Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
12112 | 867 | 27.3 | 59% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
687 | 12408 | JOURNAL OF SYNCHROTRON RADIATION//DIFFRACTION ENHANCED IMAGING//PHASE RETRIEVAL |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | NEUTRON SPECULAR REFLECTION | Author keyword | 11 | 78% | 1% | 7 |
2 | MAGNETIC REFERENCE LAYER | Author keyword | 3 | 100% | 0% | 3 |
3 | PHASE PROBLEM | Author keyword | 3 | 19% | 1% | 13 |
4 | PHYS CHEM PHYS CHEM CONDENSED MATTER | Address | 3 | 60% | 0% | 3 |
5 | BINARY LIQUID ALLOYS | Author keyword | 2 | 67% | 0% | 2 |
6 | NEUTRON SPECULAR REFLECTIVITY | Author keyword | 2 | 67% | 0% | 2 |
7 | SURFACE PROFILES | Author keyword | 1 | 21% | 1% | 6 |
8 | OFF SPECULAR DIFFUSE SCATTERING | Author keyword | 1 | 100% | 0% | 2 |
9 | PHASELESS INVERSE SCATTERING | Author keyword | 1 | 100% | 0% | 2 |
10 | PREWETTING CRITICAL POINT | Author keyword | 1 | 100% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TRANSVERSE DENSITY DISTRIBUTIONS | 53 | 95% | 2% | 18 |
2 | SPECKLE HOLOGRAPHY | 37 | 100% | 2% | 14 |
3 | INHOMOGENEOUS LIQUID | 30 | 100% | 1% | 12 |
4 | BISMUTH GALLIUM | 27 | 92% | 1% | 11 |
5 | VAPOR INTERFACE | 18 | 19% | 10% | 89 |
6 | X RAY REFLECTIVITY | 17 | 12% | 15% | 131 |
7 | INPLANE STRUCTURE | 15 | 71% | 1% | 12 |
8 | CAPILLARY WAVES | 13 | 16% | 9% | 77 |
9 | SURROUNDING MEDIA | 10 | 63% | 1% | 10 |
10 | VAPOR INTERFACES | 10 | 58% | 1% | 11 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials | 2012 | 19 | 44 | 43% |
The structure of the surface of pure liquids | 2001 | 80 | 63 | 43% |
X-ray scattering: Liquid metal/vapor interfaces | 2011 | 4 | 37 | 76% |
Liquid-liquid interfaces: studied by X-ray and neutron scattering | 2002 | 84 | 36 | 22% |
Interfacial phase transitions in conducting fluids | 2008 | 10 | 56 | 48% |
Molecular ordering and phase behavior of surfactants at water-oil interfaces as probed by X-ray surface scattering | 2008 | 23 | 65 | 26% |
Review of the highlights of X-ray studies of liquid metal surfaces | 2014 | 0 | 30 | 80% |
THEORETICAL FOUNDATION OF X-RAY AND NEUTRON REFLECTOMETRY | 1995 | 123 | 71 | 37% |
Analysis methods in neutron and X-ray reflectometry | 1999 | 20 | 45 | 58% |
THE PHASE RETRIEVAL PROBLEM | 1995 | 52 | 12 | 58% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PHYS CHEM PHYS CHEM CONDENSED MATTER | 3 | 60% | 0.3% | 3 |
2 | ATOM OSTERR UNIV | 1 | 50% | 0.1% | 1 |
3 | COMPLEX MAT CONSORTIUM CAT | 1 | 50% | 0.1% | 1 |
4 | FIS TEOR MAT | 1 | 50% | 0.1% | 1 |
5 | INTENSE PULSED NEUTRON SOURCE 360 | 1 | 50% | 0.1% | 1 |
6 | NEUTRON EARCH | 1 | 50% | 0.1% | 1 |
7 | PHYS CHIM MAT PHYS | 1 | 50% | 0.1% | 1 |
8 | PHYS DEAS | 1 | 50% | 0.1% | 1 |
9 | PHYS TAMA KU | 1 | 50% | 0.1% | 1 |
10 | UNITE MIXTE ST GOBAIN | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000259078 | ANALYT INORGAN PL CHEM//NEUTRON REFLECTION//SURFACTANT MONOLAYER |
2 | 0.0000140106 | X RAY PHOTON CORRELATION SPECTROSCOPY//XPCS//X RAY PHOTON CORRELATION SPECTROSCOPY XPCS |
3 | 0.0000130530 | LEHRSTUHL FUNKT MAT//BK MOL SCI//LS E13 |
4 | 0.0000112126 | CRITICAL CASIMIR FORCE//CRITICAL WETTING//CONFINED MAGNETIC FILMS |
5 | 0.0000103324 | EUV LITHOG//SOFT XRAY MICROSCOPY//XRAY OPT |
6 | 0.0000080061 | RIPPLON//SURFACE DILATIONAL MODULI//RIPPLON SPECTROSCOPY |
7 | 0.0000079594 | X RAY SURFACE DIFFRACTION//MHATT//BM25 SPLINE |
8 | 0.0000074819 | LARMOR PRECESSION//POLARIZED NEUTRONS//NEUTRON SPIN ECHO |
9 | 0.0000070632 | BREWSTER ANGLE MICROSCOPY//LANGMUIR MONOLAYERS//MED PHYSICOCHEM |
10 | 0.0000066914 | GELS DRYING//SURFACTANTS MIXTURE//PMN PNN PT |