Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 18051 | 506 | 20.7 | 54% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 3367 | 1217 | AC SURFACE PHOTOVOLTAGE//ELECTRON WORK FUNCTION//SUPERCONDUCTIVITY MECHANISM |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | AC SURFACE PHOTOVOLTAGE | Author keyword | 19 | 74% | 3% | 14 |
| 2 | SCANNING PHOTON MICROSCOPE | Author keyword | 6 | 58% | 1% | 7 |
| 3 | METAL AIR INSULATOR SEMICONDUCTOR | Author keyword | 4 | 75% | 1% | 3 |
| 4 | SURFACE PHOTOVOLTAGE | Author keyword | 3 | 11% | 6% | 30 |
| 5 | AC PHOTOVOLTAIC METHOD | Author keyword | 3 | 100% | 1% | 3 |
| 6 | RCA SOLUTION | Author keyword | 3 | 100% | 1% | 3 |
| 7 | VOLUME LIFETIME | Author keyword | 3 | 100% | 1% | 3 |
| 8 | OXIDE CHARGE | Author keyword | 3 | 22% | 3% | 13 |
| 9 | RCA RINSE | Author keyword | 3 | 50% | 1% | 4 |
| 10 | NONCONTACT C V | Author keyword | 3 | 60% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | AC SURFACE PHOTOVOLTAGE | 19 | 74% | 3% | 14 | Search AC+SURFACE+PHOTOVOLTAGE | Search AC+SURFACE+PHOTOVOLTAGE |
| 2 | SCANNING PHOTON MICROSCOPE | 6 | 58% | 1% | 7 | Search SCANNING+PHOTON+MICROSCOPE | Search SCANNING+PHOTON+MICROSCOPE |
| 3 | METAL AIR INSULATOR SEMICONDUCTOR | 4 | 75% | 1% | 3 | Search METAL+AIR+INSULATOR+SEMICONDUCTOR | Search METAL+AIR+INSULATOR+SEMICONDUCTOR |
| 4 | SURFACE PHOTOVOLTAGE | 3 | 11% | 6% | 30 | Search SURFACE+PHOTOVOLTAGE | Search SURFACE+PHOTOVOLTAGE |
| 5 | AC PHOTOVOLTAIC METHOD | 3 | 100% | 1% | 3 | Search AC+PHOTOVOLTAIC+METHOD | Search AC+PHOTOVOLTAIC+METHOD |
| 6 | RCA SOLUTION | 3 | 100% | 1% | 3 | Search RCA+SOLUTION | Search RCA+SOLUTION |
| 7 | VOLUME LIFETIME | 3 | 100% | 1% | 3 | Search VOLUME+LIFETIME | Search VOLUME+LIFETIME |
| 8 | OXIDE CHARGE | 3 | 22% | 3% | 13 | Search OXIDE+CHARGE | Search OXIDE+CHARGE |
| 9 | RCA RINSE | 3 | 50% | 1% | 4 | Search RCA+RINSE | Search RCA+RINSE |
| 10 | NONCONTACT C V | 3 | 60% | 1% | 3 | Search NONCONTACT+C+V | Search NONCONTACT+C+V |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | AC SURFACE PHOTOVOLTAGES | 13 | 71% | 2% | 10 |
| 2 | SCANNING PHOTON MICROSCOPE | 6 | 80% | 1% | 4 |
| 3 | CAPACITANCE VOLTAGE MEASUREMENT | 4 | 75% | 1% | 3 |
| 4 | STRONGLY INVERTED GE | 4 | 75% | 1% | 3 |
| 5 | SURFACE PHOTOVOLTAGE SPECTROSCOPY | 4 | 20% | 3% | 17 |
| 6 | AC SURFACE | 3 | 100% | 1% | 3 |
| 7 | INDUCED NEGATIVE CHARGE | 3 | 100% | 1% | 3 |
| 8 | SI MIS STRUCTURES | 3 | 100% | 1% | 3 |
| 9 | AC PHOTOVOLTAGES | 2 | 67% | 0% | 2 |
| 10 | P SI111 | 2 | 67% | 0% | 2 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Surface photovoltage phenomena: theory, experiment, and applications | 1999 | 841 | 437 | 28% |
| Surface voltage and surface photovoltage: history, theory and applications | 2001 | 108 | 24 | 50% |
| Some questions in fractal nanotechnology | 2008 | 0 | 14 | 14% |
| Molecular Photovoltaics in Nanoscale Dimension | 2011 | 6 | 100 | 4% |
| Study of the transport mechanism in molecular self-assembling devices | 2010 | 2 | 82 | 5% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | METASTABLE MAT MFG TECHNOL SCI | 1 | 100% | 0.4% | 2 |
| 2 | FUNDAMENTAL SCI MICRONANODEVICES S | 1 | 50% | 0.2% | 1 |
| 3 | SCI TECH MARSEILLE ST JEROME | 1 | 50% | 0.2% | 1 |
| 4 | STATE METASTABLE MAT MFG TECHNOL SCI | 1 | 50% | 0.2% | 1 |
| 5 | BIOMOL NANOTECHNOL CBN UNILE | 0 | 33% | 0.2% | 1 |
| 6 | STATE METASTABLE MAT MANU TURE TECHNOL | 0 | 33% | 0.2% | 1 |
| 7 | PROBIEN | 0 | 20% | 0.2% | 1 |
| 8 | UNITED INTELLIGENT MAT | 0 | 20% | 0.2% | 1 |
| 9 | LASER MAT DEV DEVICE | 0 | 17% | 0.2% | 1 |
| 10 | SEMICOND PHYS DEVICES | 0 | 14% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000159875 | EDUC SCANNING PROBE MICROSCOPY//LOBACHEVSKY PHYS TECH//PHOTOELECTRIC SPECTROSCOPY |
| 2 | 0.0000151688 | PORPHYRIN LIQUID CRYSTAL//LIQUID CRYSTAL PROPERTY//LIQUID CRYSTAL PROPERTIES |
| 3 | 0.0000126497 | ELECTRON WORK FUNCTION//AERONAUT TESTING EVALUAT//MAT SCI ENGN AERONAUT SCI |
| 4 | 0.0000094722 | GETTERING//GETTERING EFFICIENCY//SI AU |
| 5 | 0.0000090647 | IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE//P N JUNCTION LEAKAGE |
| 6 | 0.0000080027 | DIFFUSION TEMPERATURE//DEVICE FUNCT SECT//TWO DIMENSIONAL DEVICE SIMULATION |
| 7 | 0.0000072034 | PHOTOREFLECTANCE//FIELD INDUCED CHANGE IN THE PSEUDODIELECTRIC FUNCTION//PHOTOELLIPSOMETRY |
| 8 | 0.0000059381 | HYDROGEN TERMINATION//SHIZUOKA TORY//LAYER BY LAYER OXIDATION |
| 9 | 0.0000057471 | CLEANROOM//FAN FILTER UNIT//ORGANIC CONTAMINATION |
| 10 | 0.0000055764 | IEEE JOURNAL OF PHOTOVOLTAICS//SILICON SOLAR CELLS//PROGRESS IN PHOTOVOLTAICS |