Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 17054 | 556 | 23.9 | 46% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1856 | 5547 | JOURNAL OF SYNCHROTRON RADIATION//CONVERSION ELECTRON YIELD//ELNES |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | EELFS | Author keyword | 5 | 47% | 1% | 8 |
| 2 | TUNGSTEN 100 SURFACE | Author keyword | 3 | 100% | 1% | 3 |
| 3 | ATOMIC PAIR CORRELATION FUNCTION | Author keyword | 2 | 67% | 0% | 2 |
| 4 | MARPE | Author keyword | 2 | 67% | 0% | 2 |
| 5 | INTRINSIC AND EXTRINSIC LOSSES | Author keyword | 1 | 100% | 0% | 2 |
| 6 | LOCAL SURFACE STRUCTURE | Author keyword | 1 | 100% | 0% | 2 |
| 7 | O NI100 | Author keyword | 1 | 100% | 0% | 2 |
| 8 | APPEARANCE POTENTIAL SPECTROSCOPY | Author keyword | 1 | 33% | 1% | 3 |
| 9 | EXFAS | Author keyword | 1 | 33% | 0% | 2 |
| 10 | 2P THRESHOLD | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | EELFS | 5 | 47% | 1% | 8 | Search EELFS | Search EELFS |
| 2 | TUNGSTEN 100 SURFACE | 3 | 100% | 1% | 3 | Search TUNGSTEN+100+SURFACE | Search TUNGSTEN+100+SURFACE |
| 3 | ATOMIC PAIR CORRELATION FUNCTION | 2 | 67% | 0% | 2 | Search ATOMIC+PAIR+CORRELATION+FUNCTION | Search ATOMIC+PAIR+CORRELATION+FUNCTION |
| 4 | MARPE | 2 | 67% | 0% | 2 | Search MARPE | Search MARPE |
| 5 | INTRINSIC AND EXTRINSIC LOSSES | 1 | 100% | 0% | 2 | Search INTRINSIC+AND+EXTRINSIC+LOSSES | Search INTRINSIC+AND+EXTRINSIC+LOSSES |
| 6 | LOCAL SURFACE STRUCTURE | 1 | 100% | 0% | 2 | Search LOCAL+SURFACE+STRUCTURE | Search LOCAL+SURFACE+STRUCTURE |
| 7 | O NI100 | 1 | 100% | 0% | 2 | Search O+NI100 | Search O+NI100 |
| 8 | APPEARANCE POTENTIAL SPECTROSCOPY | 1 | 33% | 1% | 3 | Search APPEARANCE+POTENTIAL+SPECTROSCOPY | Search APPEARANCE+POTENTIAL+SPECTROSCOPY |
| 9 | EXFAS | 1 | 33% | 0% | 2 | Search EXFAS | Search EXFAS |
| 10 | 2P THRESHOLD | 1 | 50% | 0% | 1 | Search 2P+THRESHOLD | Search 2P+THRESHOLD |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | EELFS | 18 | 89% | 1% | 8 |
| 2 | LOSS FINE STRUCTURE | 18 | 55% | 4% | 22 |
| 3 | SHELL EXCITATIONS | 7 | 64% | 1% | 7 |
| 4 | SCATTERING CLUSTER METHOD | 7 | 67% | 1% | 6 |
| 5 | XAFS SPECTRA | 6 | 100% | 1% | 4 |
| 6 | DEBYE WALLER | 3 | 100% | 1% | 3 |
| 7 | EELFS METHOD | 3 | 100% | 1% | 3 |
| 8 | M2 3 EDGES | 3 | 100% | 1% | 3 |
| 9 | NEIGHBOR ATOMIC IDENTITIES | 3 | 100% | 1% | 3 |
| 10 | AUTOIONIZATION EMISSION | 3 | 38% | 1% | 6 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| STRUCTURAL SURFACE INVESTIGATIONS WITH LOW-ENERGY BACKSCATTERED ELECTRONS | 1995 | 34 | 182 | 47% |
| Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures | 2010 | 2 | 88 | 39% |
| EXTENDED ENERGY-LOSS FINE-STRUCTURE ANALYSIS | 1989 | 28 | 52 | 75% |
| New Developments in Theory of X-ray Photoemission from Solids | 2009 | 6 | 79 | 39% |
| Introductory Photoemission Theory | 2010 | 0 | 10 | 90% |
| APPEARANCE POTENTIAL SPECTROSCOPY OF SOLID-SURFACES | 1988 | 2 | 40 | 40% |
| AN OVERVIEW OF SEXAFS DURING THE PAST DECADE | 1986 | 60 | 55 | 13% |
| FINE-STRUCTURE IN IONIZATION CROSS-SECTIONS AND APPLICATIONS TO SURFACE SCIENCE | 1986 | 16 | 28 | 25% |
| THEORETICAL CONSIDERATIONS ON SURFACE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) | 1985 | 0 | 27 | 56% |
| EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL | 1981 | 1581 | 18 | 11% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ANGEVANDTE PHYS | 1 | 50% | 0.2% | 1 |
| 2 | SCI INAGE KU | 1 | 50% | 0.2% | 1 |
| 3 | UNITA INFM MODENA | 1 | 50% | 0.2% | 1 |
| 4 | SCI MAT CONDENSEE | 0 | 17% | 0.2% | 1 |
| 5 | SPAS | 0 | 17% | 0.2% | 1 |
| 6 | FAK PHYS GEOWISS | 0 | 11% | 0.2% | 1 |
| 7 | BASIC PROC TECHNOL ASAHI KU | 0 | 100% | 0.2% | 1 |
| 8 | DPHG | 0 | 100% | 0.2% | 1 |
| 9 | LA002 | 0 | 100% | 0.2% | 1 |
| 10 | LOCAL ATOM STRUCT | 0 | 100% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000243399 | MEAN SQUARE RELATIVE DISPLACEMENT//BIOL PHYS CHEM SCI//SPHERICAL WAVE EFFECTS |
| 2 | 0.0000169900 | ELNES//CORE HOLE EFFECTS//ENERGY LOSS NEAR EDGE STRUCTURES |
| 3 | 0.0000130617 | AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY |
| 4 | 0.0000128679 | PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY//PHOTOELECTRON DIFFRACTION |
| 5 | 0.0000106891 | CONVERSION ELECTRON YIELD//SIK EDGE XANES//CRYSTAL TECHNOL DEV |
| 6 | 0.0000094192 | GRP STRUCT ELECT MILIEUX DENSES//MN VALENCE STATE//X RAY PHOTOEMISSION SPECTRA |
| 7 | 0.0000090647 | DEBYE SUR E SCI//VANTHOFF//ACOUSTO OPTIC CRYSTAL |
| 8 | 0.0000082074 | SUBSURFACE SPECIES//POLYCRYSTALLINE ZIRCONIUM//TIME OF FLIGHT ELECTRON STIMULATED DESORPTION TOF ESD |
| 9 | 0.0000077273 | IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION |
| 10 | 0.0000066498 | RESONANT INVERSE PHOTOEMISSION//OBERFLACHENPHYS MIKROSTRUKTURPHYS//CEPD3 |