Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
12357 | 848 | 21.3 | 69% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1059 | 9522 | THERMAL LENS SPECTROMETRY//THERMAL DIFFUSIVITY//PHOTOTHERMAL OPTOELECT DIAGNOST S |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SCANNING THERMAL MICROSCOPY | Author keyword | 60 | 64% | 7% | 59 |
2 | MICRO THERMAL ANALYSIS | Author keyword | 27 | 72% | 2% | 21 |
3 | SCANNING THERMAL MICROSCOPE | Author keyword | 10 | 73% | 1% | 8 |
4 | SCANNING THERMAL MICROSCOPY STHM | Author keyword | 7 | 64% | 1% | 7 |
5 | MULTISCALE THERMOPHYS G PI CATHERM | Address | 6 | 80% | 0% | 4 |
6 | CLIO CHIM PHYS | Address | 6 | 100% | 0% | 4 |
7 | MICROTHERMAL ANALYSIS | Author keyword | 5 | 41% | 1% | 9 |
8 | BILTON | Address | 4 | 75% | 0% | 3 |
9 | SCANNING PROBE THERMAL MICROSCOPY | Author keyword | 4 | 75% | 0% | 3 |
10 | ENERGET OPT | Address | 4 | 27% | 2% | 13 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SCANNING THERMAL MICROSCOPY | 27 | 49% | 5% | 39 |
2 | CANTILEVER PROBES | 20 | 66% | 2% | 19 |
3 | MICROTHERMAL ANALYSIS | 17 | 72% | 2% | 13 |
4 | PROPERTY IMAGING TECHNIQUE | 13 | 80% | 1% | 8 |
5 | STHM | 13 | 80% | 1% | 8 |
6 | JOULE EXPANSION MICROSCOPY | 13 | 71% | 1% | 10 |
7 | THERMOCHEMICAL NANOLITHOGRAPHY | 12 | 86% | 1% | 6 |
8 | 2 OMEGA METHOD | 11 | 78% | 1% | 7 |
9 | SILICON MICROCANTILEVER HEATERS | 9 | 83% | 1% | 5 |
10 | STIFFNESS SILICON CANTILEVERS | 8 | 70% | 1% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Micro-thermal analysis: techniques and applications | 2001 | 115 | 64 | 75% |
Scanning thermal microscopy | 1999 | 247 | 53 | 64% |
CCD-based thermoreflectance microscopy: principles and applications | 2009 | 33 | 47 | 47% |
AFM-IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization | 2012 | 25 | 46 | 30% |
Thermal scanning probe microscopy in the development of pharmaceuticals | 2012 | 5 | 41 | 59% |
Scanning thermal microscopy | 2007 | 15 | 68 | 62% |
Recent developments in micro and nanoscale thermometry | 2001 | 20 | 17 | 65% |
Pharmaceutical applications of micro-thermal analysis | 2002 | 17 | 21 | 76% |
Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range | 2008 | 17 | 41 | 24% |
Scanning thermal microscopy: A review | 2015 | 0 | 172 | 61% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MULTISCALE THERMOPHYS G PI CATHERM | 6 | 80% | 0.5% | 4 |
2 | CLIO CHIM PHYS | 6 | 100% | 0.5% | 4 |
3 | BILTON | 4 | 75% | 0.4% | 3 |
4 | ENERGET OPT | 4 | 27% | 1.5% | 13 |
5 | INTEGRATED CIRCUIT FAILURE ANAL RELIABIL CI | 2 | 67% | 0.2% | 2 |
6 | LEHRSTUHL ELEKTR | 2 | 67% | 0.2% | 2 |
7 | UPR A005 | 2 | 67% | 0.2% | 2 |
8 | UNITE THERM ANALYSE PHYS | 1 | 38% | 0.4% | 3 |
9 | EQUIPE RUMENTATCNRSUPR A0005 | 1 | 100% | 0.2% | 2 |
10 | UNITE THERM ANAL PHYS | 1 | 17% | 0.8% | 7 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000134000 | AC CALORIMETRIC METHOD//TEMPERATURE WAVE ANALYSIS//THREE OMEGA METHOD |
2 | 0.0000084554 | THERMOGRAPHIC PHOSPHORS//THERMOGRAPHIC PHOSPHOR//PHOSPHOR THERMOMETRY |
3 | 0.0000075240 | PHOTOCARRIER RADIOMETRY//CADIFT//PHOTOTHERMAL OPTOELECT DIAGNOST S |
4 | 0.0000069831 | MICROCANTILEVER//MICROCANTILEVERS//RESONANT CANTILEVER |
5 | 0.0000068980 | SENSORS SUR E TECHNOL PARTNERSHIP//SMART MAT MEMS//THIN FILM THERMOCOUPLES |
6 | 0.0000065297 | LM FFM//OPT MECHATRON//MAGNETIC HARD DISK |
7 | 0.0000063475 | DIP PEN NANOLITHOGRAPHY//POLYMER PEN LITHOGRAPHY//DIP PEN NANOLITHOGRAPHY DPN |
8 | 0.0000056458 | TIP CHARACTERIZATION//TIP CHARACTERIZER//SIDEWALL MEASUREMENT |
9 | 0.0000056070 | NEGATIVE IMAGINARY SYSTEMS//PRANDTL ISHLINSKII MODEL//NANOPOSITIONING |
10 | 0.0000052741 | PHONON TRANSPORT//THERMAL BOUNDARY CONDUCTANCE//E POKATILOV PHYS ENGN NANOMAT |