Class information for:
Level 1: OHMIC CONTACT//OHMIC CONTACTS//P TYPE SIC

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
13696 756 18.5 65%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1001 9900 SILICON CARBIDE//4H SIC//SIC

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 OHMIC CONTACT Author keyword 12 13% 11% 83
2 OHMIC CONTACTS Author keyword 8 13% 8% 59
3 P TYPE SIC Author keyword 4 36% 1% 8
4 MRG Address 4 28% 1% 11
5 AL TI CONTACTS Author keyword 3 100% 0% 3
6 MATH SCI SPORTS EDUC Address 3 100% 0% 3
7 OHMIC METAL CONTACTS Author keyword 3 100% 0% 3
8 SXFS Author keyword 3 100% 0% 3
9 SPECIFIC CONTACT RESISTANCE Author keyword 3 16% 2% 16
10 BIASED REACTION Author keyword 2 67% 0% 2

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 OHMIC CONTACT 12 13% 11% 83 Search OHMIC+CONTACT Search OHMIC+CONTACT
2 OHMIC CONTACTS 8 13% 8% 59 Search OHMIC+CONTACTS Search OHMIC+CONTACTS
3 P TYPE SIC 4 36% 1% 8 Search P+TYPE+SIC Search P+TYPE+SIC
4 AL TI CONTACTS 3 100% 0% 3 Search AL+TI+CONTACTS Search AL+TI+CONTACTS
5 OHMIC METAL CONTACTS 3 100% 0% 3 Search OHMIC+METAL+CONTACTS Search OHMIC+METAL+CONTACTS
6 SXFS 3 100% 0% 3 Search SXFS Search SXFS
7 SPECIFIC CONTACT RESISTANCE 3 16% 2% 16 Search SPECIFIC+CONTACT+RESISTANCE Search SPECIFIC+CONTACT+RESISTANCE
8 BIASED REACTION 2 67% 0% 2 Search BIASED+REACTION Search BIASED+REACTION
9 NI OHMIC CONTACT 2 67% 0% 2 Search NI+OHMIC+CONTACT Search NI+OHMIC+CONTACT
10 CONTACT RESISTIVITY 2 13% 2% 14 Search CONTACT+RESISTIVITY Search CONTACT+RESISTIVITY

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 AL TI CONTACTS 11 78% 1% 7
2 ION BACKSCATTERING 7 46% 2% 12
3 NICKEL CONTACTS 4 75% 0% 3
4 NICKEL TITANIUM OHMIC CONTACTS 3 100% 0% 3
5 DIFFERENT ANNEALING TEMPERATURES 2 67% 0% 2
6 DEVICE TECHNOLOGIES 1 50% 0% 2
7 DIODE FORMATION 1 100% 0% 2
8 EPITAXIAL TITANIUM CARBIDE 1 100% 0% 2
9 NI CONTACTS 1 100% 0% 2
10 POLAR FACES 1 50% 0% 2

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
A CRITICAL-REVIEW OF OHMIC AND RECTIFYING CONTACTS FOR SILICON-CARBIDE 1995 265 68 53%
Surface studies on SiC as related to contacts 1997 67 55 51%
Building blocks for SiC devices: Ohmic contacts, Schottky contacts, and p-n junctions 1998 20 105 53%
Wide gap semiconductor microwave devices 2007 38 159 9%
Interface Reactions and Synthetic Reaction of Composite Systems 2010 1 32 41%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MRG 4 28% 1.5% 11
2 MATH SCI SPORTS EDUC 3 100% 0.4% 3
3 WIDE BAND G MAT 1 50% 0.3% 2
4 IND MICROELECT 1 23% 0.4% 3
5 ALLISON S 206 1 50% 0.1% 1
6 CNRS CEA SNECMA PROP SOLIDE 1 50% 0.1% 1
7 DIMES S 1 50% 0.1% 1
8 DRECAMSPCSISIMA 1 50% 0.1% 1
9 ECL LYON 1 50% 0.1% 1
10 ELECT SCI ENGN SAKYO KU 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000212432 4H SIC//SILICON CARBIDE SIC//BIPOLAR JUNCTION TRANSISTORS BJTS
2 0.0000204208 SIMA//HEXAGONAL SURFACES//DSMDRECAMSPCSI
3 0.0000109807 4H SIC MESFET//MESFET//MESFETS
4 0.0000100781 3C SIC//FG NANOTECHNOL//HOLLOW VOID
5 0.0000096124 MICROPIPE//SUBLIMATION GROWTH//MICROPIPES
6 0.0000092338 IN FRANTZEVICH PROBLEMS MAT SCI//GROWTH TECHNIQUES//SEMICOND HETEROSTRUCT
7 0.0000088367 LEHRSTUHL THEOR FESTKORPERPHYS//SEMI INSULATING SIC//TEMPERATURE DEPENDENCE OF MAJORITY CARRIER CONCENTRATION
8 0.0000072288 SERIES RESISTANCE//BARRIER INHOMOGENEITY//IDEALITY FACTOR
9 0.0000068277 BRAZING//JOINING//ACTIVE BRAZING
10 0.0000067237 P GAN//OHMIC CONTACT//OHMIC CONTACTS