Class information for:
Level 1: CURRENT DENSITY FILAMENT//HIGH FIELD DOMAIN//GUNN EFFECT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
15087 663 18.2 49%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
3081 1887 BELOW GAP EXCITATION//CURRENT DENSITY FILAMENT//GUNN EFFECT

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CURRENT DENSITY FILAMENT Author keyword 6 71% 1% 5
2 HIGH FIELD DOMAIN Author keyword 5 63% 1% 5
3 GUNN EFFECT Author keyword 4 28% 2% 11
4 RECOMBINATION INSTABILITY Author keyword 3 100% 0% 3
5 SEMICONDUCTOR BREAKDOWN Author keyword 3 100% 0% 3
6 FIELD ENHANCED TRAPPING Author keyword 1 100% 0% 2
7 GOLD DOPED N GE Author keyword 1 100% 0% 2
8 GUNN OSCILLATION Author keyword 1 50% 0% 2
9 IMPACT IONIZATION AVALANCHE Author keyword 1 50% 0% 2
10 LOW FREQUENCY CURRENT OSCILLATION Author keyword 1 100% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 CURRENT DENSITY FILAMENT 6 71% 1% 5 Search CURRENT+DENSITY+FILAMENT Search CURRENT+DENSITY+FILAMENT
2 HIGH FIELD DOMAIN 5 63% 1% 5 Search HIGH+FIELD+DOMAIN Search HIGH+FIELD+DOMAIN
3 GUNN EFFECT 4 28% 2% 11 Search GUNN+EFFECT Search GUNN+EFFECT
4 RECOMBINATION INSTABILITY 3 100% 0% 3 Search RECOMBINATION+INSTABILITY Search RECOMBINATION+INSTABILITY
5 SEMICONDUCTOR BREAKDOWN 3 100% 0% 3 Search SEMICONDUCTOR+BREAKDOWN Search SEMICONDUCTOR+BREAKDOWN
6 FIELD ENHANCED TRAPPING 1 100% 0% 2 Search FIELD+ENHANCED+TRAPPING Search FIELD+ENHANCED+TRAPPING
7 GOLD DOPED N GE 1 100% 0% 2 Search GOLD+DOPED+N+GE Search GOLD+DOPED+N+GE
8 GUNN OSCILLATION 1 50% 0% 2 Search GUNN+OSCILLATION Search GUNN+OSCILLATION
9 IMPACT IONIZATION AVALANCHE 1 50% 0% 2 Search IMPACT+IONIZATION+AVALANCHE Search IMPACT+IONIZATION+AVALANCHE
10 LOW FREQUENCY CURRENT OSCILLATION 1 100% 0% 2 Search LOW+FREQUENCY+CURRENT+OSCILLATION Search LOW+FREQUENCY+CURRENT+OSCILLATION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ULTRAPURE GE 23 100% 2% 10
2 P GERMANIUM 21 90% 1% 9
3 BREATHING CURRENT FILAMENTS 20 100% 1% 9
4 TEMPERATURE IMPURITY BREAKDOWN 20 100% 1% 9
5 CHAOTIC FLUCTUATIONS 17 100% 1% 8
6 DRIVEN CURRENT FILAMENT 11 100% 1% 6
7 EXTRINSIC GE 9 83% 1% 5
8 IMPURITY BREAKDOWN 9 67% 1% 8
9 LOCALIZED CURRENT FILAMENTS 8 70% 1% 7
10 EXTRINSIC SEMICONDUCTORS 8 60% 1% 9

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Slow domains in semi-insulating GaAs 2001 48 69 39%
RECOMBINATION AND IONIZATION PROCESSES AT IMPURITY CENTERS IN HOT-ELECTRON SEMICONDUCTOR TRANSPORT 1989 24 36 33%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 PHYS DIELECT SEMICOND 1 50% 0.2% 1
2 PHYS LEHRSTUHL EXPT PHYS 2 1 50% 0.2% 1
3 TELECOMM SYST 1 50% 0.2% 1
4 IPN UNIDAD QUERETARO 0 33% 0.2% 1
5 COMMUN PROD 0 25% 0.2% 1
6 UNIDAD ASOCIADA CIENCIA MAT 0 25% 0.2% 1
7 PHOENIX CORP 0 17% 0.2% 1
8 COLEGIO TECN AGRICOLA ILDEFONSO BASTOS BORGES 0 100% 0.2% 1
9 ENGN ELECT ENGN NADA KU 0 100% 0.2% 1
10 EXPTL MED 4 0 100% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000209943 DENSITY OF IRRIGATION//MOL CRYST PHYS//WAVES OSCILLATIONS AND INSTABILITIES IN PLASMA
2 0.0000147994 BELOW GAP EXCITATION//NONRADIATIVE RECOMBINATION//BELOW GAP STATES
3 0.0000133400 NON EQUILIBRIUM ELECTRONS//DEVICE MODELLING//ENGN STATE
4 0.0000103908 DRAIN CURRENT TRANSIENT//FUNCT ELEMENTS CONTROL SYST//GATE LAG
5 0.0000071015 N CDS//ACOUSTIC DOMAIN//BRILLOUIN SCATTERING METHOD
6 0.0000067240 A STATES//GRP PHOTOELECT THEOR//COMPENSATED SEMICONDUCTORS
7 0.0000064778 GERMANIUM DOPED WITH GALLIUM//ISO SPACECRAFT//EXTRINSIC SEMICONDUCTOR
8 0.0000062464 DIELECTRIC BARRIER DISCHARGE//DIELECTRIC BARRIER DISCHARGE DBD//ATMOSPHERIC PRESSURE GLOW PLASMA
9 0.0000061364 TYPE II INTERMITTENCY//CIRCLE DIFFEOMORPHISM//CIRCLE HOMEOMORPHISM
10 0.0000060413 PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES PCSSS//PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES//ULTRAFAST PHOTOELECT TECHNOL