Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
17180 | 549 | 15.1 | 61% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
252 | 19240 | MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//PHOTOVOLTA THIN FILM ELECT |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | A SIH A SIGEH | Author keyword | 1 | 50% | 0% | 1 |
2 | AMORPHOUS SILICON BASED ALLOY | Author keyword | 1 | 50% | 0% | 1 |
3 | DIP SCI MAT TERRA | Address | 1 | 50% | 0% | 1 |
4 | GRENZFLACHEN VAKUUMPHYS | Address | 1 | 50% | 0% | 1 |
5 | MULTILAYER PERIODIC STRUCTURES | Author keyword | 1 | 50% | 0% | 1 |
6 | NIS INTERDIPARTIMENTAL EXCELLENCE | Address | 1 | 50% | 0% | 1 |
7 | PHYS DONGDAEMOON KU | Address | 1 | 50% | 0% | 1 |
8 | AMORPHOUS MULTILAYER | Author keyword | 0 | 33% | 0% | 1 |
9 | ELECT ENGN SAEKI KU | Address | 0 | 33% | 0% | 1 |
10 | IN SITU X RAY MONITORING | Author keyword | 0 | 33% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | GE SIOX SUPERLATTICES | 9 | 83% | 1% | 5 |
2 | INDUCED EXCESS CONDUCTIVITY | 4 | 75% | 1% | 3 |
3 | AMORPHOUS SEMICONDUCTOR SUPERLATTICES | 3 | 100% | 1% | 3 |
4 | H SUPERLATTICES | 2 | 50% | 1% | 3 |
5 | A SI H A SI3N4 H SUPERLATTICES | 1 | 100% | 0% | 2 |
6 | A SI1 XNX H FILMS | 1 | 100% | 0% | 2 |
7 | AMORPHOUS SE CDSE MULTILAYERS | 1 | 100% | 0% | 2 |
8 | SULFUR ALLOYS | 1 | 100% | 0% | 2 |
9 | SETE CDSE SUPERLATTICES | 1 | 40% | 0% | 2 |
10 | DOUBLE BARRIER STRUCTURES | 1 | 11% | 1% | 7 |
Journals |
Reviews |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | DIP SCI MAT TERRA | 1 | 50% | 0.2% | 1 |
2 | GRENZFLACHEN VAKUUMPHYS | 1 | 50% | 0.2% | 1 |
3 | NIS INTERDIPARTIMENTAL EXCELLENCE | 1 | 50% | 0.2% | 1 |
4 | PHYS DONGDAEMOON KU | 1 | 50% | 0.2% | 1 |
5 | ELECT ENGN SAEKI KU | 0 | 33% | 0.2% | 1 |
6 | DIP CHIM PLICATA SCI MAT | 0 | 25% | 0.2% | 1 |
7 | PHYSICOTECHN | 0 | 25% | 0.2% | 1 |
8 | SCI MECH PHYS | 0 | 25% | 0.2% | 1 |
9 | UDMURTIAN SCI | 0 | 25% | 0.2% | 1 |
10 | PVMD DIMES | 0 | 10% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000205823 | GERMANIUM CARBON//A SIGE//GE1 XCX |
2 | 0.0000153655 | JOINT HIGH TECHNOL//STEADY STATE PHOTOCARRIER GRATING//JOINT HIGHTECHNOL |
3 | 0.0000146410 | STAEBLER WRONSKI EFFECT//HYDROGENATED AMORPHOUS SILICON//SOLAR CELLS |
4 | 0.0000103183 | SIH2//SIH3//SILANE PLASMA |
5 | 0.0000084285 | AMORPHOUS SILICON CARBIDE//SILICON CARBON ALLOYS//A SIC H |
6 | 0.0000076639 | GAAS DOPING SUPERLATTICE//TECH PHYS 1//DISPLACEMENT DAMAGE DOSE PROFILE |
7 | 0.0000075909 | ELECT TELECOMMUN COMP//IMAGE ACQUISITION AND REPRESENTATION//MULTISPECTRAL STRUCTURES |
8 | 0.0000074763 | EXPANDED CORE FIBER//FINE WIRING//H2 REDUCTION |
9 | 0.0000063997 | SILICON OXYNITRIDE//SILICON NITRIDE FILMS//CONDUCTANCE TRANSIENTS |
10 | 0.0000061774 | FLUCTUATION ELECTRON MICROSCOPY//FLUCTUATION MICROSCOPY//REDUCED DENSITY FUNCTION |