Class information for:
Level 1: ISOTROPY DEGREE//BULK INHOMOGENEITY//DEV OPT IL

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
15043 666 17.6 42%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1998 5036 CORRELAT OPT//WAVES IN RANDOM MEDIA//ELECTROMAGNETIC SCATTERING BY ROUGH SURFACES

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ISOTROPY DEGREE Author keyword 6 80% 1% 4
2 BULK INHOMOGENEITY Author keyword 6 71% 1% 5
3 DEV OPT IL Address 3 100% 0% 3
4 F NEL MARSEILLE Address 3 60% 0% 3
5 PRECIS MECH SYST ENGN Address 2 44% 1% 4
6 ANGLE RESOLVED SCATTERING Author keyword 2 28% 1% 7
7 DEFECT INDUCED ABSORPTION Author keyword 2 67% 0% 2
8 FREE SPACE PATTERN Author keyword 2 67% 0% 2
9 REACTIVE ELECTRON BEAM EVAPORATION Author keyword 2 67% 0% 2
10 REPLICATION FUNCTIONS Author keyword 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 ISOTROPY DEGREE 6 80% 1% 4 Search ISOTROPY+DEGREE Search ISOTROPY+DEGREE
2 BULK INHOMOGENEITY 6 71% 1% 5 Search BULK+INHOMOGENEITY Search BULK+INHOMOGENEITY
3 ANGLE RESOLVED SCATTERING 2 28% 1% 7 Search ANGLE+RESOLVED+SCATTERING Search ANGLE+RESOLVED+SCATTERING
4 DEFECT INDUCED ABSORPTION 2 67% 0% 2 Search DEFECT+INDUCED+ABSORPTION Search DEFECT+INDUCED+ABSORPTION
5 FREE SPACE PATTERN 2 67% 0% 2 Search FREE+SPACE+PATTERN Search FREE+SPACE+PATTERN
6 REACTIVE ELECTRON BEAM EVAPORATION 2 67% 0% 2 Search REACTIVE+ELECTRON+BEAM+EVAPORATION Search REACTIVE+ELECTRON+BEAM+EVAPORATION
7 REPLICATION FUNCTIONS 2 67% 0% 2 Search REPLICATION+FUNCTIONS Search REPLICATION+FUNCTIONS
8 TOTAL INTEGRATED SCATTER 2 36% 1% 4 Search TOTAL+INTEGRATED+SCATTER Search TOTAL+INTEGRATED+SCATTER
9 ATOMIC SURFACE PROPERTY 1 100% 0% 2 Search ATOMIC+SURFACE+PROPERTY Search ATOMIC+SURFACE+PROPERTY
10 CHIP COILS 1 100% 0% 2 Search CHIP+COILS Search CHIP+COILS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 BULK SCATTERING 25 70% 3% 21
2 OPTICAL MULTILAYERS 23 72% 3% 18
3 MULTILAYER OPTICS 9 33% 3% 22
4 ANGLE RESOLVED ELLIPSOMETRY 5 54% 1% 7
5 OPTICAL SURFACES 3 13% 3% 18
6 INFRARED SCATTERING 2 67% 0% 2
7 ANGLE RESOLVED SCATTERING 2 36% 1% 4
8 AUTOCOVARIANCE FUNCTIONS 1 50% 0% 2
9 MEASURING INSTRUMENT 1 100% 0% 2
10 ROUGHNESS SPECTRUM 1 100% 0% 2

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
RECENT DEVELOPMENTS IN SURFACE-ROUGHNESS CHARACTERIZATION 1992 66 15 27%
SURFACES - LOCAL DEFECTS AND ROUGHNESS 1993 4 22 73%
BIDIRECTIONAL SCATTERING DISTRIBUTION FUNCTION (BSDF) - A SYSTEMATIZED BIBLIOGRAPHY 1991 8 42 52%
POLISHING PROCESS - LOCAL DEFECTS AND ROUGHNESS .1. LOCAL DEFECTS 1993 1 21 71%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 DEV OPT IL 3 100% 0.5% 3
2 F NEL MARSEILLE 3 60% 0.5% 3
3 PRECIS MECH SYST ENGN 2 44% 0.6% 4
4 ABT OPT SYST 1 50% 0.3% 2
5 CORNING DISPLAY TECHNOL 1 50% 0.2% 1
6 FUNCT OPTOELECT 1 50% 0.2% 1
7 GRUPPO TRENTO 1 50% 0.2% 1
8 IRIS INTEGRAT RECOGNIT IMMUNE SYST 1 50% 0.2% 1
9 LITTON 1 50% 0.2% 1
10 SOLTERM 1 50% 0.2% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000211591 AIR GAUGING//PNEUMATIC GAUGING//SCATTERING PRINCIPLE
2 0.0000159413 PHOTON MICROFABRICAT//APLANATIC OPTICS//MCP OPTICS
3 0.0000132068 END HALL ION GUN//MWIR REGION//LENS ENGN DEV
4 0.0000125930 MEASUREMENT OF EVOLVED HYDROGEN//ALUMINUM PIGMENTS//INTERFERENCE PIGMENTS
5 0.0000097614 LASER INTERFERENCE MICROSCOPY//COHERENT PHASE MICROSCOPY//DYNAMIC PHASE MICROSCOPY
6 0.0000096905 WAVES IN RANDOM MEDIA//ELECTROMAGNETIC SCATTERING BY ROUGH SURFACES//SEA SURFACE ELECTROMAGNETIC SCATTERING
7 0.0000093595 CONTAMINATED MIRRORS//MODIFIED MIE THEORY//ELECTROMAGNETIC PULSE EMP SIMULATOR
8 0.0000064972 RD OPT THIN FILM COATINGS//TIO2 SIO2 HIGH REFLECTORS//LASER INDUCED DAMAGE
9 0.0000056377 CORRELAT OPT//OPT PUBLISHING//PROBLEMS PRECIS MECH CONTROL
10 0.0000054407 THREE DIMENSIONAL IRREGULARITY//STATISTICAL IRREGULARITIES//WAVEGUIDE SCATTERING PROBLEMS