Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 16949 | 561 | 14.9 | 44% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 1597 | 6577 | ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | ALUMINUM DOPED ZINC OXIDE ZNOAL | Author keyword | 4 | 67% | 1% | 4 |
| 2 | ABELES EQUATIONS | Author keyword | 3 | 100% | 1% | 3 |
| 3 | OPTICAL CONDUCTIVITY MEASUREMENT | Author keyword | 2 | 67% | 0% | 2 |
| 4 | ABSORBING FILMS | Author keyword | 1 | 50% | 0% | 2 |
| 5 | ERROR PARALLELEPIPEDS | Author keyword | 1 | 100% | 0% | 2 |
| 6 | INTERFERENTIAL FILMS | Author keyword | 1 | 100% | 0% | 2 |
| 7 | REFLECTION SPECTRA ENVELOPES | Author keyword | 1 | 100% | 0% | 2 |
| 8 | ULTRAVIOLET VISIBLE NEAR INFRARED UV VIS NIR | Author keyword | 1 | 100% | 0% | 2 |
| 9 | TIANJIN OPT THIN FILM | Address | 1 | 29% | 1% | 4 |
| 10 | VERY THIN FILMS | Author keyword | 1 | 30% | 1% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MULTIPLE INCIDENCE ANGLES | 6 | 100% | 1% | 4 |
| 2 | ABSORBING FILMS | 5 | 55% | 1% | 6 |
| 3 | TRANSPARENT SUBSTRATE | 4 | 36% | 2% | 9 |
| 4 | NUMERICAL ELLIPSOMETRY | 2 | 67% | 0% | 2 |
| 5 | PHOTOMETRIC METHODS | 2 | 67% | 0% | 2 |
| 6 | ABSORBING THIN FILMS | 1 | 100% | 0% | 2 |
| 7 | ANGLE ELLIPSOMETRY | 1 | 50% | 0% | 2 |
| 8 | ANGLE SCANNING REFLECTOMETRY | 1 | 100% | 0% | 2 |
| 9 | EFFICIENT PARAMETER EXTRACTION | 1 | 100% | 0% | 2 |
| 10 | EMBEDDED THIN FILMS | 1 | 100% | 0% | 2 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| CHARACTERIZATION OF MATERIALS, THIN-FILMS, AND INTERFACES BY OPTICAL REFLECTANCE AND ELLIPSOMETRIC TECHNIQUES | 1986 | 2 | 12 | 8% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | TIANJIN OPT THIN FILM | 1 | 29% | 0.7% | 4 |
| 2 | DIOM EA 3523 | 1 | 33% | 0.4% | 2 |
| 3 | COMP SCI IME | 1 | 50% | 0.2% | 1 |
| 4 | DYNAM MICROSYST | 1 | 50% | 0.2% | 1 |
| 5 | EA 3526 | 1 | 50% | 0.2% | 1 |
| 6 | ELLIPSOMETRY PLICAT | 1 | 50% | 0.2% | 1 |
| 7 | HEILONGJIANG DISASTER PREVENT MITIGAT | 1 | 50% | 0.2% | 1 |
| 8 | LPACM | 1 | 50% | 0.2% | 1 |
| 9 | PHOTOGRAMMETRY CARTOGR HY | 1 | 50% | 0.2% | 1 |
| 10 | UM12958 | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000191452 | NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS |
| 2 | 0.0000151128 | VISIBLE SPECTRAL REGION//INFRARED MULTILAYER//MECHATRON DEVICES 1 |
| 3 | 0.0000129386 | ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S |
| 4 | 0.0000119942 | CEAG//SUR E TREATMENT OPT MAT//VIBRATION STATES |
| 5 | 0.0000115246 | IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER |
| 6 | 0.0000096989 | LASER DYE SOLVENTS//SUB WAVELENGTH DIFFRACTION GRATING//DISPERSION FORMULAS |
| 7 | 0.0000084156 | PHOTOELECTROMAGNETIC EFFECT//CAPACITIVE CONTACT//LIGHT INDUCED GRATING |
| 8 | 0.0000072134 | END HALL ION GUN//MWIR REGION//LENS ENGN DEV |
| 9 | 0.0000067435 | SURFACE PHOTOABSORPTION//REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY |
| 10 | 0.0000066085 | WHITE LIGHT INTERFEROMETRY//COMMUNITY TABUK//PRECIS MECH CONTROL |