Class information for:
Level 1: ELECTRON BEAM DOPING//KEK PF//BRAGG LAUE DIFFRACTION

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
15810 622 15.9 33%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
687 12408 JOURNAL OF SYNCHROTRON RADIATION//DIFFRACTION ENHANCED IMAGING//PHASE RETRIEVAL

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELECTRON BEAM DOPING Author keyword 12 75% 1% 9
2 KEK PF Address 12 63% 2% 12
3 BRAGG LAUE DIFFRACTION Author keyword 6 100% 1% 4
4 BORRMANN EFFECT Author keyword 4 38% 1% 8
5 PLANE WAVE X RAY TOPOGRAPHY Author keyword 3 100% 0% 3
6 X RAY BEAM CONDENSATION Author keyword 3 100% 0% 3
7 X RAY BEAM CONFINEMENT Author keyword 3 100% 0% 3
8 AF IOFFE ENGN PHYS Address 2 67% 0% 2
9 DISLOCATION CONTRAST Author keyword 2 67% 0% 2
10 PENDELLOSUNG FRINGES Author keyword 2 50% 0% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 ELECTRON BEAM DOPING 12 75% 1% 9 Search ELECTRON+BEAM+DOPING Search ELECTRON+BEAM+DOPING
2 BRAGG LAUE DIFFRACTION 6 100% 1% 4 Search BRAGG+LAUE+DIFFRACTION Search BRAGG+LAUE+DIFFRACTION
3 BORRMANN EFFECT 4 38% 1% 8 Search BORRMANN+EFFECT Search BORRMANN+EFFECT
4 PLANE WAVE X RAY TOPOGRAPHY 3 100% 0% 3 Search PLANE+WAVE+X+RAY+TOPOGRAPHY Search PLANE+WAVE+X+RAY+TOPOGRAPHY
5 X RAY BEAM CONDENSATION 3 100% 0% 3 Search X+RAY+BEAM+CONDENSATION Search X+RAY+BEAM+CONDENSATION
6 X RAY BEAM CONFINEMENT 3 100% 0% 3 Search X+RAY+BEAM+CONFINEMENT Search X+RAY+BEAM+CONFINEMENT
7 DISLOCATION CONTRAST 2 67% 0% 2 Search DISLOCATION+CONTRAST Search DISLOCATION+CONTRAST
8 PENDELLOSUNG FRINGES 2 50% 0% 3 Search PENDELLOSUNG+FRINGES Search PENDELLOSUNG+FRINGES
9 CONDUCTIVE STRONTIUM TITANATE 1 100% 0% 2 Search CONDUCTIVE+STRONTIUM+TITANATE Search CONDUCTIVE+STRONTIUM+TITANATE
10 HETEROEPITAXIAL LAYER 1 50% 0% 2 Search HETEROEPITAXIAL+LAYER Search HETEROEPITAXIAL+LAYER

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCATTERING FACTOR 6 48% 2% 10
2 MINUTE STRAIN FIELDS 6 80% 1% 4
3 SECTION TOPOGRAPHY 6 71% 1% 5
4 NONPROJECTIVENESS 6 100% 1% 4
5 SWIRLS 5 63% 1% 5
6 PENDELLOSUNG FRINGES 5 30% 2% 13
7 ORIENTATION TOPOGRAPHY 3 100% 0% 3
8 DISTORTED CRYSTALS 3 24% 2% 10
9 TOPO TOMOGRAPHIC TECHNIQUE 2 67% 0% 2
10 SPHERICAL WAVE THEORY 2 50% 0% 3

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
PROPAGATION OF X-RAYS IN DISTORTED CRYSTALS UNDER DYNAMIC DIFFRACTION 1991 23 18 56%
SIMULATION OF X-RAY TOPOGRAPHS 1985 44 16 100%
THE SIMULATION OF X-RAY TOPOGRAPHIC IMAGES 1987 12 17 100%
OPTICAL AND X-RAY TOPOGRAPHICAL INVESTIGATIONS OF SYNTHETICALLY GROWN QUARTZ CRYSTALS WITH INDUCED GROWTH STRIATIONS 1992 7 20 80%
SIMULATION OF X-RAY TOPOGRAPHS 1988 2 13 100%
DISLOCATIONS IN SYNTHETIC QUARTZ 1994 0 4 50%
X-ray crystal interferometers 2014 0 98 20%
X-RAY TOPOGRAPHIC STUDIES IN THE PEOPLES-REPUBLIC-OF-CHINA 1986 0 1 100%
BRAGG ANGLE MEASUREMENT AND MAPPING 1981 44 9 22%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 KEK PF 12 63% 1.9% 12
2 AF IOFFE ENGN PHYS 2 67% 0.3% 2
3 UPS LURE 1 100% 0.3% 2
4 ARBEITSGRP RONTGENBEUGUNG 1 33% 0.3% 2
5 PLICAT SYNCHROTRON RADIAT LAS 1 33% 0.3% 2
6 CNRS UMR 5183 0 33% 0.2% 1
7 FRAUNHOFER IZFP 0 33% 0.2% 1
8 HEPT 0 33% 0.2% 1
9 URA 009 0 33% 0.2% 1
10 BRANCH SHUBNIKOV CRYSTALLOG 0 25% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000259026 CNRS L NEEL//PARA TERPHENYL SINGLE CRYSTALS//URA 009 CNRS
2 0.0000170976 DOUBLY CURVED CRYSTALS//BRAGG SPECTROMETER//CRYSTAL ANALYSER
3 0.0000152478 X RAY CTR//GLANCING ANGLE INCIDENCE//X RAY CRYSTAL TRUNCATION ROD
4 0.0000102061 X RAY MULTIPLE DIFFRACTION//THREE BEAM X RAY DIFFRACTION//RENNINGER SCAN
5 0.0000098275 SAGITTAL FOCUSING//INCLINED DIFFRACTION//DIFFRACTIVE REFRACTIVE OPTICS
6 0.0000082177 TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES
7 0.0000058272 PL PHYS INFORMAT//ELE ON TUBE 2//SETAGAYAKU
8 0.0000057355 THREE DIMENSIONAL X RAY DIFFRACTION//3DXRD//DIFFRACTION CONTRAST TOMOGRAPHY
9 0.0000050390 SYNTHETIC DIAMOND//NATURAL DIAMONDS//NATURAL DIAMOND
10 0.0000040291 MAKYOH TOPOGRAPHY//WIRE SAWING//WAFER PRODUCTION