Class information for:
Level 1: LIDFT//ADC TESTING//INTERPOLATED DFT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
11994 875 15.3 41%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1991 5062 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT//METROLOGIA//AVOGADRO CONSTANT

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 LIDFT Author keyword 14 100% 1% 7
2 ADC TESTING Author keyword 12 37% 3% 25
3 INTERPOLATED DFT Author keyword 12 59% 1% 13
4 SINE FITTING ALGORITHMS Author keyword 11 100% 1% 6
5 NONCOHERENT SAMPLING Author keyword 11 69% 1% 9
6 SPECTRAL LEAKAGE Author keyword 9 32% 3% 23
7 INTERPOLATED FFT Author keyword 7 57% 1% 8
8 EFFECTIVE NUMBER OF BITS ENOB Author keyword 6 53% 1% 8
9 HISTOGRAM TEST Author keyword 6 53% 1% 8
10 FOUR PARAMETER SINE WAVE Author keyword 6 100% 0% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 LIDFT 14 100% 1% 7 Search LIDFT Search LIDFT
2 ADC TESTING 12 37% 3% 25 Search ADC+TESTING Search ADC+TESTING
3 INTERPOLATED DFT 12 59% 1% 13 Search INTERPOLATED+DFT Search INTERPOLATED+DFT
4 SINE FITTING ALGORITHMS 11 100% 1% 6 Search SINE+FITTING+ALGORITHMS Search SINE+FITTING+ALGORITHMS
5 NONCOHERENT SAMPLING 11 69% 1% 9 Search NONCOHERENT+SAMPLING Search NONCOHERENT+SAMPLING
6 SPECTRAL LEAKAGE 9 32% 3% 23 Search SPECTRAL+LEAKAGE Search SPECTRAL+LEAKAGE
7 INTERPOLATED FFT 7 57% 1% 8 Search INTERPOLATED+FFT Search INTERPOLATED+FFT
8 EFFECTIVE NUMBER OF BITS ENOB 6 53% 1% 8 Search EFFECTIVE+NUMBER+OF+BITS+ENOB Search EFFECTIVE+NUMBER+OF+BITS+ENOB
9 HISTOGRAM TEST 6 53% 1% 8 Search HISTOGRAM+TEST Search HISTOGRAM+TEST
10 FOUR PARAMETER SINE WAVE 6 100% 0% 4 Search FOUR+PARAMETER+SINE+WAVE Search FOUR+PARAMETER+SINE+WAVE

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INTERPOLATION ALGORITHMS 26 61% 3% 28
2 MULTIFREQUENCY SIGNAL 25 75% 2% 18
3 WAVEFORM RECORDERS 15 88% 1% 7
4 LIDFT METHOD 12 86% 1% 6
5 MULTIFREQUENCY SIGNAL ANALYSIS 11 100% 1% 6
6 MULTIPOINT INTERPOLATED DFT 11 69% 1% 9
7 A D CONVERTERS 9 23% 4% 35
8 HISTOGRAM TEST 8 70% 1% 7
9 SINE WAVE 8 42% 2% 14
10 FLAT TOP WINDOWS 6 80% 0% 4

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
An overview of different signal sources for histogram based testing of ADCs 2010 1 18 89%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ECOLE SUPER ELECT INFORMAT TELECOMMUN MATH 4 75% 0.3% 3
2 CHAIR ELECT PHOTON METROL 4 20% 1.8% 16
3 KTH SIGNALS SENSORS SYST 3 100% 0.3% 3
4 MEASUREMENTS OPT ELECT 2 36% 0.6% 5
5 INZYNIERII BIOMED POMIAROWEJ 2 67% 0.2% 2
6 INZYNIERII BIOMEDYCZNEJ POMIAROWEJ 2 67% 0.2% 2
7 ELECT ENGN MEASUREMENT 1 50% 0.2% 2
8 INGN SCI INFORMAZ 1 100% 0.2% 2
9 INTEGRATED SIGNATURE MANAGEMENT GRP 1 100% 0.2% 2
10 WYDZIAL PODSTAWOWYCH PROBLEMOW TECH 1 100% 0.2% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000177339 ADV SUBSUR E IMAGING//TRANSITION DURATION//SAMPLING OSCILLOSCOPE
2 0.0000161820 POWER QUALITY PQ//POWER QUALITY EVENTS//ELECT AREA
3 0.0000113381 IEC 60060 1//LIGHTNING IMPULSE WITHSTAND VOLTAGE TEST//LIGHTNING IMPULSE VOLTAGE TEST
4 0.0000109457 AC DC TRANSFER//THERMAL CONVERTERS//AC DC DIFFERENCE
5 0.0000109113 ULTRASONIC MODEM//COMP SCI SECUR SCI//DR GPS
6 0.0000108625 HORIZONTAL ASYMMETRY//CONDITIONAL SIGNAL AVERAGING//CYCLE LOSS GAIN DETECTOR
7 0.0000106389 COMP SCI CONTROL SYST//TRANSMITTER TROUBLESHOOTING//RADIO FREQUENCY RF MEASUREMENTS
8 0.0000100750 ELEC//MULTISINE SIGNALS//MULTISINE EXCITATIONS
9 0.0000090584 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST
10 0.0000084175 ANALOG TO DIGITAL CONVERTER ADC//DIGITAL BACKGROUND CALIBRATION//PIPELINED ADC