Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
18001 | 509 | 16.9 | 68% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2223 | 4329 | PROTON BEAM WRITING//NUCLEAR MICROPROBE//ION BEAM PLICAT |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | PROTON BEAM WRITING | Author keyword | 112 | 75% | 16% | 82 |
2 | ION BEAM PLICAT | Address | 40 | 38% | 16% | 82 |
3 | PROBE FORMING SYSTEM | Author keyword | 29 | 88% | 3% | 14 |
4 | PBW | Author keyword | 15 | 88% | 1% | 7 |
5 | QUADRUPOLE LENS | Author keyword | 14 | 55% | 3% | 17 |
6 | PROTON BEAM MICROMACHINING | Author keyword | 13 | 80% | 2% | 8 |
7 | CIBA | Address | 13 | 36% | 6% | 29 |
8 | PROTON BEAM WRITING PBW | Author keyword | 12 | 86% | 1% | 6 |
9 | MEV ION BEAM LITHOGRAPHY | Author keyword | 9 | 67% | 2% | 8 |
10 | LOUISIANA ACCELERATOR | Address | 7 | 50% | 2% | 10 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PROTON BEAM WRITING | 112 | 75% | 16% | 82 | Search PROTON+BEAM+WRITING | Search PROTON+BEAM+WRITING |
2 | PROBE FORMING SYSTEM | 29 | 88% | 3% | 14 | Search PROBE+FORMING+SYSTEM | Search PROBE+FORMING+SYSTEM |
3 | PBW | 15 | 88% | 1% | 7 | Search PBW | Search PBW |
4 | QUADRUPOLE LENS | 14 | 55% | 3% | 17 | Search QUADRUPOLE+LENS | Search QUADRUPOLE+LENS |
5 | PROTON BEAM MICROMACHINING | 13 | 80% | 2% | 8 | Search PROTON+BEAM+MICROMACHINING | Search PROTON+BEAM+MICROMACHINING |
6 | PROTON BEAM WRITING PBW | 12 | 86% | 1% | 6 | Search PROTON+BEAM+WRITING+PBW | Search PROTON+BEAM+WRITING+PBW |
7 | MEV ION BEAM LITHOGRAPHY | 9 | 67% | 2% | 8 | Search MEV+ION+BEAM+LITHOGRAPHY | Search MEV+ION+BEAM+LITHOGRAPHY |
8 | NUCLEAR MICROSCOPE | 6 | 58% | 1% | 7 | Search NUCLEAR+MICROSCOPE | Search NUCLEAR+MICROSCOPE |
9 | P BEAM WRITING | 4 | 67% | 1% | 4 | Search P+BEAM+WRITING | Search P+BEAM+WRITING |
10 | PROTON BEAM LITHOGRAPHY | 4 | 67% | 1% | 4 | Search PROTON+BEAM+LITHOGRAPHY | Search PROTON+BEAM+LITHOGRAPHY |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PROXIMITY APERTURE LITHOGRAPHY | 5 | 63% | 1% | 5 |
2 | EPOXY RESIST | 4 | 75% | 1% | 3 |
3 | MAGNETIC QUADRUPOLE LENS | 3 | 100% | 1% | 3 |
4 | NUCLEAR MICROPROBE APPLICATIONS | 3 | 100% | 1% | 3 |
5 | CURVILINEAR SPACE TIME | 3 | 60% | 1% | 3 |
6 | ION MICROPROBE SYSTEM | 2 | 67% | 0% | 2 |
7 | FOTURAN | 1 | 50% | 0% | 2 |
8 | LIPSION | 1 | 50% | 0% | 2 |
9 | METALLIC STAMPS | 1 | 100% | 0% | 2 |
10 | MICROPROBE FOCUSING SYSTEM | 1 | 100% | 0% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Three-dimensional silicon micromachining | 2012 | 5 | 48 | 44% |
Application of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects | 2012 | 9 | 156 | 24% |
Microrobotics and MEMS-based fabrication techniques for scaffold-based tissue engineering | 2005 | 42 | 45 | 16% |
Chemical and topographical patterning of hydrogels for neural cell guidance in vitro | 2013 | 3 | 98 | 4% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ION BEAM PLICAT | 40 | 38% | 16% | 82 |
2 | CIBA | 13 | 36% | 5.7% | 29 |
3 | LOUISIANA ACCELERATOR | 7 | 50% | 2.0% | 10 |
4 | RCNM | 6 | 80% | 0.8% | 4 |
5 | TAKASAKI ADV RADIAT | 3 | 14% | 4.5% | 23 |
6 | NUCL MICROSCOPY | 3 | 20% | 2.6% | 13 |
7 | ION BEAM PLICAT CIBA | 2 | 67% | 0.4% | 2 |
8 | CAFI | 1 | 50% | 0.4% | 2 |
9 | GRP HEAVY ELEMENTS MICROBIOL | 1 | 100% | 0.4% | 2 |
10 | HAUTE ECOLE ARC INGN | 1 | 33% | 0.6% | 3 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000227309 | NUCLEAR MICROPROBE//PROTON MICROPROBE//SCANNING TRANSMISSION ION MICROSCOPY |
2 | 0.0000168475 | CURL FREE VECTOR POTENTIAL//MACRO SCALE QUANTUM EFFECTS//TRANSITION AMPLITUDE WAVE |
3 | 0.0000166281 | NANOSYST MFG//NANOELECT PROC IL//ION PROJECTION |
4 | 0.0000138941 | IONOLUMINESCENCE//ABSORBATES//LONOLUMINESCENCE |
5 | 0.0000095844 | HYDROGEN SILSESQUIOXANE//HSQ//HSQ RESIST |
6 | 0.0000091274 | BYSTANDER EFFECT//BYSTANDER EFFECTS//RADIATION INDUCED BYSTANDER EFFECT |
7 | 0.0000085383 | SU 8//ZNCL2 NACL KCL//DEVICE TECHNOL GRP |
8 | 0.0000068957 | PIXE//EXTERNAL BEAM//LANDIS |
9 | 0.0000064719 | PARTICLE PHYS PARTICLE IRRADIAT MOE//PARTICLE PHYS PARTICLE IRRADIAT//PARTICLE PARTICLE IRRADIAT MOE |
10 | 0.0000055303 | CHANNELED PARTICLE//NONEQUILIBRIUM STATISTICAL THERMODYNAMICS//QUASITEMPERATURE |