Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 14321 | 711 | 29.3 | 63% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | VEELS | Author keyword | 15 | 67% | 2% | 14 |
| 2 | ELECTRON ENERGY FILTER | Author keyword | 3 | 100% | 0% | 3 |
| 3 | LOW VOLTAGE EELS | Author keyword | 3 | 100% | 0% | 3 |
| 4 | ELECTRON ENERGY LOSSES | Author keyword | 3 | 60% | 0% | 3 |
| 5 | VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY | Author keyword | 3 | 60% | 0% | 3 |
| 6 | ELE ON NANOSCOPIES | Address | 1 | 100% | 0% | 2 |
| 7 | PLASMONIC FORCES | Author keyword | 1 | 100% | 0% | 2 |
| 8 | QUANTUM NANOELECT ERCH | Address | 1 | 100% | 0% | 2 |
| 9 | SURFACE RESPONSE FUNCTION | Author keyword | 1 | 100% | 0% | 2 |
| 10 | VALENCE EELS | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | VEELS | 15 | 67% | 2% | 14 | Search VEELS | Search VEELS |
| 2 | ELECTRON ENERGY FILTER | 3 | 100% | 0% | 3 | Search ELECTRON+ENERGY+FILTER | Search ELECTRON+ENERGY+FILTER |
| 3 | LOW VOLTAGE EELS | 3 | 100% | 0% | 3 | Search LOW+VOLTAGE+EELS | Search LOW+VOLTAGE+EELS |
| 4 | ELECTRON ENERGY LOSSES | 3 | 60% | 0% | 3 | Search ELECTRON+ENERGY+LOSSES | Search ELECTRON+ENERGY+LOSSES |
| 5 | VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY | 3 | 60% | 0% | 3 | Search VALENCE+ELECTRON+ENERGY+LOSS+SPECTROSCOPY | Search VALENCE+ELECTRON+ENERGY+LOSS+SPECTROSCOPY |
| 6 | PLASMONIC FORCES | 1 | 100% | 0% | 2 | Search PLASMONIC+FORCES | Search PLASMONIC+FORCES |
| 7 | SURFACE RESPONSE FUNCTION | 1 | 100% | 0% | 2 | Search SURFACE+RESPONSE+FUNCTION | Search SURFACE+RESPONSE+FUNCTION |
| 8 | VALENCE EELS | 1 | 100% | 0% | 2 | Search VALENCE+EELS | Search VALENCE+EELS |
| 9 | ZERO LOSS PEAK | 1 | 100% | 0% | 2 | Search ZERO+LOSS+PEAK | Search ZERO+LOSS+PEAK |
| 10 | INTERFACE PLASMON | 1 | 40% | 0% | 2 | Search INTERFACE+PLASMON | Search INTERFACE+PLASMON |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | LOSS SCATTERING | 18 | 89% | 1% | 8 |
| 2 | SMALL ALUMINUM SPHERES | 17 | 100% | 1% | 8 |
| 3 | VALENCE LOSS SPECTRA | 11 | 100% | 1% | 6 |
| 4 | BANDGAP DETERMINATION | 9 | 83% | 1% | 5 |
| 5 | MULTILAYERED SLABS | 8 | 70% | 1% | 7 |
| 6 | EXTERNAL ELECTRON BEAM | 8 | 75% | 1% | 6 |
| 7 | RESOLUTION EELS | 6 | 80% | 1% | 4 |
| 8 | SUPPORTED METAL PARTICLES | 5 | 31% | 2% | 15 |
| 9 | SI L2 3 | 5 | 63% | 1% | 5 |
| 10 | INDUCED PHOTON EMISSION | 4 | 24% | 2% | 14 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| Mapping plasmons at the nanometer scale in an electron microscope | 2014 | 14 | 39 | 77% |
| Electron energy-loss spectroscopy in the TEM | 2009 | 160 | 72 | 29% |
| Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy | 2005 | 42 | 18 | 72% |
| Optical properties and bandgaps from low loss EELS: Pitfalls and solutions | 2008 | 29 | 30 | 70% |
| Image potential in scanning transmission electron microscopy | 2000 | 27 | 85 | 75% |
| Valence electron excitations and plasmon oscillations in thin films, surfaces, interfaces and small particles | 1996 | 52 | 76 | 62% |
| Measuring the dielectric constant of materials from valence EELS | 2009 | 5 | 10 | 90% |
| Probing plasmonic nanostructures by photons and electrons | 2015 | 1 | 56 | 23% |
| Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS | 2009 | 5 | 9 | 78% |
| Fourier-ratio deconvolution and its Bayesian equivalent | 2008 | 4 | 13 | 77% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | ELE ON NANOSCOPIES | 1 | 100% | 0.3% | 2 |
| 2 | QUANTUM NANOELECT ERCH | 1 | 100% | 0.3% | 2 |
| 3 | MICROSCOPIA ELECT MAT | 1 | 40% | 0.3% | 2 |
| 4 | PHYS AG THEORET OPT PHOTON | 1 | 40% | 0.3% | 2 |
| 5 | ELE ON MICROSCOPY NANOANAL FELMI | 1 | 33% | 0.3% | 2 |
| 6 | CNRS UMR8502 | 1 | 23% | 0.4% | 3 |
| 7 | CCIA | 1 | 12% | 0.8% | 6 |
| 8 | STUTTGART ELE ON MICROSCOPY | 1 | 14% | 0.7% | 5 |
| 9 | CIENCIAS DPTO ELECT ELE | 1 | 50% | 0.1% | 1 |
| 10 | CNRS URA 002 | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000216681 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
| 2 | 0.0000137979 | PL THEORET PHYS//RAINBOWS//PHYS 010 |
| 3 | 0.0000122447 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
| 4 | 0.0000115058 | CHROMOPERMITTIVITY//PROMPT BREMSSTRAHLUNG//VAVILOV CHERENKOV RADIATION |
| 5 | 0.0000112306 | FANO RESONANCE//PLASMON HYBRIDIZATION//NANOPHOTON |
| 6 | 0.0000111011 | REFINED BEAM UNIT//SI111ROOT 3 X ROOT 3 AL//REFLECTION ELECTRON MICROSCOPY REM |
| 7 | 0.0000099272 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
| 8 | 0.0000098325 | ACOUSTIC SURFACE PLASMON//SURFACE PLASMON DISPERSION//SURFACE PLASMON LIFETIME |
| 9 | 0.0000098118 | PHOTOFIELD EMISSION//ELECTRON PLASMON INTERACTION//PHOTOFIELD EMISSION CURRENT |
| 10 | 0.0000087442 | UV PLASMONICS//CHARLES BOWDEN//MAGNESIUM FILMS |