Class information for:
Level 1: DEVICE MODELLING GRP//RANDOM DOPANT//DEVICE MODELING GRP

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
13725 754 19.5 50%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
138 22619 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 DEVICE MODELLING GRP Address 49 56% 8% 60
2 RANDOM DOPANT Author keyword 22 81% 2% 13
3 DEVICE MODELING GRP Address 22 68% 3% 19
4 INTRINSIC PARAMETER FLUCTUATION Author keyword 13 80% 1% 8
5 RANDOM DOPANTS Author keyword 13 71% 1% 10
6 PARALLEL SCI COMP Address 12 58% 2% 14
7 RANDOM DISCRETE DOPANTS Author keyword 11 100% 1% 6
8 INTRINSIC PARAMETER FLUCTUATIONS Author keyword 9 64% 1% 9
9 CHARACTERISTIC FLUCTUATION Author keyword 9 83% 1% 5
10 ROBUST TRANSISTOR PROGRAM Address 8 100% 1% 5

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 RANDOM DOPANT 22 81% 2% 13 Search RANDOM+DOPANT Search RANDOM+DOPANT
2 INTRINSIC PARAMETER FLUCTUATION 13 80% 1% 8 Search INTRINSIC+PARAMETER+FLUCTUATION Search INTRINSIC+PARAMETER+FLUCTUATION
3 RANDOM DOPANTS 13 71% 1% 10 Search RANDOM+DOPANTS Search RANDOM+DOPANTS
4 RANDOM DISCRETE DOPANTS 11 100% 1% 6 Search RANDOM+DISCRETE+DOPANTS Search RANDOM+DISCRETE+DOPANTS
5 INTRINSIC PARAMETER FLUCTUATIONS 9 64% 1% 9 Search INTRINSIC+PARAMETER+FLUCTUATIONS Search INTRINSIC+PARAMETER+FLUCTUATIONS
6 CHARACTERISTIC FLUCTUATION 9 83% 1% 5 Search CHARACTERISTIC+FLUCTUATION Search CHARACTERISTIC+FLUCTUATION
7 RANDOM DOPANT FLUCTUATION 8 39% 2% 15 Search RANDOM+DOPANT+FLUCTUATION Search RANDOM+DOPANT+FLUCTUATION
8 RANDOM WORK FUNCTION 6 80% 1% 4 Search RANDOM+WORK+FUNCTION Search RANDOM+WORK+FUNCTION
9 RANDOM DOPANT FLUCTUATION RDF 6 38% 2% 13 Search RANDOM+DOPANT+FLUCTUATION+RDF Search RANDOM+DOPANT+FLUCTUATION+RDF
10 CHARGE BASED CAPACITANCE MEASUREMENT CBCM 6 71% 1% 5 Search CHARGE+BASED+CAPACITANCE+MEASUREMENT+CBCM Search CHARGE+BASED+CAPACITANCE+MEASUREMENT+CBCM

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INTRINSIC PARAMETER FLUCTUATIONS 49 54% 8% 64
2 THRESHOLD VOLTAGE FLUCTUATIONS 25 77% 2% 17
3 DOPANT FLUCTUATIONS 23 74% 2% 17
4 DECANANOMETER MOSFETS 16 60% 2% 18
5 DECANANOMETER 12 46% 3% 19
6 DEVICE VARIATIONS 8 100% 1% 5
7 THRESHOLD VOLTAGE FLUCTUATION 8 39% 2% 16
8 SURROUNDING GATE 7 50% 1% 10
9 WORK FUNCTION VARIATION 7 53% 1% 9
10 THRESHOLD VOLTAGE VARIABILITY 7 57% 1% 8

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs 2003 272 49 39%
State-of-the-art silicon device miniaturization technology and its challenges 2014 0 14 100%
Modeling Coulomb Effects in Nanoscale Devices 2008 4 41 49%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 DEVICE MODELLING GRP 49 56% 8.0% 60
2 DEVICE MODELING GRP 22 68% 2.5% 19
3 PARALLEL SCI COMP 12 58% 1.9% 14
4 ROBUST TRANSISTOR PROGRAM 8 100% 0.7% 5
5 NSI PROJECT 6 100% 0.5% 4
6 ADV DESIGN FRAMEWORK DEV 1 50% 0.3% 2
7 RENESAS SEMICOND ENGN 1 100% 0.3% 2
8 TOSHIBA IBM RD 1 100% 0.3% 2
9 COMPUTAT NANOELECT 1 11% 0.8% 6
10 ADV LOG TECHNOL 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000240769 SRAM//PROCESS VARIATION//POWER GATING
2 0.0000209660 ELLIPSOIDAL TECHNIQUE//DESIGN CENTERING//PARAMETRIC YIELD
3 0.0000202840 CURRENT STEERING//DIGITAL TO ANALOG CONVERTER DAC//DIGITAL TO ANALOG CONVERTERS DACS
4 0.0000190715 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//CHRISTIAN DOPPLER TCAD
5 0.0000159081 NETWORK COMPUTAT NANOTECHNOL//QUASI BALLISTIC TRANSPORT//JOURNAL OF COMPUTATIONAL ELECTRONICS
6 0.0000142185 DOUBLE GATE MOSFET//FINFET//SHORT CHANNEL EFFECTS
7 0.0000100038 DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS QMES//WAVE FUNCTION PENETRATION
8 0.0000080345 SIDEWALL OXIDATION//COMPUTAT ELECT//MEMORY DEVICE BUSINESS
9 0.0000079258 VOLTAGE REFERENCE//CMOS VOLTAGE REFERENCE//CURVATURE COMPENSATION
10 0.0000079037 ANALOG CIRCUIT SYNTHESIS//CIRCUIT SIZING//ANALOG DESIGN AUTOMATION