Class information for:
Level 1: TRANSLATIONAL KINETIC ENERGY//POINT DEFECT GENERATION//OXYGEN MOLECULAR BEAM

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
14951 671 24.3 68%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
666 12577 SCANNING TUNNELING MICROSCOPY//ATOM WI LAYERS//VICINAL SINGLE CRYSTAL SURFACES

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 TRANSLATIONAL KINETIC ENERGY Author keyword 6 80% 1% 4
2 POINT DEFECT GENERATION Author keyword 4 75% 0% 3
3 OXYGEN MOLECULAR BEAM Author keyword 3 100% 0% 3
4 SI OXIDATION Author keyword 3 42% 1% 5
5 SI THERMAL OXIDATION Author keyword 2 67% 0% 2
6 SI001 OXIDATION Author keyword 2 67% 0% 2
7 SI0012X1 SURFACE Author keyword 2 67% 0% 2
8 SCANNING REFLECTION ELECTRON MICROSCOPY Author keyword 2 50% 0% 3
9 O 2 GAS Author keyword 2 43% 0% 3
10 BACKBOND Author keyword 1 100% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 TRANSLATIONAL KINETIC ENERGY 6 80% 1% 4 Search TRANSLATIONAL+KINETIC+ENERGY Search TRANSLATIONAL+KINETIC+ENERGY
2 POINT DEFECT GENERATION 4 75% 0% 3 Search POINT+DEFECT+GENERATION Search POINT+DEFECT+GENERATION
3 OXYGEN MOLECULAR BEAM 3 100% 0% 3 Search OXYGEN+MOLECULAR+BEAM Search OXYGEN+MOLECULAR+BEAM
4 SI OXIDATION 3 42% 1% 5 Search SI+OXIDATION Search SI+OXIDATION
5 SI THERMAL OXIDATION 2 67% 0% 2 Search SI+THERMAL+OXIDATION Search SI+THERMAL+OXIDATION
6 SI001 OXIDATION 2 67% 0% 2 Search SI001+OXIDATION Search SI001+OXIDATION
7 SI0012X1 SURFACE 2 67% 0% 2 Search SI0012X1+SURFACE Search SI0012X1+SURFACE
8 SCANNING REFLECTION ELECTRON MICROSCOPY 2 50% 0% 3 Search SCANNING+REFLECTION+ELECTRON+MICROSCOPY Search SCANNING+REFLECTION+ELECTRON+MICROSCOPY
9 O 2 GAS 2 43% 0% 3 Search O+2+GAS Search O+2+GAS
10 BACKBOND 1 100% 0% 2 Search BACKBOND Search BACKBOND

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SI EJECTION 25 75% 3% 18
2 MOLECULAR PRECURSOR 23 43% 6% 41
3 CHEMISTRY END STATION 15 67% 2% 14
4 STAGE OXIDATION PRODUCTS 15 77% 1% 10
5 SUCCESSIVE OXIDATION STAGES 15 88% 1% 7
6 ULTRATHIN OXIDE 13 48% 3% 20
7 BY LAYER OXIDATION 7 38% 2% 15
8 BL23SU 7 57% 1% 8
9 SIO2 SI INTERFACE 4 11% 6% 37
10 X RAY BEAMLINE 4 31% 2% 12

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
THE INTERACTION OF MOLECULAR AND ATOMIC OXYGEN WITH SI(100) AND SI(111) 1993 225 61 62%
Nanolithography on SiO2/Si with a scanning tunnelling microscope 2003 15 29 55%
Application of integrated computer simulation approach to solid surfaces and interfaces 1998 0 101 9%
Epitaxial and endotaxial semiconductor quantum dots: A brief review on atomic ordering and the void-mediated formation mechanism 2005 1 24 4%
CHEMICAL INFORMATIONS IN AUGER-ELECTRON SPECTROSCOPY 1985 12 34 18%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 COMPUTAT VISUALIZAT VIRTUAL REAL SICHUA 1 50% 0.1% 1
2 ENGN BUILT ENGN 1 50% 0.1% 1
3 KAWAKATSU 1 50% 0.1% 1
4 MINERAL CRYSTALLOG PARIS 1 50% 0.1% 1
5 PHYS INTER ES COUCHES MINES 1 50% 0.1% 1
6 SOLID STATE PHYS MESA 1 50% 0.1% 1
7 SYNCHOROTRON RADIAT 1 50% 0.1% 1
8 UP A 7014 CNRS 1 50% 0.1% 1
9 ENGN MOL CHEM ENGN AOBA KU 0 33% 0.1% 1
10 CNRS PHOTOPHYS MOLEC 0 15% 0.3% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000257876 INTERFACIAL SILICON EMISSION//SILICON OXIDATION//LOW TEMPERATURE SILICON OXIDATION
2 0.0000186352 HYDROGEN TERMINATION//SHIZUOKA TORY//LAYER BY LAYER OXIDATION
3 0.0000176727 HIGH INDEX SINGLE CRYSTAL SURFACES//SI110//SI113
4 0.0000152444 ORGANIC SEMICONDUCTOR INTERFACE//SI100//GE100
5 0.0000131544 GE001//C4 X 2//C4X2
6 0.0000124971 CEA SERV RECH SUR ES IRRADIAT MAT//CHIM ORGAN THEORIQUE//DISPLAY DEVICE CO
7 0.0000111900 NANOPYRAMID ARRAY//DOPANT ION IMPLANTATION//FIS SUPERFICIES INTER ES
8 0.0000091153 SYNCHROTRON RADIATION STIMULATED ETCHING//SYNCHROTRON RADIATION EXCITED GROWTH//VACUUM UV PHOTOSCI
9 0.0000074716 DAS STRUCTURE//SN GE111//SI111 7 X 7
10 0.0000071683 PHYSICOCHIM MOLEC ORSAY//SURFACE STRUCTURE AND ROUGHNESS//DESORPTION INDUCED BY ELECTRON STIMULATION