Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
17517 | 531 | 14.3 | 45% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1059 | 9522 | THERMAL LENS SPECTROMETRY//THERMAL DIFFUSIVITY//PHOTOTHERMAL OPTOELECT DIAGNOST S |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELECTRON ACOUSTIC MICROSCOPY | Author keyword | 23 | 100% | 2% | 10 |
2 | PA IMAGING | Author keyword | 12 | 75% | 2% | 9 |
3 | PHOTOACOUSTIC MICROSCOPE | Author keyword | 9 | 83% | 1% | 5 |
4 | NONDESTRUCTIVE OBSERVATION | Author keyword | 5 | 60% | 1% | 6 |
5 | SI TRANSISTOR | Author keyword | 4 | 75% | 1% | 3 |
6 | THERMAL WAVE MICROSCOPY | Author keyword | 4 | 75% | 1% | 3 |
7 | PHOTOACOUSTIC MICROSCOPY PAM | Author keyword | 4 | 56% | 1% | 5 |
8 | ION ACOUSTIC MICROSCOPY | Author keyword | 3 | 100% | 1% | 3 |
9 | SCANNING PHOTOACOUSTIC MICROSCOPE | Author keyword | 3 | 100% | 1% | 3 |
10 | NON CONTACT MEASURING METHOD | Author keyword | 2 | 67% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TR CHIP | 11 | 100% | 1% | 6 |
2 | TRANSISTOR CHIP | 8 | 100% | 1% | 5 |
3 | AL2O3 SIC TIC CERAMICS | 6 | 71% | 1% | 5 |
4 | BIAS APPLICATION | 6 | 100% | 1% | 4 |
5 | DRIVEN PULSE STAGES | 2 | 67% | 0% | 2 |
6 | SPECKLE CORRELATION INTERFEROMETRY | 2 | 50% | 1% | 3 |
7 | RADIAL CRACKS | 2 | 29% | 1% | 6 |
8 | PHOTOACOUSTIC MICROSCOPE | 1 | 100% | 0% | 2 |
9 | MECHANICAL VIBRATIONS | 1 | 15% | 1% | 7 |
10 | ELECTRON ACOUSTIC MICROSCOPY | 1 | 40% | 0% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
SCANNING ELECTRON ACOUSTIC MICROSCOPY | 1988 | 31 | 32 | 59% |
A REVIEW OF THE PROCESSES BY WHICH ULTRASOUND IS GENERATED THROUGH THE INTERACTION OF IONIZING-RADIATION AND IRRADIATED MATERIALS - SOME POSSIBLE APPLICATIONS | 1992 | 13 | 15 | 33% |
THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE | 1985 | 12 | 9 | 100% |
ELECTRON BEAM-ACOUSTIC IMAGING | 1988 | 4 | 15 | 67% |
IMAGING WITH OPTICALLY GENERATED THERMAL WAVES | 1988 | 9 | 52 | 38% |
IMAGE-CONTRAST PROCESSES IN THERMAL AND THERMOACOUSTIC IMAGING | 1986 | 26 | 47 | 26% |
PARALLEL ACOUSTIC INFRARED IMAGING OF SINGLE-CRYSTAL SURFACE AND SUBSURFACE STRUCTURE | 1987 | 1 | 7 | 71% |
THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE | 1986 | 0 | 9 | 100% |
SCANNING ELECTRON ACOUSTIC MICROSCOPY | 1983 | 5 | 11 | 82% |
SCANNING THERMOACOUSTIC ELECTRON-MICROSCOPE OF SOLID-STATE STRUCTURE (REVIEW) | 1987 | 0 | 11 | 73% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | LEHRSTUHL ELEKTRON | 1 | 33% | 0.6% | 3 |
2 | SEPI ESIME ZAC | 1 | 40% | 0.4% | 2 |
3 | HBEREICH ELE OTECH INFORMAT TECH | 1 | 50% | 0.2% | 1 |
4 | INORGAN MAT DEVICES | 1 | 50% | 0.2% | 1 |
5 | PL PHYS MEASUREMENT TECHNOL | 1 | 50% | 0.2% | 1 |
6 | LEHRSTUHL ELEKT | 1 | 13% | 0.8% | 4 |
7 | MAIN FIRE SERV | 0 | 33% | 0.2% | 1 |
8 | MED PHARMACEUT SCIKASUMI 123MINAMI KU | 0 | 33% | 0.2% | 1 |
9 | URA 304 | 0 | 33% | 0.2% | 1 |
10 | PL PHYS INFORMAT | 0 | 10% | 0.6% | 3 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000293145 | PHOTOCARRIER RADIOMETRY//CADIFT//PHOTOTHERMAL OPTOELECT DIAGNOST S |
2 | 0.0000244727 | PHOTOPYROELECTRIC TECHNIQUE//THERMAL EFFUSIVITY//PHOTOPYROELECTRIC CALORIMETRY |
3 | 0.0000120133 | AU NI50FE50//ECS ENGN//CIENCIAS FIS LCFIS |
4 | 0.0000104814 | INFRARED THERMOGRAPHY//PULSED THERMOGRAPHY//ITEF |
5 | 0.0000091047 | TUNNELING ACOUSTIC MICROSCOPY//SAW IMAGING//MICRODISPLACEMENT MEASUREMENT |
6 | 0.0000074700 | PHOTOACOUSTIC SPECTROSCOPY//PHOTOACOUSTIC PHASE//STEP SCAN FT IR |
7 | 0.0000061675 | LASER ULTRASONICS//PHASE VELOCITY SCANNING METHOD//LASER ULTRASOUND |
8 | 0.0000060731 | N CDS//ACOUSTIC DOMAIN//BRILLOUIN SCATTERING METHOD |
9 | 0.0000055720 | ACOUSTIC MICROSCOPY//LINE FOCUS BEAM ACOUSTIC MICROSCOPY//VZ CURVE |
10 | 0.0000038047 | SCANNING THERMAL MICROSCOPY//MICRO THERMAL ANALYSIS//SCANNING THERMAL MICROSCOPE |