Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
12372 | 846 | 22.2 | 76% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
751 | 11810 | ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | CHAIR QUANTUM RADIO PHYS | Address | 4 | 75% | 0% | 3 |
2 | X RAY EXCITED CURRENT | Author keyword | 4 | 75% | 0% | 3 |
3 | SHERMAN FAIRCHILD SOLID STATE STUDIES | Address | 3 | 50% | 0% | 4 |
4 | COE 21ST | Address | 2 | 67% | 0% | 2 |
5 | SEMICOND INTER E | Address | 2 | 67% | 0% | 2 |
6 | TIP INDUCED BAND BENDING | Author keyword | 2 | 67% | 0% | 2 |
7 | COBRA INTERUNIV | Address | 2 | 15% | 2% | 13 |
8 | GAAS110 SURFACE | Author keyword | 2 | 43% | 0% | 3 |
9 | HYDROGEN TERMINATED SI111 1 X 1 | Author keyword | 1 | 100% | 0% | 2 |
10 | SMART TIPS | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | GAAS110 SURFACE | 29 | 32% | 9% | 75 |
2 | INP110 SURFACES | 19 | 61% | 2% | 20 |
3 | GAP110 SURFACES | 17 | 72% | 2% | 13 |
4 | ARSENIC ANTISITE DEFECTS | 15 | 73% | 1% | 11 |
5 | MULTIQUANTUM WELL STRUCTURE | 10 | 73% | 1% | 8 |
6 | ULTRAFAST TIME RESOLUTION | 9 | 83% | 1% | 5 |
7 | ANION VACANCIES | 7 | 43% | 2% | 13 |
8 | COVERED GAAS | 6 | 80% | 0% | 4 |
9 | PN JUNCTIONS | 6 | 35% | 2% | 15 |
10 | SINGLE DOPANTS | 5 | 55% | 1% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Bistable Si dopants in the GaAs (110) surface | 2015 | 2 | 30 | 57% |
Photoassisted scanning tunneling microscopy | 2002 | 115 | 296 | 53% |
Nano-scale properties of defects in compound semiconductor surfaces | 1999 | 118 | 245 | 28% |
Single dopants in semiconductors | 2011 | 134 | 108 | 13% |
Atomic structure of point defects in compound semiconductor surfaces | 2001 | 26 | 164 | 45% |
CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY OF ILL-V SEMICONDUCTOR STRUCTURES | 1994 | 60 | 39 | 72% |
Optical pump-probe scanning tunneling microscopy for probing ultrafast dynamics on the nanoscale | 2013 | 2 | 38 | 61% |
Development of femtosecond time-resolved scanning tunneling microscopy for nanoscale science and technology | 2005 | 9 | 17 | 59% |
Cross-sectional scanning tunneling microscopy | 1997 | 25 | 121 | 37% |
Ultrafast scanning tunneling microscopy: Principles and applications | 2004 | 1 | 49 | 76% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CHAIR QUANTUM RADIO PHYS | 4 | 75% | 0.4% | 3 |
2 | SHERMAN FAIRCHILD SOLID STATE STUDIES | 3 | 50% | 0.5% | 4 |
3 | COE 21ST | 2 | 67% | 0.2% | 2 |
4 | SEMICOND INTER E | 2 | 67% | 0.2% | 2 |
5 | COBRA INTERUNIV | 2 | 15% | 1.5% | 13 |
6 | COBRA INTER UNIV | 1 | 17% | 0.8% | 7 |
7 | COE 21 | 1 | 27% | 0.4% | 3 |
8 | PL PHYS21ST CENTURY COE | 1 | 50% | 0.1% | 1 |
9 | ELECT CUANTICA | 0 | 33% | 0.1% | 1 |
10 | TU CLAUSTHAL | 0 | 33% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000182444 | LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//I S CHARACTERISTICS |
2 | 0.0000117785 | TUNNELING ACOUSTIC MICROSCOPY//SAW IMAGING//MICRODISPLACEMENT MEASUREMENT |
3 | 0.0000106335 | MATH PHYS COMP AIDED SCI//LIGHT EMISSION SPECTROSCOPY//TUNNELING ELECTRON |
4 | 0.0000105044 | SPIN POLARIZED SCANNING TUNNELING MICROSCOPY//ILSE KATZ NANOMETER SCALE SCI TECHNOL//MICROSTRUCT ADV |
5 | 0.0000103161 | SCANNING CAPACITANCE MICROSCOPY//KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY |
6 | 0.0000096592 | PHOTONIC NANOJET//PHOTONIC JET//FB PHYS TECH |
7 | 0.0000079772 | WEBSTER//ADIABATIC BOND CHARGE MODEL//INAS110 |
8 | 0.0000077654 | SI111 2X1//CROSS SECTIONAL STM//IV PHYS |
9 | 0.0000067530 | WARM CARRIER DEVICE//INFRARED ANTENNA//ANTENNA COUPLED DETECTORS |
10 | 0.0000065251 | PHOTOFIELD EMISSION//ELECTRON PLASMON INTERACTION//PHOTOFIELD EMISSION CURRENT |