Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
15374 | 645 | 21.2 | 52% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
588 | 13481 | TEXTURES AND MICROSTRUCTURES//SECONDARY RECRYSTALLIZATION//RECRYSTALLIZATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | KIKUCHI LINES | Author keyword | 11 | 100% | 1% | 6 |
2 | ELECTRON CHANNELING CONTRAST IMAGING ECCI | Author keyword | 8 | 75% | 1% | 6 |
3 | ACOM | Author keyword | 7 | 53% | 1% | 9 |
4 | ELECTRON BACKSCATTER DIFFRACTION | Author keyword | 7 | 11% | 9% | 55 |
5 | KIKUCHI PATTERNS | Author keyword | 5 | 45% | 1% | 9 |
6 | BACKSCATTER KIKUCHI DIFFRACTION BKD | Author keyword | 4 | 67% | 1% | 4 |
7 | GEOMETRICALLY NECESSARY DISLOCATIONS GNDS | Author keyword | 4 | 56% | 1% | 5 |
8 | BACKSCATTER KIKUCHI PATTERN | Author keyword | 3 | 100% | 0% | 3 |
9 | PATTERN CENTER | Author keyword | 3 | 100% | 0% | 3 |
10 | KIKUCHI PATTERN | Author keyword | 3 | 32% | 1% | 7 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | BACK SCATTER DIFFRACTION | 52 | 82% | 5% | 31 |
2 | ELASTIC STRAIN MEASUREMENT | 21 | 75% | 2% | 15 |
3 | BACKSCATTER DIFFRACTION | 18 | 51% | 4% | 25 |
4 | ELECTRON BACKSCATTER DIFFRACTION | 15 | 16% | 13% | 83 |
5 | KIKUCHI DIFFRACTION | 12 | 63% | 2% | 12 |
6 | EBSD | 11 | 19% | 8% | 53 |
7 | CHANNELING PATTERNS | 10 | 63% | 2% | 10 |
8 | KIKUCHI PATTERNS | 8 | 41% | 2% | 16 |
9 | DISLOCATION DENSITY DISTRIBUTIONS | 8 | 70% | 1% | 7 |
10 | BACKSCATTER KIKUCHI DIFFRACTION | 8 | 75% | 1% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
A Review of Strain Analysis Using Electron Backscatter Diffraction | 2011 | 57 | 27 | 85% |
Review - Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis | 2002 | 59 | 56 | 64% |
Strains, planes, and EBSD in materials science | 2012 | 20 | 73 | 70% |
Automated crystal orientation and phase mapping in TEM | 2014 | 4 | 34 | 53% |
A critical review of orientation microscopy in SEM and TEM | 2011 | 25 | 41 | 59% |
Electron diffraction based techniques in scanning electron microscopy of bulk materials | 1997 | 142 | 48 | 56% |
Automated crystal lattice orientation mapping using a computer-controlled SEM | 1997 | 94 | 18 | 61% |
In-situ Deformation Analysis of Nanocrystalline Metals by Quantitative ACOM-STEM | 2013 | 0 | 2 | 100% |
Computer-aided crystallographic analysis in the TEM | 2002 | 20 | 17 | 47% |
Electron backscatter diffraction: Strategies for reliable data acquisition and processing | 2009 | 31 | 27 | 33% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MET INZYNIERII MATERIALOWEJ | 2 | 67% | 0.3% | 2 |
2 | AG TEXTUR | 1 | 100% | 0.3% | 2 |
3 | UMR5010 | 1 | 50% | 0.3% | 2 |
4 | TSL | 1 | 21% | 0.6% | 4 |
5 | ADV NONFERROUS STRUCT ALLOYS CANFSA | 1 | 50% | 0.2% | 1 |
6 | AUSTRALIAN MICROSCOPY MICROANALYSIS | 1 | 50% | 0.2% | 1 |
7 | ETUDES MAT | 1 | 50% | 0.2% | 1 |
8 | INLINSA LYON | 1 | 50% | 0.2% | 1 |
9 | INTERCONNECT 3D | 1 | 50% | 0.2% | 1 |
10 | ROSARIO PHYS | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000216780 | THREE DIMENSIONAL X RAY DIFFRACTION//3DXRD//DIFFRACTION CONTRAST TOMOGRAPHY |
2 | 0.0000140737 | CRYSTAL PLASTICITY//DISLOCATION BOUNDARIES//STRAIN PATH CHANGE |
3 | 0.0000103740 | GRAIN BOUNDARY ENGINEERING//GRAIN BOUNDARY PLANE//GRAIN BOUNDARY CHARACTER DISTRIBUTION |
4 | 0.0000103523 | LIGHT MET S//RECRYSTALLIZATION TEXTURE//SHEAR TEXTURE |
5 | 0.0000075249 | TEXTURES AND MICROSTRUCTURES//WIMV METHOD//TEXTURE GONIOMETRY |
6 | 0.0000074151 | SURFACE ASPERITY FLATTENING//CHRISTIAN DOPPLER MODERNE MEHRPHASENSTAHLE//ROPING |
7 | 0.0000072764 | REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS |
8 | 0.0000067402 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
9 | 0.0000067395 | SECONDARY RECRYSTALLIZATION//SILICON STEEL//SINGLE STAGE COLD ROLLING PROCESS |
10 | 0.0000064223 | STATE FATIGUE FRACTURE MAT//PERSISTENT SLIP BAND//COPPER BICRYSTAL |