECTRON ELECTRON SCATTERING | Author keyword | 2 | 50% | 1% | 3 |
6 | LOW ENERGY ELECTRON TRANSMISSION SPECTRA | Author keyword | 1 | 100% | 0% | 2 |
7 | NON EQUILIBRIUM ELECTRONS AND HOLES | Author keyword | 1 | 100% | 0% | 2 |
8 | SEMICONDUCTOR ORGANIC SEMICONDUCTOR INTERFACES | Author keyword | 1 | 100% | 0% | 2 |
9 | VERY LOW ENERGY ELECTRON DIFFRACTION | Author keyword | 1 | 100% | 0% | 2 |
10 | VLEED | Author keyword | 1 | 50% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TOTAL CURRENT SPECTROSCOPY | 44 | 100% | 3% | 16 |
2 | VLEED | 38 | 86% | 4% | 19 |
3 | TARGET CURRENT SPECTROSCOPY | 26 | 61% | 5% | 27 |
4 | EXCITED STATE BANDS | 12 | 75% | 2% | 9 |
5 | CU PHTHALOCYANINE FILMS | 12 | 86% | 1% | 6 |
6 | TARGET CURRENT | 12 | 86% | 1% | 6 |
7 | VACUUM LEVEL | 9 | 55% | 2% | 12 |
8 | CORBATHIENE | 8 | 100% | 1% | 5 |
9 | THIN POLYTHIOPHENE | 6 | 100% | 1% | 4 |
10 | ENERGY ELECTRON REFLECTION | 3 | 57% | 1% | 4 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
LEED FINE-STRUCTURE - ORIGINS AND APPLICATIONS | 1988 | 65 | 40 | 68% |
Intensity-voltage low-energy electron microscopy for functional materials characterization | 2014 | 5 | 118 | 21% |
Very low-energy electron diffraction as a method of band structure investigations: Applications in photoelectron spectroscopy | 2000 | 3 | 33 | 55% |
BAND-STRUCTURE EFFECTS IN VERYLEED | 1995 | 11 | 54 | 52% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AA GALKIN DONETSK PHYS TECHNOL | 5 | 34% | 2.6% | 13 |
2 | GRP PHYS ETATS CONDENSEE | 1 | 50% | 0.2% | 1 |
3 | UMR 6137 ST JEROME | 1 | 50% | 0.2% | 1 |
4 | CISMI | 1 | 11% | 1.2% | 6 |
5 | AA GALKIN DONETSK PHYS ENGN | 1 | 14% | 0.8% | 4 |
6 | FOK PHYS | 0 | 15% | 0.6% | 3 |
7 | HRICHTUNG EXPT PHYS | 0 | 15% | 0.6% | 3 |
8 | GRP PHYS ETATS CONDENSES | 0 | 12% | 0.6% | 3 |
9 | GRP PHYS ETATS CONDENSES SCI LUMINY | 0 | 100% | 0.2% | 1 |
10 | HIGH PERFORMANCE COMPUTAT DATA BASES | 0 | 100% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000171555 | IMAGE POTENTIAL STATES//SHOCKLEY SURFACE STATE//UMR 8625 |
2 | 0.0000113317 | SPIN SEM//SP SEM//SPIN POLARIZED HE 4 IONS |
3 | 0.0000096416 | MULTIDISCIPLINARY PROGRAM MAT SCI ENGN//NITROGEN ATOM//GINT |
4 | 0.0000073910 | PHOTOFIELD EMISSION//ELECTRON PLASMON INTERACTION//PHOTOFIELD EMISSION CURRENT |
5 | 0.0000070406 | PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY//PHOTOELECTRON DIFFRACTION |
6 | 0.0000069072 | PTCDA//SEXIPHENYL//HEXAPHENYL |
7 | 0.0000066329 | PHYS QUANTUM CHEM//LEHRSTUHL FESTKORPERPHYS//THEORY OF SCATTERING |
8 | 0.0000061786 | ACOUSTIC SURFACE PLASMON//SURFACE PLASMON DISPERSION//SURFACE PLASMON LIFETIME |
9 | 0.0000059328 | SOLID SUR ES ANAL GRP//SNPC//FEPC |
10 | 0.0000058758 | EELFS//TUNGSTEN 100 SURFACE//ATOMIC PAIR CORRELATION FUNCTION |