Class information for:
Level 1: STANDARDLESS ANALYSIS//FU 160//TRITIUM ANALYSIS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
12151 864 22.2 35%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2051 4868 SCANNING//LAMACOP//BACKSCATTERED ELECTRONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 STANDARDLESS ANALYSIS Author keyword 6 41% 1% 11
2 FU 160 Address 6 100% 0% 4
3 TRITIUM ANALYSIS Author keyword 5 60% 1% 6
4 ELECTRON PROBE MICROANALYSIS Author keyword 5 11% 5% 42
5 QUANTITATIVE ELECTRON PROBE MICROANALYSIS Author keyword 5 63% 1% 5
6 ATOMIC FRACTION Author keyword 4 75% 0% 3
7 ELECTRON FRACTION Author keyword 4 75% 0% 3
8 FLUORESCENT YIELD Author keyword 4 75% 0% 3
9 MASS AVERAGING Author keyword 4 75% 0% 3
10 X RAY DEPTH DISTRIBUTION Author keyword 4 75% 0% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 STANDARDLESS ANALYSIS 6 41% 1% 11 Search STANDARDLESS+ANALYSIS Search STANDARDLESS+ANALYSIS
2 TRITIUM ANALYSIS 5 60% 1% 6 Search TRITIUM+ANALYSIS Search TRITIUM+ANALYSIS
3 ELECTRON PROBE MICROANALYSIS 5 11% 5% 42 Search ELECTRON+PROBE+MICROANALYSIS Search ELECTRON+PROBE+MICROANALYSIS
4 QUANTITATIVE ELECTRON PROBE MICROANALYSIS 5 63% 1% 5 Search QUANTITATIVE+ELECTRON+PROBE+MICROANALYSIS Search QUANTITATIVE+ELECTRON+PROBE+MICROANALYSIS
5 ATOMIC FRACTION 4 75% 0% 3 Search ATOMIC+FRACTION Search ATOMIC+FRACTION
6 ELECTRON FRACTION 4 75% 0% 3 Search ELECTRON+FRACTION Search ELECTRON+FRACTION
7 FLUORESCENT YIELD 4 75% 0% 3 Search FLUORESCENT+YIELD Search FLUORESCENT+YIELD
8 MASS AVERAGING 4 75% 0% 3 Search MASS+AVERAGING Search MASS+AVERAGING
9 X RAY DEPTH DISTRIBUTION 4 75% 0% 3 Search X+RAY+DEPTH+DISTRIBUTION Search X+RAY+DEPTH+DISTRIBUTION
10 QUANTITATIVE MICROANALYSIS 3 57% 0% 4 Search QUANTITATIVE+MICROANALYSIS Search QUANTITATIVE+MICROANALYSIS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 UNIVERSAL CORRECTION PROCEDURE 15 77% 1% 10
2 IMPROVED BIPARTITION MODEL 14 65% 2% 13
3 SYSTEMATIC DATABASE 13 80% 1% 8
4 ELECTRON PROBE MICROANALYSIS 13 20% 7% 57
5 PHIRHO Z APPROACH 9 83% 1% 5
6 POSITRON IMPACT 8 45% 2% 14
7 THIN FILM MEASUREMENTS 8 100% 1% 5
8 DEPTH DISTRIBUTION FUNCTIONS 7 67% 1% 6
9 PROBE MICROANALYSIS 6 22% 3% 24
10 65 MEV LINAC 6 100% 0% 4

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Calculations of inner-shell ionization by electron impact with the distorted-wave and plane-wave Born approximations 2008 38 57 67%
What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique? 2012 5 36 67%
Standardless quantification methods in electron probe microanalysis 2014 2 84 67%
Second generation of correction methods in electron probe x-ray microanalysis: Approximation models for emission depth distribution functions 2004 5 26 96%
THE INTERPRETATION OF X-RAY AND ELECTRON SIGNALS GENERATED IN THIN OR LAYERED TARGETS 1992 5 4 100%
CALCULATION OF DEPTH DISTRIBUTION-FUNCTIONS FOR CHARACTERISTIC X-RADIATION USING AN ELECTRON-SCATTERING MODEL .1. THEORY 1991 18 33 79%
Electron Impact Inner-Shell Ionization of Atoms 2011 1 65 55%
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) 2015 0 7 86%
RECENT PROGRESS IN ELECTRON-PROBE MICROANALYSIS 1993 21 45 49%
The prediction of thick target electron bremsstrahlung spectra in the 0.25-50 keV energy range 2008 11 33 36%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 FU 160 6 100% 0.5% 4
2 SGCSLMAC 3 50% 0.5% 4
3 FR 2035 2 67% 0.2% 2
4 FIS ECM 2 24% 0.9% 8
5 FIS ECM ICC 2 36% 0.5% 4
6 FIS SOLIDO 1 16% 0.9% 8
7 CCITUB 1 20% 0.6% 5
8 SOC CATALANA FIS 1 18% 0.5% 4
9 CALOR EMAG MITTELSPANNUNGSPROD 1 50% 0.1% 1
10 MET CHEM SECT 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000222257 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
2 0.0000158152 SCI COUNCIL SPECT//POLARIZATIONAL BREMSSTRAHLUNG//Z DEPENDENCE
3 0.0000154496 ENGN 36//MINIMUM MASS FRACTION//QUANTITATIVE X RAY MAPPING
4 0.0000134684 EXCITATION AUTOIONIZATION//ELECTRON IMPACT IONIZATION//ELECTRON IMPACT IONIZATION CROSS SECTIONS
5 0.0000090749 NUCL SCI S//FLUORESCENCE YIELDS//ECPSSR
6 0.0000087501 CADMIUM YELLOW//ELECTRON BACKSCATTERING COEFFICIENT//EYE CATARACTS
7 0.0000080783 LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS//INDIVIDUAL PARTICLE ANALYSIS//LOW Z PARTICLE EPMA
8 0.0000076413 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION
9 0.0000068848 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
10 0.0000068103 H IRRADIATION//UMR CNRS 7614//POLYMETHACRYLONITRILE