Class information for:
Level 1: A SIH A SIGEH//AMORPHOUS SILICON BASED ALLOY//DIP SCI MAT TERRA

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
17180 549 15.1 61%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
252 19240 MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//PHOTOVOLTA THIN FILM ELECT

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 A SIH A SIGEH Author keyword 1 50% 0% 1
2 AMORPHOUS SILICON BASED ALLOY Author keyword 1 50% 0% 1
3 DIP SCI MAT TERRA Address 1 50% 0% 1
4 GRENZFLACHEN VAKUUMPHYS Address 1 50% 0% 1
5 MULTILAYER PERIODIC STRUCTURES Author keyword 1 50% 0% 1
6 NIS INTERDIPARTIMENTAL EXCELLENCE Address 1 50% 0% 1
7 PHYS DONGDAEMOON KU Address 1 50% 0% 1
8 AMORPHOUS MULTILAYER Author keyword 0 33% 0% 1
9 ELECT ENGN SAEKI KU Address 0 33% 0% 1
10 IN SITU X RAY MONITORING Author keyword 0 33% 0% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 A SIH A SIGEH 1 50% 0% 1 Search A+SIH+A+SIGEH Search A+SIH+A+SIGEH
2 AMORPHOUS SILICON BASED ALLOY 1 50% 0% 1 Search AMORPHOUS+SILICON+BASED+ALLOY Search AMORPHOUS+SILICON+BASED+ALLOY
3 MULTILAYER PERIODIC STRUCTURES 1 50% 0% 1 Search MULTILAYER+PERIODIC+STRUCTURES Search MULTILAYER+PERIODIC+STRUCTURES
4 AMORPHOUS MULTILAYER 0 33% 0% 1 Search AMORPHOUS+MULTILAYER Search AMORPHOUS+MULTILAYER
5 IN SITU X RAY MONITORING 0 33% 0% 1 Search IN+SITU+X+RAY+MONITORING Search IN+SITU+X+RAY+MONITORING
6 LIGHT INDUCED INSTABILITY 0 33% 0% 1 Search LIGHT+INDUCED+INSTABILITY Search LIGHT+INDUCED+INSTABILITY
7 PIN TYPE SOLAR CELL 0 33% 0% 1 Search PIN+TYPE+SOLAR+CELL Search PIN+TYPE+SOLAR+CELL
8 SEMICONDUCTOR NANOCRYSTALLITES 0 33% 0% 1 Search SEMICONDUCTOR+NANOCRYSTALLITES Search SEMICONDUCTOR+NANOCRYSTALLITES
9 AMORPHOUS SILICON ALLOY 0 25% 0% 1 Search AMORPHOUS+SILICON+ALLOY Search AMORPHOUS+SILICON+ALLOY
10 CHALCOGENICLES 0 25% 0% 1 Search CHALCOGENICLES Search CHALCOGENICLES

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 GE SIOX SUPERLATTICES 9 83% 1% 5
2 INDUCED EXCESS CONDUCTIVITY 4 75% 1% 3
3 AMORPHOUS SEMICONDUCTOR SUPERLATTICES 3 100% 1% 3
4 H SUPERLATTICES 2 50% 1% 3
5 A SI H A SI3N4 H SUPERLATTICES 1 100% 0% 2
6 A SI1 XNX H FILMS 1 100% 0% 2
7 AMORPHOUS SE CDSE MULTILAYERS 1 100% 0% 2
8 SULFUR ALLOYS 1 100% 0% 2
9 SETE CDSE SUPERLATTICES 1 40% 0% 2
10 DOUBLE BARRIER STRUCTURES 1 11% 1% 7

Journals

Reviews

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 DIP SCI MAT TERRA 1 50% 0.2% 1
2 GRENZFLACHEN VAKUUMPHYS 1 50% 0.2% 1
3 NIS INTERDIPARTIMENTAL EXCELLENCE 1 50% 0.2% 1
4 PHYS DONGDAEMOON KU 1 50% 0.2% 1
5 ELECT ENGN SAEKI KU 0 33% 0.2% 1
6 DIP CHIM PLICATA SCI MAT 0 25% 0.2% 1
7 PHYSICOTECHN 0 25% 0.2% 1
8 SCI MECH PHYS 0 25% 0.2% 1
9 UDMURTIAN SCI 0 25% 0.2% 1
10 PVMD DIMES 0 10% 0.2% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000205823 GERMANIUM CARBON//A SIGE//GE1 XCX
2 0.0000153655 JOINT HIGH TECHNOL//STEADY STATE PHOTOCARRIER GRATING//JOINT HIGHTECHNOL
3 0.0000146410 STAEBLER WRONSKI EFFECT//HYDROGENATED AMORPHOUS SILICON//SOLAR CELLS
4 0.0000103183 SIH2//SIH3//SILANE PLASMA
5 0.0000084285 AMORPHOUS SILICON CARBIDE//SILICON CARBON ALLOYS//A SIC H
6 0.0000076639 GAAS DOPING SUPERLATTICE//TECH PHYS 1//DISPLACEMENT DAMAGE DOSE PROFILE
7 0.0000075909 ELECT TELECOMMUN COMP//IMAGE ACQUISITION AND REPRESENTATION//MULTISPECTRAL STRUCTURES
8 0.0000074763 EXPANDED CORE FIBER//FINE WIRING//H2 REDUCTION
9 0.0000063997 SILICON OXYNITRIDE//SILICON NITRIDE FILMS//CONDUCTANCE TRANSIENTS
10 0.0000061774 FLUCTUATION ELECTRON MICROSCOPY//FLUCTUATION MICROSCOPY//REDUCED DENSITY FUNCTION