Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 16384 | 592 | 21.7 | 60% |
Classes in level above (level 2) |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CERAM PHYS | Address | 36 | 37% | 13% | 76 |
| 2 | RIN | Address | 10 | 40% | 3% | 20 |
| 3 | CONCENTRATED STRESS | Author keyword | 6 | 80% | 1% | 4 |
| 4 | PIEZO SPECTROSCOPY | Author keyword | 4 | 36% | 2% | 10 |
| 5 | PIEZOSPECTROSCOPY | Author keyword | 4 | 36% | 2% | 10 |
| 6 | PROBE RESPONSE FUNCTION | Author keyword | 4 | 75% | 1% | 3 |
| 7 | TOP CUT STRESS LINER | Author keyword | 3 | 100% | 1% | 3 |
| 8 | CHANNEL STRESS | Author keyword | 3 | 60% | 1% | 3 |
| 9 | DAMASCENE GATE | Author keyword | 2 | 44% | 1% | 4 |
| 10 | EMBEDDED SIGE ESIGE | Author keyword | 2 | 67% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | CONCENTRATED STRESS | 6 | 80% | 1% | 4 | Search CONCENTRATED+STRESS | Search CONCENTRATED+STRESS |
| 2 | PIEZO SPECTROSCOPY | 4 | 36% | 2% | 10 | Search PIEZO+SPECTROSCOPY | Search PIEZO+SPECTROSCOPY |
| 3 | PIEZOSPECTROSCOPY | 4 | 36% | 2% | 10 | Search PIEZOSPECTROSCOPY | Search PIEZOSPECTROSCOPY |
| 4 | PROBE RESPONSE FUNCTION | 4 | 75% | 1% | 3 | Search PROBE+RESPONSE+FUNCTION | Search PROBE+RESPONSE+FUNCTION |
| 5 | TOP CUT STRESS LINER | 3 | 100% | 1% | 3 | Search TOP+CUT+STRESS+LINER | Search TOP+CUT+STRESS+LINER |
| 6 | CHANNEL STRESS | 3 | 60% | 1% | 3 | Search CHANNEL+STRESS | Search CHANNEL+STRESS |
| 7 | DAMASCENE GATE | 2 | 44% | 1% | 4 | Search DAMASCENE+GATE | Search DAMASCENE+GATE |
| 8 | EMBEDDED SIGE ESIGE | 2 | 67% | 0% | 2 | Search EMBEDDED+SIGE+ESIGE | Search EMBEDDED+SIGE+ESIGE |
| 9 | MEASURED STRESS | 1 | 50% | 0% | 2 | Search MEASURED+STRESS | Search MEASURED+STRESS |
| 10 | PIEZO SPECTROSCOPIC EFFECT | 1 | 100% | 0% | 2 | Search PIEZO+SPECTROSCOPIC+EFFECT | Search PIEZO+SPECTROSCOPIC+EFFECT |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | OPTICAL FLUORESCENCE | 15 | 53% | 3% | 20 |
| 2 | CHROMIUM DOPED SAPPHIRE | 14 | 64% | 2% | 14 |
| 3 | TENSORIAL ANALYSIS | 5 | 54% | 1% | 7 |
| 4 | MULTIWAVELENGTH RAMAN | 5 | 63% | 1% | 5 |
| 5 | EDGE INDUCED STRESS | 4 | 28% | 2% | 13 |
| 6 | CRYSTAL C AXIS | 4 | 75% | 1% | 3 |
| 7 | ER3 DOPED OPTICAL FIBERS | 3 | 100% | 1% | 3 |
| 8 | SI GEXSI1 X STRUCTURES | 3 | 100% | 1% | 3 |
| 9 | FILM EDGE | 3 | 60% | 1% | 3 |
| 10 | R LINE SHIFTS | 3 | 42% | 1% | 5 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits | 1996 | 409 | 37 | 16% |
| Recent advances in piezospectroscopy | 2007 | 1 | 13 | 62% |
| Raman piezo-spectroscopic analysis of natural and synthetic biomaterials | 2005 | 22 | 26 | 15% |
| Stress microscopy and confocal Raman imaging of load-bearing surfaces in artificial hip joints | 2007 | 3 | 26 | 27% |
| Mechanical behavior study of microdevice and nanomaterials by Raman spectroscopy: a review | 2014 | 0 | 86 | 20% |
| Raman spectroscopy of piezoelectrics | 2013 | 1 | 260 | 12% |
| Bioceramics for Hip Joints: The Physical Chemistry Viewpoint | 2014 | 0 | 112 | 12% |
| Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology | 1996 | 79 | 84 | 10% |
| X-Ray Diffraction: Instrumentation and Applications | 2015 | 0 | 24 | 8% |
| Semiconductor strained layers | 1997 | 2 | 45 | 7% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | CERAM PHYS | 36 | 37% | 13% | 76 |
| 2 | RIN | 10 | 40% | 3.4% | 20 |
| 3 | DICMMPM | 1 | 50% | 0.3% | 2 |
| 4 | ABORAT TEAM GREEN NANOELECT | 1 | 25% | 0.5% | 3 |
| 5 | SPA DEV ENGN | 1 | 33% | 0.3% | 2 |
| 6 | 9112 | 1 | 50% | 0.2% | 1 |
| 7 | ADV SEMICONDUCT | 1 | 50% | 0.2% | 1 |
| 8 | ANAL TECHNOL GRP | 1 | 50% | 0.2% | 1 |
| 9 | HBEREICH MA INENBAU 5 | 1 | 50% | 0.2% | 1 |
| 10 | NANOMET LNM | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000127293 | FILM EDGE//SHAPE ENGINEERING//SILICON TECHNOLOGIES |
| 2 | 0.0000125101 | STRAINED SI//SIGE//STRAINED SILICON |
| 3 | 0.0000096431 | TIP ENHANCED RAMAN SPECTROSCOPY//TERS//TIP ENHANCED RAMAN SPECTROSCOPY TERS |
| 4 | 0.0000075272 | MONOCRYSTALLINE SILICON SURFACE//AU SI THIN FILMS//FOCUSSED ION BEAM MICROSCOPY |
| 5 | 0.0000069360 | CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED |
| 6 | 0.0000068786 | SCHOTTKY BARRIER SB//DOPANT SEGREGATION DS//SCHOTTKY BARRIER SB MOSFET |
| 7 | 0.0000062328 | ANTI FERROMAGNETIC ORDERING//ELECT ELE OTECH AUTOMAT//ANAPAITE |
| 8 | 0.0000061028 | LIGHT PROFILE MICROSCOPY//CONFOCAL RAMAN SPECTROSCOPY//OIL IMMERSION OBJECTIVE |
| 9 | 0.0000058220 | CERAMIC LAMINATES//LAMINATED CERAMICS//FIBROUS MONOLITHS |
| 10 | 0.0000057947 | ZONE MELTING RECRYSTALLIZATION//ARCHITECTURE TECH//LASER INDUCED TEMPERATURE RISE |