Class information for:
Level 1: SINGLE ATOM TIP//SUR E MODIFICAT//SINGLE ATOM TIPS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
17430 536 24.0 61%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
751 11810 ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SINGLE ATOM TIP Author keyword 15 88% 1% 7
2 SUR E MODIFICAT Address 7 15% 8% 43
3 SINGLE ATOM TIPS Author keyword 6 80% 1% 4
4 FACETING Author keyword 6 14% 8% 42
5 EMISS ELECT Address 4 42% 1% 8
6 GAS FIELD ION SOURCE Author keyword 3 57% 1% 4
7 FIELD EMISSION SPECTROSCOPY Author keyword 3 43% 1% 6
8 FRESNEL PROJECTION MICROSCOPE Author keyword 3 100% 1% 3
9 ULTRASHARP FIELD EMITTERS Author keyword 3 100% 1% 3
10 POINT PROJECTION MICROSCOPY Author keyword 3 60% 1% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SINGLE ATOM TIP 15 88% 1% 7 Search SINGLE+ATOM+TIP Search SINGLE+ATOM+TIP
2 SINGLE ATOM TIPS 6 80% 1% 4 Search SINGLE+ATOM+TIPS Search SINGLE+ATOM+TIPS
3 FACETING 6 14% 8% 42 Search FACETING Search FACETING
4 GAS FIELD ION SOURCE 3 57% 1% 4 Search GAS+FIELD+ION+SOURCE Search GAS+FIELD+ION+SOURCE
5 FIELD EMISSION SPECTROSCOPY 3 43% 1% 6 Search FIELD+EMISSION+SPECTROSCOPY Search FIELD+EMISSION+SPECTROSCOPY
6 FRESNEL PROJECTION MICROSCOPE 3 100% 1% 3 Search FRESNEL+PROJECTION+MICROSCOPE Search FRESNEL+PROJECTION+MICROSCOPE
7 ULTRASHARP FIELD EMITTERS 3 100% 1% 3 Search ULTRASHARP+FIELD+EMITTERS Search ULTRASHARP+FIELD+EMITTERS
8 POINT PROJECTION MICROSCOPY 3 60% 1% 3 Search POINT+PROJECTION+MICROSCOPY Search POINT+PROJECTION+MICROSCOPY
9 FIELD ION MICROSCOPY 2 11% 4% 20 Search FIELD+ION+MICROSCOPY Search FIELD+ION+MICROSCOPY
10 FIELD ION MICROSCOPY FIM 2 44% 1% 4 Search FIELD+ION+MICROSCOPY+FIM Search FIELD+ION+MICROSCOPY+FIM

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ACTIVATED NITROGEN 42 94% 3% 15
2 W111 37 53% 9% 49
3 PROJECTION MICROSCOPY 29 77% 4% 20
4 FRESNEL PROJECTION MICROSCOPY 24 91% 2% 10
5 ULTRATHIN METAL FILMS 22 37% 9% 48
6 W111 SURFACES 20 100% 2% 9
7 IR SURFACES 15 67% 3% 14
8 MO111 15 82% 2% 9
9 SINGLE ATOM TIPS 15 77% 2% 10
10 AXIALLY SYMMETRICAL FORCES 12 63% 2% 12

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Progress in electron- and ion-interferometry 2010 34 155 34%
Low energy electron point source microscopy: beyond imaging 2010 12 57 70%
Point-projection electron imaging of tobacco mosaic virus at 40 eV electron energy 1999 23 9 67%
Nanoscale surface chemistry over faceted substrates: structure, reactivity and nanotemplates 2008 23 89 39%
Quest for high brightness, monochromatic noble gas ion sources 2005 52 68 25%
Optimization of the low energy electron point source microscope: imaging of macromolecules 2002 7 41 61%
Tomographic reconstruction of multiple in-line electron holograms of realistic objects 2005 2 28 75%
Improved low energy electron projection in-line holograms reconstruction: application to the holograms of a tungsten tip 2002 1 19 74%
Surface facetting induced by adsorbates 2003 82 69 6%
STEM and shadow-imaging of biomolecules at 6 eV beam energy 1997 13 32 31%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SUR E MODIFICAT 7 15% 8.0% 43
2 EMISS ELECT 4 42% 1.5% 8
3 ULTIMATE TECHNOL NANOELECT CUTE 1 100% 0.4% 2
4 ELEKTROCHEM 1 11% 1.7% 9
5 ELECT ENGN SEONGBUK KU 1 50% 0.2% 1
6 HELMHOLTZ ULM HIU ELE OCHEM ENERGY STORAGE 1 50% 0.2% 1
7 TONOMURA ELE ON WAVEFRONT PROJECT 1 50% 0.2% 1
8 DPM EMISS ELECT 0 33% 0.2% 1
9 ELECT NANOTECHNOL C TEURS 0 18% 0.4% 2
10 SHINUKU KU 0 25% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000270640 APEX RADIUS//GRP MAT NANOESTRUCT//TIP FABRICATION
2 0.0000183238 MICROCOLUMN//SCHOTTKY EMITTER//PROD DESIGN TECHNOL
3 0.0000148067 ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//TRIEBENBERG
4 0.0000123323 AUGER TRANSISTOR//SELF CONSISTENT QUANTUM WELLS//CE2CUGE6
5 0.0000088877 METAL METAL INTERFACES//BIMETALLIC SURFACES//SURFACE ALLOYS
6 0.0000070218 FIELD EMISSION//VACUUM MICROELECTRONICS//FIELD EMITTER ARRAY
7 0.0000069465 LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//I S CHARACTERISTICS
8 0.0000066632 LIQUID METAL ION SOURCE//LIQUID METAL ION SOURCES//ION BEAMS MAT
9 0.0000060702 TPR CO//ADSORPT CATALYSIS ENVIRONM PROTECT//MOLEC CHEM ENGN
10 0.0000057961 ELECTRON BEAM INDUCED DEPOSITION//FOCUSED ELECTRON BEAM INDUCED DEPOSITION//FOCUSED ION BEAM CHEMICAL VAPOR DEPOSITION FIB CVD