Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 12265 | 854 | 21.1 | 56% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | ELECTRON HOLOGRAPHY | Author keyword | 127 | 51% | 21% | 177 |
| 2 | OFF AXIS ELECTRON HOLOGRAPHY | Author keyword | 25 | 62% | 3% | 26 |
| 3 | TRIEBENBERG | Address | 21 | 48% | 4% | 32 |
| 4 | LORENTZ MICROSCOPY | Author keyword | 17 | 31% | 5% | 45 |
| 5 | MEAN INNER POTENTIAL | Author keyword | 12 | 63% | 1% | 12 |
| 6 | ELECTRON BIPRISM | Author keyword | 12 | 86% | 1% | 6 |
| 7 | STRUCT PHYS | Address | 6 | 18% | 4% | 30 |
| 8 | ELECTRON OPTICAL PHASE SHIFT | Author keyword | 6 | 100% | 0% | 4 |
| 9 | FRESNEL FRINGES | Author keyword | 5 | 60% | 1% | 6 |
| 10 | MENG | Address | 4 | 75% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | VORTEX LATTICES | 8 | 20% | 4% | 35 |
| 2 | LORENTZ MICROSCOPY | 8 | 30% | 3% | 22 |
| 3 | ELECTRON HOLOGRAPHY | 7 | 17% | 4% | 35 |
| 4 | BIPRISM | 6 | 50% | 1% | 9 |
| 5 | MAGNETIC DOMAIN STRUCTURES | 4 | 41% | 1% | 7 |
| 6 | DIFFRACTED BEAM INTERFEROMETRY HOLOGRAPHY | 3 | 100% | 0% | 3 |
| 7 | HOLOGRAPHIC CONTOUR MAPS | 3 | 100% | 0% | 3 |
| 8 | INNEREN POTENTIALS | 3 | 100% | 0% | 3 |
| 9 | EMISSION ELECTRON MICROSCOPE | 3 | 60% | 0% | 3 |
| 10 | DIFFRACTED BEAM HOLOGRAPHY | 2 | 67% | 0% | 2 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Electron holography - basics and applications | 2008 | 69 | 56 | 66% |
| Electron holography: Phase imaging with nanometer resolution | 2007 | 51 | 104 | 60% |
| An introduction to off-axis electron holography | 2001 | 56 | 48 | 69% |
| Electron holographic tomography | 2013 | 6 | 42 | 62% |
| Electron holography: Applications to materials questions | 2007 | 43 | 33 | 36% |
| Tutorial on off-axis electron holography | 2002 | 39 | 25 | 60% |
| ELECTRON-HOLOGRAPHIC INTERFERENCE MICROSCOPY | 1992 | 87 | 42 | 62% |
| Development of advanced electron holographic techniques and application to industrial materials and devices | 2013 | 1 | 27 | 67% |
| Electron holography of long-range electrostatic fields | 1998 | 10 | 49 | 80% |
| Electron holography of long-range electrostatic fields | 2002 | 12 | 66 | 80% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | TRIEBENBERG | 21 | 48% | 3.7% | 32 |
| 2 | STRUCT PHYS | 6 | 18% | 3.5% | 30 |
| 3 | MENG | 4 | 75% | 0.4% | 3 |
| 4 | SEMICOND FAILURE ANAL | 4 | 75% | 0.4% | 3 |
| 5 | TRIEBENBERG OR | 1 | 100% | 0.2% | 2 |
| 6 | CAMTEC | 1 | 30% | 0.4% | 3 |
| 7 | ADV MAT RELATED TECHNOL | 1 | 23% | 0.4% | 3 |
| 8 | LECCE UNIT | 1 | 23% | 0.4% | 3 |
| 9 | ELEKTRON MIKROSKOPIE | 1 | 50% | 0.1% | 1 |
| 10 | LERHSTUHL 7 | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000157011 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
| 2 | 0.0000148067 | SINGLE ATOM TIP//SUR E MODIFICAT//SINGLE ATOM TIPS |
| 3 | 0.0000097472 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
| 4 | 0.0000089460 | ELECTRON TOMOGRAPHY//TILT SERIES//MISSING WEDGE |
| 5 | 0.0000087015 | MAGNETIC FORCE MICROSCOPY//TYPE I MAGNETIC CONTRAST//MAGNETIC FORCE MICROSCOPY TIP |
| 6 | 0.0000063759 | FERMI WALKER REFERENCE FRAME//NONINERTIAL EFFECTS//HARD WALL CONFINING POTENTIAL |
| 7 | 0.0000060833 | CONVERGENT BEAM ELECTRON DIFFRACTION//PRECESSION ELECTRON DIFFRACTION//CBED |
| 8 | 0.0000054521 | MAGNETIC VORTEX//CREAT INITIAT SPIN DYNAM SPIN WAVE//MICROMAGNETICS |
| 9 | 0.0000047645 | NEEL CAPS//BLOCH LINES//BLOCH DOMAIN WALL |
| 10 | 0.0000043572 | MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST |