Class information for:
Level 1: SI1 YCY//SI1 X YGEXCY//SICGE

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
13539 765 19.4 73%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
769 11658 SIGE//GERMANIUM//STRAINED SI

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 SI1 YCY Author keyword 23 86% 2% 12
2 SI1 X YGEXCY Author keyword 13 62% 2% 13
3 SICGE Author keyword 12 86% 1% 6
4 SIGEC Author keyword 10 35% 3% 24
5 SI1 XCX Author keyword 6 80% 1% 4
6 SI1 YCY ALLOY Author keyword 6 80% 1% 4
7 GERMANIUM CARBON EPILAYER Author keyword 6 100% 1% 4
8 MIXED SIGNAL PROC GRP Address 4 75% 0% 3
9 PLIE Author keyword 4 56% 1% 5
10 LOW TEMPERATURE SILICON EPITAXY Author keyword 3 57% 1% 4

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
LCSH search Wikipedia search
1 SI1 YCY 23 86% 2% 12 Search SI1+YCY Search SI1+YCY
2 SI1 X YGEXCY 13 62% 2% 13 Search SI1+X+YGEXCY Search SI1+X+YGEXCY
3 SICGE 12 86% 1% 6 Search SICGE Search SICGE
4 SIGEC 10 35% 3% 24 Search SIGEC Search SIGEC
5 SI1 XCX 6 80% 1% 4 Search SI1+XCX Search SI1+XCX
6 SI1 YCY ALLOY 6 80% 1% 4 Search SI1+YCY+ALLOY Search SI1+YCY+ALLOY
7 GERMANIUM CARBON EPILAYER 6 100% 1% 4 Search GERMANIUM+CARBON+EPILAYER Search GERMANIUM+CARBON+EPILAYER
8 PLIE 4 56% 1% 5 Search PLIE Search PLIE
9 LOW TEMPERATURE SILICON EPITAXY 3 57% 1% 4 Search LOW+TEMPERATURE+SILICON+EPITAXY Search LOW+TEMPERATURE+SILICON+EPITAXY
10 SI 6H SIC HETEROJUNCTION 3 100% 0% 3 Search SI+6H+SIC+HETEROJUNCTION Search SI+6H+SIC+HETEROJUNCTION

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 SI1 X YGEXCY 98 76% 9% 69
2 SI1 X YGEXCY ALLOYS 56 85% 4% 29
3 SI1 YCY ALLOYS 55 82% 4% 32
4 SI1 YCY 44 74% 4% 32
5 SUBSTITUTIONAL CARBON INCORPORATION 33 83% 2% 19
6 SUBSTITUTIONAL CARBON 19 63% 2% 19
7 C4X4 RECONSTRUCTION 19 70% 2% 16
8 SI1 XCX ALLOYS 12 86% 1% 6
9 C INCORPORATION 11 100% 1% 6
10 SI1 X YGEXCY EPITAXIAL LAYERS 11 100% 1% 6

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
General trends of the carbon penetration in Si(001) surfaces: influences of relevant parameters 2006 3 67 67%
GROWTH AND PROPERTIES OF STRAINED SI1-X-YGEXCY LAYERS 1995 67 57 53%
Synthesis and atomic and electronic structure of new Si-Ge-C alloys and compounds 1998 14 46 65%
Si1-yCy and Si1-x-yGexCy alloy layers 1999 3 87 79%
Structural and vibrational properties of carbon impurities in crystalline silicon 2001 3 24 63%
Growth of silicon-germanium alloy layers 2000 7 71 21%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 MIXED SIGNAL PROC GRP 4 75% 0.4% 3
2 CNRS UA 6004 3 100% 0.4% 3
3 KONAGAI 1 100% 0.3% 2
4 UMR 7014 4 1 100% 0.3% 2
5 PHYS SPECT ELE ON 1 27% 0.4% 3
6 CNRS UPR 258 1 50% 0.1% 1
7 FESTKORPER HALBLEITERPHYS 1 50% 0.1% 1
8 POWDER TECHNOL MAT SCI 1 50% 0.1% 1
9 SIMULAT MODELISAT SCI MAT 1 50% 0.1% 1
10 MERB 1 29% 0.3% 2

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000167727 STRAINED SI//SIGE//STRAINED SILICON
2 0.0000156814 STRAINED SI1 XGEX SI QUANTUM WELLS//SI SIGE SUPERLATTICE//STRAINED SIGE SI
3 0.0000095744 ATOMIC LAYER DOPING//SI EPITAXIAL GROWTH//GERMANIUM SILICON COMPOUNDS
4 0.0000095410 ELECTRON BEAM ANNEALING//RAFTER//ION BEAM SYNTHESIS IBS
5 0.0000092598 3C SIC//FG NANOTECHNOL//HOLLOW VOID
6 0.0000084154 SCHOTTKY BARRIER SB//DOPANT SEGREGATION DS//SCHOTTKY BARRIER SB MOSFET
7 0.0000076531 GESN//L NESS//GERMANIUM TIN
8 0.0000074915 GERMANIUM CARBON//A SIGE//GE1 XCX
9 0.0000059039 GE ISLANDS//SIGE ISLANDS//HUT CLUSTERS
10 0.0000056626 SURFACTANT MEDIATED EPITAXY//BI NANOLINES//SI100 2X1 SB