Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
16879 | 566 | 27.0 | 48% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
886 | 10744 | SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | AUGER PARAMETER | Author keyword | 13 | 37% | 5% | 28 |
2 | DIFFERENTIAL CHARGING | Author keyword | 8 | 50% | 2% | 11 |
3 | CHARGE REFERENCING | Author keyword | 6 | 100% | 1% | 4 |
4 | HIGH ENERGY XPS | Author keyword | 5 | 54% | 1% | 7 |
5 | AUGER PARAMETER SHIFT | Author keyword | 2 | 67% | 0% | 2 |
6 | SILICON DIOXIDE LAYERS | Author keyword | 2 | 67% | 0% | 2 |
7 | WAGNER PLOT | Author keyword | 2 | 50% | 1% | 3 |
8 | ALLOYING BEHAVIOUR | Author keyword | 1 | 100% | 0% | 2 |
9 | AUGER PARAMETERS | Author keyword | 1 | 50% | 0% | 2 |
10 | CHARGE TRANSFER REDISTRIBUTION | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | AUGER PARAMETER | 13 | 37% | 5% | 28 | Search AUGER+PARAMETER | Search AUGER+PARAMETER |
2 | DIFFERENTIAL CHARGING | 8 | 50% | 2% | 11 | Search DIFFERENTIAL+CHARGING | Search DIFFERENTIAL+CHARGING |
3 | CHARGE REFERENCING | 6 | 100% | 1% | 4 | Search CHARGE+REFERENCING | Search CHARGE+REFERENCING |
4 | HIGH ENERGY XPS | 5 | 54% | 1% | 7 | Search HIGH+ENERGY+XPS | Search HIGH+ENERGY+XPS |
5 | AUGER PARAMETER SHIFT | 2 | 67% | 0% | 2 | Search AUGER+PARAMETER+SHIFT | Search AUGER+PARAMETER+SHIFT |
6 | SILICON DIOXIDE LAYERS | 2 | 67% | 0% | 2 | Search SILICON+DIOXIDE+LAYERS | Search SILICON+DIOXIDE+LAYERS |
7 | WAGNER PLOT | 2 | 50% | 1% | 3 | Search WAGNER+PLOT | Search WAGNER+PLOT |
8 | ALLOYING BEHAVIOUR | 1 | 100% | 0% | 2 | Search ALLOYING+BEHAVIOUR | Search ALLOYING+BEHAVIOUR |
9 | AUGER PARAMETERS | 1 | 50% | 0% | 2 | Search AUGER+PARAMETERS | Search AUGER+PARAMETERS |
10 | CHARGE TRANSFER REDISTRIBUTION | 1 | 100% | 0% | 2 | Search CHARGE+TRANSFER+REDISTRIBUTION | Search CHARGE+TRANSFER+REDISTRIBUTION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AUGER PARAMETER | 17 | 28% | 9% | 53 |
2 | SIO2 SI SYSTEM | 16 | 58% | 3% | 19 |
3 | CDSE NANOPARTICLE FILMS | 14 | 100% | 1% | 7 |
4 | EXTRA ATOMIC RELAXATION | 7 | 33% | 3% | 18 |
5 | STATIC RELAXATION | 6 | 100% | 1% | 4 |
6 | AUGER PARAMETER SHIFTS | 5 | 63% | 1% | 5 |
7 | INSULATING SAMPLES | 4 | 47% | 1% | 7 |
8 | PARAMETER SHIFTS | 4 | 75% | 1% | 3 |
9 | 2P PHOTOELECTRON SHIFTS | 3 | 57% | 1% | 4 |
10 | KLL AUGER | 3 | 43% | 1% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Auger parameter and Wagner plot in the characterization of chemical states by X-ray photoelectron spectroscopy: a review | 1998 | 164 | 174 | 49% |
XPS for chemical- and charge-sensitive analyses | 2013 | 8 | 48 | 29% |
THE AUGER PARAMETER, ITS UTILITY AND ADVANTAGES - A REVIEW | 1988 | 253 | 41 | 37% |
X-ray photoelectron spectroscopy on zeolites and related materials | 1996 | 45 | 78 | 33% |
NMR and ESCA chemical shifts in aluminosilicates: A critical discussion | 1999 | 8 | 28 | 36% |
Charge transfer in Al-Ni alloys: a spin selective study | 1997 | 0 | 6 | 67% |
X-ray photoelectron spectroscopic characterization of zeolites | 1995 | 2 | 68 | 29% |
THE ELECTRONIC-STRUCTURE OF THE ELEMENTS FROM GAS-PHASE X-RAY PHOTOELECTRON-SPECTROSCOPY | 1984 | 0 | 21 | 43% |
ADVANCES IN THE APPLICATION OF X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA) .2. NEW METHODS | 1991 | 24 | 150 | 5% |
CHARACTERIZATION OF CATALYSTS BY ANALYTICAL ELECTRON-MICROSCOPY | 1985 | 1 | 18 | 17% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | IND COATINGS DEV | 1 | 100% | 0.4% | 2 |
2 | MAT SUR E STUDIES | 1 | 100% | 0.4% | 2 |
3 | GR S | 1 | 50% | 0.2% | 1 |
4 | PHARMA OR | 1 | 50% | 0.2% | 1 |
5 | SACSO | 0 | 15% | 0.5% | 3 |
6 | 8 23 | 0 | 25% | 0.2% | 1 |
7 | ANALYT INTER IAL CHEM | 0 | 25% | 0.2% | 1 |
8 | NCESS | 0 | 25% | 0.2% | 1 |
9 | RUSTI | 0 | 20% | 0.2% | 1 |
10 | BUNDESANSTALT MATERIALFOR PRUFUNG | 0 | 17% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000259008 | POSIDONIUS//PLINY THE ELDER//AU PT BIMETALLIC NANOCLUSTERS |
2 | 0.0000196085 | AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY |
3 | 0.0000143899 | MAT OPTOELECT PHYS SCI//QUANTUM ENGN MICRONANO ENERGY//DOW CYCLOTENE |
4 | 0.0000110322 | IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION |
5 | 0.0000107258 | D CAMPHOR BETA SULFONIC ACID//P NITROPHENYLHYDRAZINE//HYDROGEN STORAGE INTERMETALLICS |
6 | 0.0000103499 | ATOM CHARGES//BUILDING BLOCK MODEL//EICVOM |
7 | 0.0000102371 | MET MIN GEOL ENGN//TI MG ALLOY//TI MG SI |
8 | 0.0000090560 | HISOR//SPANISH CRG BEAMLINE SPLINE BM25//HAXPES |
9 | 0.0000085242 | SIDE CHAIN ALKYLATION//ZEOLITE BASICITY//4 METHYLPENTAN 2 OL DEHYDRATION |
10 | 0.0000058843 | TPR CO//ADSORPT CATALYSIS ENVIRONM PROTECT//MOLEC CHEM ENGN |