Class information for:
Level 1: PROTON BEAM WRITING//ION BEAM PLICAT//PROBE FORMING SYSTEM

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
18001 509 16.9 68%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
2223 4329 PROTON BEAM WRITING//NUCLEAR MICROPROBE//ION BEAM PLICAT

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 PROTON BEAM WRITING Author keyword 112 75% 16% 82
2 ION BEAM PLICAT Address 40 38% 16% 82
3 PROBE FORMING SYSTEM Author keyword 29 88% 3% 14
4 PBW Author keyword 15 88% 1% 7
5 QUADRUPOLE LENS Author keyword 14 55% 3% 17
6 PROTON BEAM MICROMACHINING Author keyword 13 80% 2% 8
7 CIBA Address 13 36% 6% 29
8 PROTON BEAM WRITING PBW Author keyword 12 86% 1% 6
9 MEV ION BEAM LITHOGRAPHY Author keyword 9 67% 2% 8
10 LOUISIANA ACCELERATOR Address 7 50% 2% 10

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
LCSH search Wikipedia search
1 PROTON BEAM WRITING 112 75% 16% 82 Search PROTON+BEAM+WRITING Search PROTON+BEAM+WRITING
2 PROBE FORMING SYSTEM 29 88% 3% 14 Search PROBE+FORMING+SYSTEM Search PROBE+FORMING+SYSTEM
3 PBW 15 88% 1% 7 Search PBW Search PBW
4 QUADRUPOLE LENS 14 55% 3% 17 Search QUADRUPOLE+LENS Search QUADRUPOLE+LENS
5 PROTON BEAM MICROMACHINING 13 80% 2% 8 Search PROTON+BEAM+MICROMACHINING Search PROTON+BEAM+MICROMACHINING
6 PROTON BEAM WRITING PBW 12 86% 1% 6 Search PROTON+BEAM+WRITING+PBW Search PROTON+BEAM+WRITING+PBW
7 MEV ION BEAM LITHOGRAPHY 9 67% 2% 8 Search MEV+ION+BEAM+LITHOGRAPHY Search MEV+ION+BEAM+LITHOGRAPHY
8 NUCLEAR MICROSCOPE 6 58% 1% 7 Search NUCLEAR+MICROSCOPE Search NUCLEAR+MICROSCOPE
9 P BEAM WRITING 4 67% 1% 4 Search P+BEAM+WRITING Search P+BEAM+WRITING
10 PROTON BEAM LITHOGRAPHY 4 67% 1% 4 Search PROTON+BEAM+LITHOGRAPHY Search PROTON+BEAM+LITHOGRAPHY

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 PROXIMITY APERTURE LITHOGRAPHY 5 63% 1% 5
2 EPOXY RESIST 4 75% 1% 3
3 MAGNETIC QUADRUPOLE LENS 3 100% 1% 3
4 NUCLEAR MICROPROBE APPLICATIONS 3 100% 1% 3
5 CURVILINEAR SPACE TIME 3 60% 1% 3
6 ION MICROPROBE SYSTEM 2 67% 0% 2
7 FOTURAN 1 50% 0% 2
8 LIPSION 1 50% 0% 2
9 METALLIC STAMPS 1 100% 0% 2
10 MICROPROBE FOCUSING SYSTEM 1 100% 0% 2

Journals

Reviews



Title Publ. year Cit. Active references % act. ref.
to same field
Three-dimensional silicon micromachining 2012 5 48 44%
Application of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects 2012 9 156 24%
Microrobotics and MEMS-based fabrication techniques for scaffold-based tissue engineering 2005 42 45 16%
Chemical and topographical patterning of hydrogels for neural cell guidance in vitro 2013 3 98 4%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 ION BEAM PLICAT 40 38% 16% 82
2 CIBA 13 36% 5.7% 29
3 LOUISIANA ACCELERATOR 7 50% 2.0% 10
4 RCNM 6 80% 0.8% 4
5 TAKASAKI ADV RADIAT 3 14% 4.5% 23
6 NUCL MICROSCOPY 3 20% 2.6% 13
7 ION BEAM PLICAT CIBA 2 67% 0.4% 2
8 CAFI 1 50% 0.4% 2
9 GRP HEAVY ELEMENTS MICROBIOL 1 100% 0.4% 2
10 HAUTE ECOLE ARC INGN 1 33% 0.6% 3

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000227309 NUCLEAR MICROPROBE//PROTON MICROPROBE//SCANNING TRANSMISSION ION MICROSCOPY
2 0.0000168475 CURL FREE VECTOR POTENTIAL//MACRO SCALE QUANTUM EFFECTS//TRANSITION AMPLITUDE WAVE
3 0.0000166281 NANOSYST MFG//NANOELECT PROC IL//ION PROJECTION
4 0.0000138941 IONOLUMINESCENCE//ABSORBATES//LONOLUMINESCENCE
5 0.0000095844 HYDROGEN SILSESQUIOXANE//HSQ//HSQ RESIST
6 0.0000091274 BYSTANDER EFFECT//BYSTANDER EFFECTS//RADIATION INDUCED BYSTANDER EFFECT
7 0.0000085383 SU 8//ZNCL2 NACL KCL//DEVICE TECHNOL GRP
8 0.0000068957 PIXE//EXTERNAL BEAM//LANDIS
9 0.0000064719 PARTICLE PHYS PARTICLE IRRADIAT MOE//PARTICLE PHYS PARTICLE IRRADIAT//PARTICLE PARTICLE IRRADIAT MOE
10 0.0000055303 CHANNELED PARTICLE//NONEQUILIBRIUM STATISTICAL THERMODYNAMICS//QUASITEMPERATURE