Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
13894 | 742 | 27.8 | 34% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
192 | 20771 | JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LAMMS | Author keyword | 4 | 67% | 1% | 4 |
2 | LASER MICROPROBE MASS SPECTROMETRY | Author keyword | 4 | 44% | 1% | 7 |
3 | FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY | Author keyword | 3 | 100% | 0% | 3 |
4 | GALDI | Author keyword | 3 | 100% | 0% | 3 |
5 | GEOMATRIX | Author keyword | 3 | 100% | 0% | 3 |
6 | SPE OMETRIE MASSE CHIM LASER | Address | 3 | 21% | 1% | 11 |
7 | INORGANIC SPECIATION | Author keyword | 2 | 38% | 1% | 5 |
8 | LA FTICRMS | Author keyword | 2 | 67% | 0% | 2 |
9 | LASER ABLATION IONIZATION | Author keyword | 2 | 67% | 0% | 2 |
10 | FTICRMS | Author keyword | 2 | 43% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LAMMS | 4 | 67% | 1% | 4 | Search LAMMS | Search LAMMS |
2 | LASER MICROPROBE MASS SPECTROMETRY | 4 | 44% | 1% | 7 | Search LASER+MICROPROBE+MASS+SPECTROMETRY | Search LASER+MICROPROBE+MASS+SPECTROMETRY |
3 | FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY | 3 | 100% | 0% | 3 | Search FOURIER+TRANSFORM+LASER+MICROPROBE+MASS+SPECTROMETRY | Search FOURIER+TRANSFORM+LASER+MICROPROBE+MASS+SPECTROMETRY |
4 | GALDI | 3 | 100% | 0% | 3 | Search GALDI | Search GALDI |
5 | GEOMATRIX | 3 | 100% | 0% | 3 | Search GEOMATRIX | Search GEOMATRIX |
6 | INORGANIC SPECIATION | 2 | 38% | 1% | 5 | Search INORGANIC+SPECIATION | Search INORGANIC+SPECIATION |
7 | LA FTICRMS | 2 | 67% | 0% | 2 | Search LA+FTICRMS | Search LA+FTICRMS |
8 | LASER ABLATION IONIZATION | 2 | 67% | 0% | 2 | Search LASER+ABLATION+IONIZATION | Search LASER+ABLATION+IONIZATION |
9 | FTICRMS | 2 | 43% | 0% | 3 | Search FTICRMS | Search FTICRMS |
10 | LDMS | 1 | 40% | 0% | 2 | Search LDMS | Search LDMS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SPARK SOURCE | 12 | 86% | 1% | 6 |
2 | EXTERNAL ION SOURCE | 11 | 69% | 1% | 9 |
3 | ANALYSIS LAMMA | 7 | 64% | 1% | 7 |
4 | MICROPROBE MASS SPECTROMETRY | 6 | 43% | 1% | 10 |
5 | ALKALINE EARTH CHROMATE | 5 | 63% | 1% | 5 |
6 | ORGANIC MICROANALYSIS | 3 | 57% | 1% | 4 |
7 | CHROMIUM CLUSTER FORMATION | 2 | 67% | 0% | 2 |
8 | LAMMA | 2 | 31% | 1% | 5 |
9 | ASBESTOS FIBER SURFACES | 1 | 50% | 0% | 2 |
10 | INORGANIC MICROANALYSIS | 1 | 100% | 0% | 2 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
LASER IONIZATION MASS-SPECTROMETRY IN INORGANIC TRACE ANALYSIS | 1992 | 25 | 57 | 88% |
ORGANIC AND INORGANIC ANALYSIS WITH LASER MICROPROBE MASS-SPECTROMETRY .1. INSTRUMENTATION AND METHODOLOGY | 1994 | 52 | 78 | 85% |
ORGANIC AND INORGANIC ANALYSIS WITH LASER MICROPROBE MASS-SPECTROMETRY .2. APPLICATIONS | 1994 | 28 | 117 | 57% |
INTERACTION OF LASER-RADIATION WITH SOLID MATERIALS AND ITS SIGNIFICANCE TO ANALYTICAL SPECTROMETRY - A REVIEW | 1993 | 131 | 642 | 21% |
Spatial distribution of perylenequinones in lichens and extended quinones in quincyte using confocal fluorescence microscopy | 2001 | 5 | 3 | 100% |
LASER VAPORIZATION IN ATOMIC SPECTROSCOPY | 1984 | 83 | 74 | 55% |
Laser ionization time-of-flight mass spectrometry for direct elemental analysis | 2009 | 7 | 78 | 22% |
Laser-induced Fourier transform ion cyclotron resonance mass spectrometry of organic and inorganic compounds: methodologies and applications | 2007 | 5 | 100 | 30% |
LASER MICROANALYSIS | 1986 | 32 | 141 | 52% |
LASER MICRO-PROBE MASS-SPECTROMETRY .2. APPLICATIONS TO STRUCTURAL-ANALYSIS | 1982 | 131 | 8 | 75% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SPE OMETRIE MASSE CHIM LASER | 3 | 21% | 1.5% | 11 |
2 | ECIL | 1 | 22% | 0.3% | 2 |
3 | COMPOSIT CHARACTERISAT MAT CCCM | 0 | 33% | 0.1% | 1 |
4 | INNOVAT TRANSFER NAT SCI ENGN KNOWLEDGE | 0 | 25% | 0.1% | 1 |
5 | SOLARE ENERGIESYST | 0 | 20% | 0.1% | 1 |
6 | ZENT ABT CHEM ANALYSEN | 0 | 11% | 0.1% | 1 |
7 | JEAN BARRIOL FEDERAT RECH 2843 | 0 | 10% | 0.1% | 1 |
8 | BASIC MAT ENGN | 0 | 100% | 0.1% | 1 |
9 | CENT SOLID STATE PHYS MAT SCI | 0 | 100% | 0.1% | 1 |
10 | SPE OMETRIE MASS MASS CHIM LASER | 0 | 100% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000114431 | CHARGE REMOTE FRAGMENTATION//FAST ATOM BOMBARDMENT//INTERNAL CALIBRANT |
2 | 0.0000111099 | SINGLE PARTICLE MASS SPECTROMETRY//ATOFMS//AERODYNAMIC LENS |
3 | 0.0000099348 | ION MIRROR//ORTHOGONAL ACCELERATION//TIME OF FLIGHT DESIGN |
4 | 0.0000085617 | RESONANCE IONIZATION MASS SPECTROMETRY//RESONANT LASER ABLATION//KR 81 |
5 | 0.0000085244 | LASER ABLATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY//LA ICP MS//CENT ANALYT CHEM |
6 | 0.0000085059 | SUPERSONIC JET SPECTROMETRY//SINGLE PHOTON IONIZATION//ABT UMWELT PROZES EM |
7 | 0.0000077248 | SPARK AC//THETA PINCH DISCHARGE//FG RUMENTELLE ANALYT |
8 | 0.0000074962 | LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS//INDIVIDUAL PARTICLE ANALYSIS//LOW Z PARTICLE EPMA |
9 | 0.0000072377 | GAMMA ACTIVATION//DIGITAL GAMMA ACTIVATION AUTORADIOGRAPHY//GOLD AND URANIUM |
10 | 0.0000070962 | FT ICR//FTMS//EXTERNAL ION SOURCE |