Class information for:
Level 1: NONIONIZING ENERGY LOSS NIEL//DISPLACEMENT DAMAGE DOSE//NONIONIZING ENERGY LOSS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
12522 837 18.0 52%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
913 10550 EL2//NONIONIZING ENERGY LOSS NIEL//DX CENTERS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 NONIONIZING ENERGY LOSS NIEL Author keyword 26 87% 2% 13
2 DISPLACEMENT DAMAGE DOSE Author keyword 19 80% 1% 12
3 NONIONIZING ENERGY LOSS Author keyword 19 76% 2% 13
4 DISPLACEMENT DAMAGE Author keyword 19 30% 6% 52
5 PINNED PHOTODIODE PPD Author keyword 18 89% 1% 8
6 MONOLITHIC ACTIVE PIXEL SENSOR MAPS Author keyword 17 100% 1% 8
7 GAAS GE SOLAR CELLS Author keyword 13 80% 1% 8
8 NIEL Author keyword 9 43% 2% 16
9 DISPLACEMENT DAMAGE DOSE DDD Author keyword 8 100% 1% 5
10 DARK CURRENT DISTRIBUTION Author keyword 6 80% 0% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 NONIONIZING ENERGY LOSS NIEL 26 87% 2% 13 Search NONIONIZING+ENERGY+LOSS+NIEL Search NONIONIZING+ENERGY+LOSS+NIEL
2 DISPLACEMENT DAMAGE DOSE 19 80% 1% 12 Search DISPLACEMENT+DAMAGE+DOSE Search DISPLACEMENT+DAMAGE+DOSE
3 NONIONIZING ENERGY LOSS 19 76% 2% 13 Search NONIONIZING+ENERGY+LOSS Search NONIONIZING+ENERGY+LOSS
4 DISPLACEMENT DAMAGE 19 30% 6% 52 Search DISPLACEMENT+DAMAGE Search DISPLACEMENT+DAMAGE
5 PINNED PHOTODIODE PPD 18 89% 1% 8 Search PINNED+PHOTODIODE+PPD Search PINNED+PHOTODIODE+PPD
6 MONOLITHIC ACTIVE PIXEL SENSOR MAPS 17 100% 1% 8 Search MONOLITHIC+ACTIVE+PIXEL+SENSOR+MAPS Search MONOLITHIC+ACTIVE+PIXEL+SENSOR+MAPS
7 GAAS GE SOLAR CELLS 13 80% 1% 8 Search GAAS+GE+SOLAR+CELLS Search GAAS+GE+SOLAR+CELLS
8 NIEL 9 43% 2% 16 Search NIEL Search NIEL
9 DISPLACEMENT DAMAGE DOSE DDD 8 100% 1% 5 Search DISPLACEMENT+DAMAGE+DOSE+DDD Search DISPLACEMENT+DAMAGE+DOSE+DDD
10 DARK CURRENT DISTRIBUTION 6 80% 0% 4 Search DARK+CURRENT+DISTRIBUTION Search DARK+CURRENT+DISTRIBUTION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INDUCED DARK CURRENT 27 92% 1% 11
2 DISPLACEMENT DAMAGE 20 30% 7% 56
3 INDUCED DISPLACEMENT DAMAGE 18 48% 3% 28
4 SPACE SOLAR CELLS 18 89% 1% 8
5 MICROVOLUMES 15 67% 2% 14
6 SILICON DEPLETION REGIONS 14 100% 1% 7
7 DEEP SUBMICRON TECHNOLOGY 11 100% 1% 6
8 LOSS NIEL 11 100% 1% 6
9 PROTON IRRADIATED CCDS 11 69% 1% 9
10 ANOMALOUS DEGRADATION 10 73% 1% 8

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Review of displacement damage effects in silicon devices 2003 192 51 69%
Radiation effects on photonic imagers - A historical perspective 2003 38 61 64%
High-Definition Television System Onboard Lunar Explorer Kaguya (SELENE) and Imaging of the Moon and the Earth 2010 1 5 40%
SEMICONDUCTORS FOR SOLAR-CELL APPLICATIONS 1991 19 107 2%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IMAGE SENSOR TEAM 4 67% 0.5% 4
2 PROGRAM ELECT BEAM TECHNOL 4 75% 0.4% 3
3 WOMEN SCI CULTURE 3 100% 0.4% 3
4 ACHENG 3 60% 0.4% 3
5 ISAE 3 10% 3.1% 26
6 DPTO ELE OTECNIA 2 67% 0.2% 2
7 INFRARED RADIAT EFFECTS 2 67% 0.2% 2
8 STATE INTENSE PULSED IRRADIAT SIMULAT E 2 67% 0.2% 2
9 METALL SEMICONDUCTING MAT 2 50% 0.4% 3
10 SEMICOND DEVICES PHYS 2 40% 0.5% 4

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000142657 MAGNET SENSOR//GROUP III V EXCEPT NITRIDES//COPPER VACANCY COMPLEX
2 0.0000115898 LIFETIME CONTROL//SEMI INSULATING MATERIALS//POWER DIODES
3 0.0000114862 MESH EXPERIMENT//CHARGE CLOUD SHAPE//X RAY EVENT
4 0.0000094808 FE DOPED INP//PHOSPHORUS VAPOR PRESSURE//WAFER ANNEALING
5 0.0000091349 IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE//P N JUNCTION LEAKAGE
6 0.0000086279 OXIDE TRAPPED CHARGE//ELDRS//TOTAL IONIZING DOSE
7 0.0000072491 OPTICAL FIBER RADIATION EFFECTS//RADIATION INDUCED ATTENUATION//RADIATION INDUCED ATTENUATION RIA
8 0.0000072440 IN082GA018AS//SHORT WAVELENGTH INFRARED//INFRARED IMAGING MAT DETECTORS
9 0.0000071004 MONOLITHIC ACTIVE PIXEL SENSORS//MONOLITHIC PIXEL SENSOR//VERTEX DETECTOR
10 0.0000070735 LUMINESCENT COUPLING//ENERGIA SOLAR//LUMINESCENCE COUPLING