Class information for:
Level 1: BANDLIKE STATES//DISLOCATION ENGINEERED//RECOMBINATION STRENGTH

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
15730 625 17.3 53%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1342 7876 EDGE DEFINED FILM FED GROWTH//MULTICRYSTALLINE SILICON//PROGRESS IN PHOTOVOLTAICS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 BANDLIKE STATES Author keyword 2 67% 0% 2
2 DISLOCATION ENGINEERED Author keyword 2 67% 0% 2
3 RECOMBINATION STRENGTH Author keyword 2 67% 0% 2
4 D BANDS Author keyword 2 43% 0% 3
5 D LINE Author keyword 2 43% 0% 3
6 DISLOCATION ENGINEERING Author keyword 1 33% 0% 3
7 INDIRECT BANDGAP SEMICONDUCTOR Author keyword 1 40% 0% 2
8 SILICON GROWTH Author keyword 1 40% 0% 2
9 JOINT IHP BTU Address 1 25% 0% 3
10 IHP Address 1 13% 1% 6

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 BANDLIKE STATES 2 67% 0% 2 Search BANDLIKE+STATES Search BANDLIKE+STATES
2 DISLOCATION ENGINEERED 2 67% 0% 2 Search DISLOCATION+ENGINEERED Search DISLOCATION+ENGINEERED
3 RECOMBINATION STRENGTH 2 67% 0% 2 Search RECOMBINATION+STRENGTH Search RECOMBINATION+STRENGTH
4 D BANDS 2 43% 0% 3 Search D+BANDS Search D+BANDS
5 D LINE 2 43% 0% 3 Search D+LINE Search D+LINE
6 DISLOCATION ENGINEERING 1 33% 0% 3 Search DISLOCATION+ENGINEERING Search DISLOCATION+ENGINEERING
7 INDIRECT BANDGAP SEMICONDUCTOR 1 40% 0% 2 Search INDIRECT+BANDGAP+SEMICONDUCTOR Search INDIRECT+BANDGAP+SEMICONDUCTOR
8 SILICON GROWTH 1 40% 0% 2 Search SILICON+GROWTH Search SILICON+GROWTH
9 D LINES 1 33% 0% 2 Search D+LINES Search D+LINES
10 A SIH MU C SIH TANDEM SOLAR CELLS 1 50% 0% 1 Search A+SIH+MU+C+SIH+TANDEM+SOLAR+CELLS Search A+SIH+MU+C+SIH+TANDEM+SOLAR+CELLS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PLASTICALLY DEFORMED SILICON 23 45% 6% 39
2 DISLOCATION RELATED LUMINESCENCE 5 60% 1% 6
3 DISLOCATION RELATED PHOTOLUMINESCENCE 5 47% 1% 8
4 EXTENDED STRUCTURAL DEFECTS 4 75% 0% 3
5 DIPOLE SPIN RESONANCE 3 57% 1% 4
6 STABLE SPECTRAL CHARACTERISTICS 3 100% 0% 3
7 N DOPED SILICON 2 67% 0% 2
8 DISLOCATION LUMINESCENCE 2 43% 0% 3
9 EDGE ELECTROLUMINESCENCE 1 100% 0% 2
10 SI1 XGEX SI100 1 100% 0% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Electronic states at dislocations and metal silicide precipitates in crystalline silicon and their role in solar cell materials 2009 32 70 31%
Defect engineering in implantation technology of silicon light-emitting structures with dislocation-related luminescence 2010 5 63 56%
CHARGED DISLOCATIONS IN SEMICONDUCTORS 1995 7 7 57%
THE ELECTRICAL-PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS 1984 14 5 40%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 JOINT IHP BTU 1 25% 0.5% 3
2 IHP 1 13% 1.0% 6
3 LEHRSTUHL INTEGRIERTE SYST 1 33% 0.3% 2
4 LIONS DSM IRAMIS NIMBE 1 50% 0.2% 1
5 MICROELECT CHEM PROBLEM 1 50% 0.2% 1
6 STATE MESOSCOP PHYS PHYS 1 50% 0.2% 1
7 BTU JOINT 1 29% 0.3% 2
8 IHP BTU JOINT 0 20% 0.3% 2
9 EDUC NANOSYST MODERN MAT 0 33% 0.2% 1
10 IHP MICROELECT 0 33% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000204521 ELECTRON BEAM INDUCED CURRENT//ELECTRON BEAM APPLICATION//SEMICONDUCTOR MATERIAL MEASUREMENTS
2 0.0000199967 HEAVY B DOPING//CONCEPTS DISPOSITIFS PHOTON//UMR 6630
3 0.0000147666 OPTIMIZATION OF ANNEALING//ERBIUM RELATED CENTRES//SELF ASSEMBLED SILICON QUANTUM WELLS
4 0.0000146617 CLUSTER OF DEFECTS//GROUP II ELEMENTS//SI CD
5 0.0000102032 METALLURGICAL GRADE SILICON//SOLAR GRADE SILICON//MULTICRYSTALLINE SILICON
6 0.0000085133 CARL EMILY FUCHS MICROELECT//CEFIM//EUROPEAN QUAL
7 0.0000084764 GETTERING//GETTERING EFFICIENCY//SI AU
8 0.0000078601 ERBIUM//ERBIUM DOPED SILICON//ERBIUM IMPLANTATION
9 0.0000071660 OXYGEN PRECIPITATION//GROWN IN DEFECT//CZOCHRALSKI SILICON
10 0.0000068200 STRAINED SI1 XGEX SI QUANTUM WELLS//SI SIGE SUPERLATTICE//STRAINED SIGE SI