Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
1255 | 2659 | 16.6 | 56% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
967 | 10249 | OPTICS AND LASERS IN ENGINEERING//DIGITAL IMAGE CORRELATION//FRINGE ANALYSIS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | PL COMP MECH | Address | 69 | 65% | 2% | 66 |
2 | SPECKLE INTERFEROMETRY | Author keyword | 36 | 27% | 4% | 116 |
3 | SHEAROGRAPHY | Author keyword | 34 | 32% | 3% | 88 |
4 | ELECTRONIC SPECKLE PATTERN INTERFEROMETRY | Author keyword | 29 | 35% | 3% | 68 |
5 | FRINGE ANALYSIS | Author keyword | 20 | 22% | 3% | 81 |
6 | ESPI | Author keyword | 17 | 22% | 3% | 69 |
7 | PHASE SHIFTING INTERFEROMETRY | Author keyword | 17 | 23% | 2% | 64 |
8 | HOLOGRAPHIC VIBRATION ANALYSIS | Author keyword | 17 | 100% | 0% | 8 |
9 | PHASE SHIFTING | Author keyword | 15 | 14% | 4% | 103 |
10 | DIGITAL SPECKLE PATTERN INTERFEROMETRY | Author keyword | 15 | 35% | 1% | 34 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ESPI | 81 | 59% | 3% | 90 |
2 | SPECKLE PATTERN INTERFEROMETRY | 73 | 38% | 6% | 154 |
3 | SELF CALIBRATING ALGORITHM | 49 | 94% | 1% | 17 |
4 | PATTERN INTERFEROMETRY | 44 | 48% | 3% | 68 |
5 | FRINGE PATTERN ANALYSIS | 35 | 30% | 4% | 98 |
6 | FOURIER TRANSFORM METHOD | 34 | 29% | 4% | 100 |
7 | SHEAROGRAPHY | 34 | 43% | 2% | 60 |
8 | SHIFTING INTERFEROMETRY | 28 | 37% | 2% | 61 |
9 | TV HOLOGRAPHY | 19 | 39% | 1% | 39 |
10 | DIGITAL SHEAROGRAPHY | 19 | 60% | 1% | 21 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Invited Review Article: Measurement uncertainty of linear phase-stepping algorithms | 2011 | 21 | 67 | 96% |
Shearography technology and applications: a review | 2010 | 27 | 89 | 81% |
Shearography: An optical measurement technique and applications | 2005 | 58 | 12 | 83% |
Two-frame phase-shifting interferometry for retrieval of smooth surface and its displacements | 2011 | 12 | 26 | 77% |
A systematic approach to TV holography | 2000 | 50 | 152 | 85% |
Review of Electronic Speckle Pattern Interferometry (ESPI) for Three Dimensional Displacement Measurement | 2014 | 4 | 32 | 53% |
Automated fringe pattern analysis in experimental mechanics: a review | 1998 | 64 | 82 | 59% |
Fringe analysis | 2000 | 48 | 46 | 67% |
Phase-evaluation methods in whole-field optical measurement techniques | 1999 | 50 | 130 | 72% |
Review of fringe pattern phase recovery using the 1-D and 2-D continuous wavelet transforms | 2012 | 7 | 40 | 53% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PL COMP MECH | 69 | 65% | 2.5% | 66 |
2 | MECH PROD SCI ENGN | 9 | 83% | 0.2% | 5 |
3 | PL OPT METROL | 6 | 48% | 0.4% | 10 |
4 | OPT FIS | 6 | 80% | 0.2% | 4 |
5 | PRECISE RUMENT OPT ELECT ENGN | 4 | 67% | 0.2% | 4 |
6 | CARACTERISAT COMPOSANTS ELECT | 4 | 75% | 0.1% | 3 |
7 | DELHI LASER PLICAT HOLOG | 4 | 75% | 0.1% | 3 |
8 | PHYSICOCHEM SUR ES INTER ES SKIKDA | 4 | 75% | 0.1% | 3 |
9 | PHYS PL OPT | 3 | 35% | 0.3% | 8 |
10 | MICROMECH PHOTON | 3 | 13% | 0.9% | 24 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000163900 | SPECKLE PHOTOGRAPHY//OPTIMO//YOUNG FRINGES |
2 | 0.0000151081 | MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//NANO MOIRE |
3 | 0.0000150445 | STRUCTURED LIGHT//FRINGE PROJECTION//FOURIER TRANSFORM PROFILOMETRY FTP |
4 | 0.0000108371 | SPACE OPT//RADIAL SHEARING//SURFACE PROFILOMETER |
5 | 0.0000107729 | WHITE LIGHT INTERFEROMETRY//COMMUNITY TABUK//PRECIS MECH CONTROL |
6 | 0.0000104932 | COLLIMATION TESTING//OPTICAL TESTING INSTRUMENTS//OPT LICADA |
7 | 0.0000104148 | ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP |
8 | 0.0000094722 | DIGITAL HOLOGRAPHY//QUANTITAT LIGHT IMAGING//DIGITAL HOLOGRAPHIC MICROSCOPY |
9 | 0.0000081703 | INFORMAT PHYS ENGN//MOIRE DEFLECTOMETRY//SANDWICH HOLOGRAPHY |
10 | 0.0000071969 | HOLE DRILLING//HOLE DRILLING METHOD//CRACK COMPLIANCE |