Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
13030 | 801 | 17.8 | 72% |
Classes in level above (level 2) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | CARBON DOPING | Author keyword | 8 | 19% | 5% | 38 |
2 | CBR4 | Author keyword | 4 | 35% | 1% | 9 |
3 | C DOPED GAAS | Author keyword | 2 | 67% | 0% | 2 |
4 | HEAVILY CARBON DOPED GAAS | Author keyword | 2 | 67% | 0% | 2 |
5 | METALORGANIC VPE | Author keyword | 2 | 67% | 0% | 2 |
6 | CARBON TETRABROMIDE | Author keyword | 2 | 21% | 1% | 9 |
7 | MOMBE | Author keyword | 2 | 11% | 2% | 13 |
8 | C DOPING | Author keyword | 1 | 21% | 1% | 6 |
9 | BERYLLIUM DIFFUSION | Author keyword | 1 | 50% | 0% | 2 |
10 | CARBON DOPED GAAS | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CARBON DOPING | 8 | 19% | 5% | 38 | Search CARBON+DOPING | Search CARBON+DOPING |
2 | CBR4 | 4 | 35% | 1% | 9 | Search CBR4 | Search CBR4 |
3 | C DOPED GAAS | 2 | 67% | 0% | 2 | Search C+DOPED+GAAS | Search C+DOPED+GAAS |
4 | HEAVILY CARBON DOPED GAAS | 2 | 67% | 0% | 2 | Search HEAVILY+CARBON+DOPED+GAAS | Search HEAVILY+CARBON+DOPED+GAAS |
5 | METALORGANIC VPE | 2 | 67% | 0% | 2 | Search METALORGANIC+VPE | Search METALORGANIC+VPE |
6 | CARBON TETRABROMIDE | 2 | 21% | 1% | 9 | Search CARBON+TETRABROMIDE | Search CARBON+TETRABROMIDE |
7 | MOMBE | 2 | 11% | 2% | 13 | Search MOMBE | Search MOMBE |
8 | C DOPING | 1 | 21% | 1% | 6 | Search C+DOPING | Search C+DOPING |
9 | BERYLLIUM DIFFUSION | 1 | 50% | 0% | 2 | Search BERYLLIUM+DIFFUSION | Search BERYLLIUM+DIFFUSION |
10 | CARBON DOPED GAAS | 1 | 100% | 0% | 2 | Search CARBON+DOPED+GAAS | Search CARBON+DOPED+GAAS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | P TYPE GAAS | 47 | 36% | 13% | 104 |
2 | CARBON DOPED GAAS | 18 | 65% | 2% | 17 |
3 | CURRENT INDUCED DEGRADATION | 13 | 80% | 1% | 8 |
4 | MOMBE | 13 | 25% | 5% | 44 |
5 | DOPED GAAS | 11 | 16% | 8% | 63 |
6 | GRAPHITE FILAMENT | 9 | 83% | 1% | 5 |
7 | TETRABROMIDE | 8 | 45% | 2% | 13 |
8 | CARBON HYDROGEN PAIRS | 6 | 71% | 1% | 5 |
9 | DOPED BASE | 6 | 50% | 1% | 9 |
10 | BASE LAYER | 6 | 100% | 0% | 4 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
A comparative study of GaAs- and InP-based HBT growth by means of LP-MOVPE using conventional and non gaseous sources | 2000 | 12 | 61 | 41% |
Carbon-impurity incorporation during the growth of epitaxial group Ill-V materials | 1996 | 8 | 103 | 53% |
Structures, energetics and electronic properties of complex III-V semiconductor systems | 2000 | 31 | 89 | 18% |
Reliability characteristics of GaAs and InP-based heterojunction bipolar transistors | 1999 | 3 | 7 | 57% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FEMTON | 1 | 100% | 0.2% | 2 |
2 | LIGHTING MODULE DEV | 1 | 33% | 0.4% | 3 |
3 | CPD SEMICOND MICROELECT | 1 | 50% | 0.1% | 1 |
4 | CEMD | 1 | 25% | 0.2% | 2 |
5 | ARCHITECTURE ENVIRONM LIFE SCI | 1 | 22% | 0.2% | 2 |
6 | ENGN OPTOELECT DEVICE | 0 | 33% | 0.1% | 1 |
7 | UMR 5818IXL | 0 | 33% | 0.1% | 1 |
8 | ESTUDOS TELECOMUN | 0 | 18% | 0.2% | 2 |
9 | UNITE RECH HETEROEPITAXIE PLICAT | 0 | 18% | 0.2% | 2 |
10 | DIPARTIMENTO INFORMAZ | 0 | 25% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000232954 | HETEROJUNCTION BIPOLAR TRANSISTORS//HETEROJUNCTION BIPOLAR TRANSISTOR//HBT |
2 | 0.0000221170 | TRIMETHYLINDIUM//CHEMICAL BEAM EPITAXY CBE//MOLECULAR LAYER EPITAXY |
3 | 0.0000123109 | TRANSISTOR LASER//TRANSISTOR LASER TL//MICRONANOSYST TECHNOL |
4 | 0.0000097523 | OVAL DEFECTS//SEEIE//GA AS BI SOLUTION |
5 | 0.0000092185 | QUANTUM WELL INTERMIXING//QUANTUM WELL INTERDIFFUSION//IMPURITY FREE DISORDERING |
6 | 0.0000084198 | HYDROGEN IN SILICON//MULTIVACANCY//HYDROGEN IN SI |
7 | 0.0000083539 | LATERAL P N JUNCTION//411A GAAS SUBSTRATES//411A |
8 | 0.0000080981 | MEV ION IMPLANTATION//ACTIVATION EFFICIENCY//COLD IMPLANTS |
9 | 0.0000070456 | PHOTON RECYCLING//SEMICONDUCTOR SCINTILLATORS//FSF |
10 | 0.0000068783 | DELTA DOPING//SELF CONSISTENTLY//DELTA DOPED QUANTUM WELLS |