Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18137 | 502 | 17.7 | 64% |
Classes in level above (level 2) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | METAL INSULATOR METAL MIM CAPACITOR | Author keyword | 40 | 70% | 7% | 33 |
2 | VOLTAGE COEFFICIENT OF CAPACITANCE VCC | Author keyword | 35 | 89% | 3% | 16 |
3 | METAL INSULATOR METAL MIM | Author keyword | 29 | 59% | 6% | 32 |
4 | TEMPERATURE COEFFICIENT OF CAPACITANCE TCC | Author keyword | 19 | 80% | 2% | 12 |
5 | CAPACITANCE DENSITY | Author keyword | 11 | 67% | 2% | 10 |
6 | VOLTAGE COEFFICIENT OF CAPACITANCE | Author keyword | 9 | 83% | 1% | 5 |
7 | METAL INSULATOR METAL MIM CAPACITORS | Author keyword | 7 | 64% | 1% | 7 |
8 | VOLTAGE LINEARITY | Author keyword | 7 | 64% | 1% | 7 |
9 | TILAO | Author keyword | 6 | 80% | 1% | 4 |
10 | LSMCD | Author keyword | 5 | 54% | 1% | 7 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MIM CAPACITORS | 102 | 72% | 16% | 80 |
2 | INSULATOR METAL CAPACITORS | 48 | 72% | 8% | 38 |
3 | HFO2 DIELECTRICS | 43 | 79% | 5% | 27 |
4 | DENSITY MIM CAPACITORS | 27 | 92% | 2% | 11 |
5 | ALTIOX | 23 | 86% | 2% | 12 |
6 | HIGH TEMPERATURE LEAKAGE | 14 | 100% | 1% | 7 |
7 | FUNCTION NI ELECTRODE | 6 | 100% | 1% | 4 |
8 | MIM CAPACITOR | 3 | 57% | 1% | 4 |
9 | MIM CAPACITOR APPLICATIONS | 3 | 100% | 1% | 3 |
10 | RF MIM CAPACITORS | 3 | 100% | 1% | 3 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Lanthanum Gadolinium Oxide: A New Electronic Device Material for CMOS Logic and Memory Devices | 2014 | 3 | 32 | 34% |
Hepatocellular Carcinoma and Crohn's Disease: A Case Report and Review | 2009 | 2 | 21 | 24% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MIXED SIGNAL GRP | 2 | 67% | 0.4% | 2 |
2 | NEW MAT EVALUAT | 2 | 12% | 2.6% | 13 |
3 | FAB TEAM 3 | 1 | 100% | 0.4% | 2 |
4 | MICROELECT TECHNOL LTM | 1 | 30% | 0.6% | 3 |
5 | UPR3407 | 1 | 21% | 0.6% | 3 |
6 | CE SPECIALTY PROC DEV | 1 | 50% | 0.2% | 1 |
7 | CLUSTER EXCELLENCE MERGE | 1 | 50% | 0.2% | 1 |
8 | DAEDUG GU | 1 | 50% | 0.2% | 1 |
9 | DEVICE TECHNOL TEAM | 1 | 50% | 0.2% | 1 |
10 | INPGENSERG | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000138396 | TANTALUM OXIDE//TANTALUM PENTOXIDE//TA2O5 |
2 | 0.0000133849 | HFO2//HIGH K//METAL GATE |
3 | 0.0000082666 | CUBIC PYROCHLORE//DISPLACIVE DISORDER//PYROCHLORE |
4 | 0.0000069983 | RUO2//RUOD3//RU |
5 | 0.0000065251 | BISMUTH TELLURITE//BI2TEO5//BISMUTH TELLURITES |
6 | 0.0000063699 | BATI2O5//BA2TI9O20//BATI4O9 |
7 | 0.0000058631 | SPIRAL INDUCTOR//MASTERSLICE//INDUCTOR MODEL |
8 | 0.0000054083 | BST//BARIUM STRONTIUM TITANATE//TUNABILITY |
9 | 0.0000046802 | AS IMPURITY//CONDUCTING POLYMER BLENDS//GROUND WATER TREATMENT |
10 | 0.0000042106 | POLYOXIDE//INTERPOLY OXIDE//NONPLANAR POLYOXIDE |