Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 15215 | 656 | 25.3 | 47% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 3034 | 1987 | LINE PROFILE ANALYSIS//X RAY PEAK PROFILE ANALYSIS//WHOLE POWDER PATTERN MODELLING |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | LINE PROFILE ANALYSIS | Author keyword | 27 | 46% | 7% | 44 |
| 2 | X RAY PEAK PROFILE ANALYSIS | Author keyword | 21 | 90% | 1% | 9 |
| 3 | WHOLE POWDER PATTERN MODELLING | Author keyword | 15 | 82% | 1% | 9 |
| 4 | CONTRAST FACTORS | Author keyword | 8 | 100% | 1% | 5 |
| 5 | DISLOCATION CHARACTER | Author keyword | 6 | 80% | 1% | 4 |
| 6 | LINE BROADENING ANALYSIS | Author keyword | 3 | 43% | 1% | 6 |
| 7 | STRAIN ANISOTROPY | Author keyword | 3 | 43% | 1% | 6 |
| 8 | FOURIER LINE SHAPE ANALYSIS | Author keyword | 3 | 100% | 0% | 3 |
| 9 | WPPM | Author keyword | 3 | 60% | 0% | 3 |
| 10 | X RAY PROFILE ANALYSIS | Author keyword | 3 | 60% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | LINE PROFILE ANALYSIS | 27 | 46% | 7% | 44 | Search LINE+PROFILE+ANALYSIS | Search LINE+PROFILE+ANALYSIS |
| 2 | X RAY PEAK PROFILE ANALYSIS | 21 | 90% | 1% | 9 | Search X+RAY+PEAK+PROFILE+ANALYSIS | Search X+RAY+PEAK+PROFILE+ANALYSIS |
| 3 | WHOLE POWDER PATTERN MODELLING | 15 | 82% | 1% | 9 | Search WHOLE+POWDER+PATTERN+MODELLING | Search WHOLE+POWDER+PATTERN+MODELLING |
| 4 | CONTRAST FACTORS | 8 | 100% | 1% | 5 | Search CONTRAST+FACTORS | Search CONTRAST+FACTORS |
| 5 | DISLOCATION CHARACTER | 6 | 80% | 1% | 4 | Search DISLOCATION+CHARACTER | Search DISLOCATION+CHARACTER |
| 6 | LINE BROADENING ANALYSIS | 3 | 43% | 1% | 6 | Search LINE+BROADENING+ANALYSIS | Search LINE+BROADENING+ANALYSIS |
| 7 | STRAIN ANISOTROPY | 3 | 43% | 1% | 6 | Search STRAIN+ANISOTROPY | Search STRAIN+ANISOTROPY |
| 8 | FOURIER LINE SHAPE ANALYSIS | 3 | 100% | 0% | 3 | Search FOURIER+LINE+SHAPE+ANALYSIS | Search FOURIER+LINE+SHAPE+ANALYSIS |
| 9 | WPPM | 3 | 60% | 0% | 3 | Search WPPM | Search WPPM |
| 10 | X RAY PROFILE ANALYSIS | 3 | 60% | 0% | 3 | Search X+RAY+PROFILE+ANALYSIS | Search X+RAY+PROFILE+ANALYSIS |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | PLASTICALLY DEFORMED CRYSTALS | 56 | 74% | 6% | 42 |
| 2 | NON CUBIC MATERIALS | 42 | 83% | 4% | 24 |
| 3 | HEXAGONAL CRYSTALS | 34 | 60% | 6% | 37 |
| 4 | CONTRAST FACTORS | 21 | 71% | 3% | 17 |
| 5 | CRYSTALLITE SIZE DISTRIBUTION | 20 | 53% | 4% | 27 |
| 6 | LINE PROFILE ANALYSIS | 19 | 35% | 7% | 44 |
| 7 | DISLOCATION CONTRAST | 18 | 46% | 4% | 29 |
| 8 | LATTICE IMPERFECTIONS | 15 | 71% | 2% | 12 |
| 9 | GALLIUM ALPHA PHASE | 11 | 100% | 1% | 6 |
| 10 | SCHERRER CONSTANTS | 10 | 73% | 1% | 8 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| Line broadening analysis using integral breadth methods: a critical review | 2004 | 127 | 37 | 62% |
| Pitfalls in the characterization of nanoporous and nanosized materials | 2011 | 33 | 29 | 28% |
| Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis | 2007 | 21 | 78 | 45% |
| X-RAY-DIFFRACTION LINE BROADENING - MODELING AND APPLICATIONS TO HIGH-TC SUPERCONDUCTORS | 1993 | 78 | 72 | 19% |
| PARTICLE-SIZE, PARTICLE-SIZE DISTRIBUTION, AND RELATED MEASUREMENTS OF SUPPORTED METAL-CATALYSTS | 1987 | 160 | 16 | 6% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | MCX BEAMLINE | 1 | 50% | 0.3% | 2 |
| 2 | PETR MIN | 1 | 50% | 0.3% | 2 |
| 3 | MATEMAT KRYPTOL | 1 | 25% | 0.5% | 3 |
| 4 | CHAIR MAT IMPACT ENGN | 1 | 50% | 0.2% | 1 |
| 5 | CNRS UMR 104 | 1 | 50% | 0.2% | 1 |
| 6 | CORROS SCI TECHNOL SECT | 1 | 50% | 0.2% | 1 |
| 7 | CSF RJ | 1 | 50% | 0.2% | 1 |
| 8 | DIP INGN MAT | 1 | 50% | 0.2% | 1 |
| 9 | GEORGIA TECHNOL LORRAINE | 1 | 50% | 0.2% | 1 |
| 10 | PAZMANY PETER SETANY | 1 | 50% | 0.2% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000207989 | CRYSTAL IMPERFECTION PARAMETERS//LALS//STUDIES SERICULTURE |
| 2 | 0.0000204789 | SUBSTRUCTURE INHOMOGENEITY//GENERALIZED POLE FIGURE//X RAY LINE PROFILE |
| 3 | 0.0000198358 | STRUCTURE SOLUTION//POWDER DIFFRACTION//CRYSTAL STRUCTURE SOLUTION |
| 4 | 0.0000138779 | THREE DIMENSIONAL X RAY DIFFRACTION//3DXRD//DIFFRACTION CONTRAST TOMOGRAPHY |
| 5 | 0.0000105948 | RHOPALOPSOLE//LEUCTRIDAE//PARALEUCTRA |
| 6 | 0.0000086237 | REUSS MODEL//RESIDUAL STRESS ANALYSIS//X RAY STRESS MEASUREMENT |
| 7 | 0.0000075790 | CRYOMILLING//NANOSTRUCTURED MATERIALS//RDRL WMM F |
| 8 | 0.0000072206 | LOCAL AND GLOBAL STRUCTURE//BEIJING SYNCHROTRON RADIAT ILITIES//SUPPORTED GOLD CATALYSTS |
| 9 | 0.0000068209 | SEVERE PLASTIC DEFORMATION//EQUAL CHANNEL ANGULAR PRESSING//PHYS ADV MAT |
| 10 | 0.0000065462 | PAIR DISTRIBUTION FUNCTION//TOTAL SCATTERING//ATOMIC PAIR DISTRIBUTION |