Class information for:
Level 1: REFINED BEAM UNIT//SI111ROOT 3 X ROOT 3 AL//REFLECTION ELECTRON MICROSCOPY REM

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
15221 655 23.8 52%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
803 11388 ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 REFINED BEAM UNIT Address 2 67% 0% 2
2 SI111ROOT 3 X ROOT 3 AL Author keyword 2 67% 0% 2
3 REFLECTION ELECTRON MICROSCOPY REM Author keyword 2 20% 1% 7
4 ELECTRON INTENSITY Author keyword 1 100% 0% 2
5 UHV REM Author keyword 1 100% 0% 2
6 SCATTERING POTENTIAL Author keyword 1 22% 1% 4
7 RHEED INTENSITY OSCILLATION Author keyword 1 20% 1% 4
8 RHEED INTENSITY OSCILLATIONS Author keyword 1 33% 0% 2
9 ENERGY FILTER Author keyword 1 13% 1% 6
10 REFLECTION ELECTRON MICROSCOPY Author keyword 1 14% 1% 5

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 SI111ROOT 3 X ROOT 3 AL 2 67% 0% 2 Search SI111ROOT+3+X+ROOT+3+AL Search SI111ROOT+3+X+ROOT+3+AL
2 REFLECTION ELECTRON MICROSCOPY REM 2 20% 1% 7 Search REFLECTION+ELECTRON+MICROSCOPY+REM Search REFLECTION+ELECTRON+MICROSCOPY+REM
3 ELECTRON INTENSITY 1 100% 0% 2 Search ELECTRON+INTENSITY Search ELECTRON+INTENSITY
4 UHV REM 1 100% 0% 2 Search UHV+REM Search UHV+REM
5 SCATTERING POTENTIAL 1 22% 1% 4 Search SCATTERING+POTENTIAL Search SCATTERING+POTENTIAL
6 RHEED INTENSITY OSCILLATION 1 20% 1% 4 Search RHEED+INTENSITY+OSCILLATION Search RHEED+INTENSITY+OSCILLATION
7 RHEED INTENSITY OSCILLATIONS 1 33% 0% 2 Search RHEED+INTENSITY+OSCILLATIONS Search RHEED+INTENSITY+OSCILLATIONS
8 ENERGY FILTER 1 13% 1% 6 Search ENERGY+FILTER Search ENERGY+FILTER
9 REFLECTION ELECTRON MICROSCOPY 1 14% 1% 5 Search REFLECTION+ELECTRON+MICROSCOPY Search REFLECTION+ELECTRON+MICROSCOPY
10 ANGULAR DISTRIBUTION OF BACKSCATTERED ELECTRONS 1 50% 0% 1 Search ANGULAR+DISTRIBUTION+OF+BACKSCATTERED+ELECTRONS Search ANGULAR+DISTRIBUTION+OF+BACKSCATTERED+ELECTRONS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 GROWING SURFACES 11 69% 1% 9
2 GENERAL MATRIX REPRESENTATION 7 64% 1% 7
3 RHEED 7 13% 8% 51
4 RHEED PATTERNS 7 57% 1% 8
5 BEAM ROCKING METHOD 6 80% 1% 4
6 MBE GROWING SURFACES 6 80% 1% 4
7 RHEED INTENSITY OSCILLATIONS 6 41% 2% 12
8 RANDOMLY DISTRIBUTED STEPS 5 60% 1% 6
9 111 SILICON SURFACES 5 44% 1% 8
10 ENERGY LOSS EVENTS 4 75% 0% 3

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
RHEED wave function and its applications 2009 5 19 53%
REFLECTION ELECTRON-MICROSCOPY - STUDIES OF SURFACE-STRUCTURES AND SURFACE DYNAMIC PROCESSES 1993 49 96 36%
Resonance scattering of high energy electrons by a crystal surface 1996 6 72 81%
Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction - Part II 1999 19 233 21%
ELECTRON REFLECTION, DIFFRACTION AND IMAGING OF BULK CRYSTAL-SURFACES IN TEM AND STEM 1993 15 158 68%
Calculation of RHEED intensities for imperfect surfaces 1998 2 19 84%
Incoherent scattering of electrons by a crystal surface 1997 4 42 64%
Interpretation of reflection high energy electron diffraction from disordered surfaces: Dynamical theory and its application to the experiment 1999 1 61 52%
The structural analysis possibilities of reflection high energy electron diffraction 2010 3 70 16%
ELECTRON-MICROSCOPY OF SURFACE-STRUCTURE 1986 43 52 52%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 REFINED BEAM UNIT 2 67% 0.3% 2
2 PL PHYS SHINJUKU KU 0 20% 0.3% 2
3 ENGN QUANTUM ENGN CHIKUSA KU 0 14% 0.2% 1
4 STANDORT ESSEN 0 13% 0.2% 1
5 PL PHYS CHIKUSA KU 0 11% 0.2% 1
6 ABT OBERFLACHEN 0 10% 0.2% 1
7 MET MINERAL ENGN 0 100% 0.2% 1
8 SERV NANOSTRUCT RAYONNEMENT 0 100% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000217538 REFLECTION MASS SPECTROMETRY//2D ISLAND//INTERFACE DISORDER
2 0.0000181141 HIGH RESOLUTION LOW ENERGY ELECTRON DIFFRACTION//GAAS GAP//SURFACE RESONANCES
3 0.0000139473 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS
4 0.0000114444 VICINAL SINGLE CRYSTAL SURFACES//STEPPED SINGLE CRYSTAL SURFACES//STEP WANDERING
5 0.0000111011 VEELS//ELECTRON ENERGY FILTER//LOW VOLTAGE EELS
6 0.0000106455 SINGLE CRYSTAL AU100 ELECTRODE//ZAKLAD CHEM FIZYCZNEJ//CNRS UP A 70 45
7 0.0000103257 DAS STRUCTURE//SN GE111//SI111 7 X 7
8 0.0000102090 PODOLSK BRANCH//TUNGSTEN ATOMS//PENTAGONAL CRYSTALS
9 0.0000091534 EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY
10 0.0000089958 ATOM WI LAYERS//SI335//AU SI INTERFACE