Class information for:
Level 1: CRYOGENIC CMOS//LOW TEMPERATURE ELECTRONICS//LOW TEMPERATURE CIRCUIT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
16565 582 15.2 40%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
138 22619 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CRYOGENIC CMOS Author keyword 9 83% 1% 5
2 LOW TEMPERATURE ELECTRONICS Author keyword 6 33% 3% 15
3 LOW TEMPERATURE CIRCUIT Author keyword 2 67% 0% 2
4 CRYOELECTRONICS Author keyword 2 19% 1% 7
5 CRYOGENIC POWER ELECTRONICS Author keyword 1 38% 1% 3
6 CRYOGENIC ADC Author keyword 1 100% 0% 2
7 SUB CIRCUIT MODEL Author keyword 1 50% 0% 2
8 TEMPERATURE 4 K Author keyword 1 100% 0% 2
9 CARRIER FREEZEOUT Author keyword 1 50% 0% 1
10 CRYO BIOLOGY Author keyword 1 50% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 CRYOGENIC CMOS 9 83% 1% 5 Search CRYOGENIC+CMOS Search CRYOGENIC+CMOS
2 LOW TEMPERATURE ELECTRONICS 6 33% 3% 15 Search LOW+TEMPERATURE+ELECTRONICS Search LOW+TEMPERATURE+ELECTRONICS
3 LOW TEMPERATURE CIRCUIT 2 67% 0% 2 Search LOW+TEMPERATURE+CIRCUIT Search LOW+TEMPERATURE+CIRCUIT
4 CRYOELECTRONICS 2 19% 1% 7 Search CRYOELECTRONICS Search CRYOELECTRONICS
5 CRYOGENIC POWER ELECTRONICS 1 38% 1% 3 Search CRYOGENIC+POWER+ELECTRONICS Search CRYOGENIC+POWER+ELECTRONICS
6 CRYOGENIC ADC 1 100% 0% 2 Search CRYOGENIC+ADC Search CRYOGENIC+ADC
7 SUB CIRCUIT MODEL 1 50% 0% 2 Search SUB+CIRCUIT+MODEL Search SUB+CIRCUIT+MODEL
8 TEMPERATURE 4 K 1 100% 0% 2 Search TEMPERATURE+4+K Search TEMPERATURE+4+K
9 CARRIER FREEZEOUT 1 50% 0% 1 Search CARRIER+FREEZEOUT Search CARRIER+FREEZEOUT
10 CRYO BIOLOGY 1 50% 0% 1 Search CRYO+BIOLOGY Search CRYO+BIOLOGY

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEMI EMPIRICAL MODEL 14 65% 2% 13
2 BURIED CHANNEL 2 67% 0% 2
3 LOW TEMPERATURE OPERATION 2 26% 1% 6
4 IGFET 2 43% 1% 3
5 SILICON RESISTOR 1 100% 0% 2
6 42 K 1 11% 2% 12
7 LIQUID HELIUM TEMPERATURES 1 11% 1% 8
8 CMOS INVERTERS 1 23% 1% 3
9 CARRIER STRESSED CHARACTERISTICS 1 50% 0% 1
10 DEVICE BEHAVIOR 1 50% 0% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Cryogenically cooled CMOS 1999 1 25 52%
Ultra-low-power circuit techniques for mm-size wireless sensor nodes with energy harvesting 2014 0 3 33%
Frequency domain magnetic measurements from Kilohertz to Gigahertz 2002 0 14 50%
COLD ELECTRONICS - AN OVERVIEW 1985 65 33 9%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MTECH S 1 50% 0.2% 1
2 URA 127SUPELEC 1 50% 0.2% 1
3 CRYOBIOPHYS CRYOTECHNOL 0 33% 0.2% 1
4 MAIN BIOPHYS CRYOTECHNOL 0 33% 0.2% 1
5 PEDRO JUAN LASTANOSA 0 33% 0.2% 1
6 SUPELECLGEPUMR 8507 0 33% 0.2% 1
7 ABT KRYOELEKT 0 25% 0.2% 1
8 CARACTERISAT COMPOSANTS SEMICOND 0 25% 0.2% 1
9 GRMNT 0 25% 0.2% 1
10 SHANGHAI DESIGN 0 25% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000222938 NONQUASI STATIC NQS EFFECT//QUCS//RSCE
2 0.0000208903 HOT CARRIER//CHANNEL INITIATED SECONDARY ELECTRON CHISEL//HOT CARRIER DEGRADATION
3 0.0000166641 HEAT TRANSFER INSTABILITY//INDIUM JOINT//INFRARED IR EMISSIONS
4 0.0000122338 DOUBLE GATE MOSFET//FINFET//SHORT CHANNEL EFFECTS
5 0.0000122238 DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS QMES//WAVE FUNCTION PENETRATION
6 0.0000119374 POST IMPLANTATION DEFECTS//MULTI INTERFACE SOLAR CELL//PLANAR NANOSTRUCTURE
7 0.0000108230 BELOW GAP EXCITATION//NONRADIATIVE RECOMBINATION//BELOW GAP STATES
8 0.0000093346 NETWORK COMPUTAT NANOTECHNOL//QUASI BALLISTIC TRANSPORT//JOURNAL OF COMPUTATIONAL ELECTRONICS
9 0.0000070346 SIDEWALL OXIDATION//COMPUTAT ELECT//MEMORY DEVICE BUSINESS
10 0.0000067194 BEAM CHANNEL TRANSISTOR//IMPURITY ENHANCED OXIDATION//BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS