Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
1176 | 2705 | 29.3 | 80% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
751 | 11810 | ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | DISSENY PROGRAMACIO SISTEMES ELECT | Address | 37 | 100% | 1% | 14 |
2 | FUTURE ENERGY IFES | Address | 21 | 90% | 0% | 9 |
3 | QPLUS | Author keyword | 18 | 83% | 0% | 10 |
4 | NONCONTACT ATOMIC FORCE MICROSCOPY | Author keyword | 17 | 54% | 1% | 22 |
5 | DYNAMIC FORCE MICROSCOPY | Author keyword | 15 | 53% | 1% | 20 |
6 | TIP SAMPLE INTERACTION | Author keyword | 15 | 56% | 1% | 18 |
7 | TIP SURFACE INTERACTION | Author keyword | 15 | 77% | 0% | 10 |
8 | NC AFM | Author keyword | 14 | 51% | 1% | 19 |
9 | BIMODAL AFM | Author keyword | 14 | 100% | 0% | 7 |
10 | TAPPING MODE | Author keyword | 13 | 30% | 1% | 35 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | QPLUS | 18 | 83% | 0% | 10 | Search QPLUS | Search QPLUS |
2 | NONCONTACT ATOMIC FORCE MICROSCOPY | 17 | 54% | 1% | 22 | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY |
3 | DYNAMIC FORCE MICROSCOPY | 15 | 53% | 1% | 20 | Search DYNAMIC+FORCE+MICROSCOPY | Search DYNAMIC+FORCE+MICROSCOPY |
4 | TIP SAMPLE INTERACTION | 15 | 56% | 1% | 18 | Search TIP+SAMPLE+INTERACTION | Search TIP+SAMPLE+INTERACTION |
5 | TIP SURFACE INTERACTION | 15 | 77% | 0% | 10 | Search TIP+SURFACE+INTERACTION | Search TIP+SURFACE+INTERACTION |
6 | NC AFM | 14 | 51% | 1% | 19 | Search NC+AFM | Search NC+AFM |
7 | BIMODAL AFM | 14 | 100% | 0% | 7 | Search BIMODAL+AFM | Search BIMODAL+AFM |
8 | TAPPING MODE | 13 | 30% | 1% | 35 | Search TAPPING+MODE | Search TAPPING+MODE |
9 | DYNAMIC AFM | 11 | 78% | 0% | 7 | Search DYNAMIC+AFM | Search DYNAMIC+AFM |
10 | FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY | 11 | 78% | 0% | 7 | Search FREQUENCY+MODULATION+ATOMIC+FORCE+MICROSCOPY | Search FREQUENCY+MODULATION+ATOMIC+FORCE+MICROSCOPY |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | REACTIVE SURFACES | 167 | 96% | 2% | 51 |
2 | SILICON 111 7X7 SURFACE | 69 | 72% | 2% | 54 |
3 | TAPPING MODE | 58 | 41% | 4% | 109 |
4 | VIBRATING TIP | 53 | 89% | 1% | 24 |
5 | TIP SAMPLE INTERACTION | 49 | 68% | 2% | 43 |
6 | CANTILEVERS | 46 | 17% | 9% | 251 |
7 | SAMPLE INTERACTION REGIMES | 30 | 69% | 1% | 25 |
8 | IONIC SURFACES | 29 | 53% | 1% | 39 |
9 | INTERMITTENT CONTACT | 27 | 76% | 1% | 19 |
10 | ULTRAHIGH VACUUM NONCONTACT | 24 | 82% | 1% | 14 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
The emergence of multifrequency force microscopy | 2012 | 118 | 99 | 79% |
Dynamic atomic force microscopy methods | 2002 | 904 | 202 | 71% |
Advances in atomic force microscopy | 2003 | 798 | 130 | 76% |
Cantilever dynamics in atomic force microscopy | 2008 | 70 | 96 | 86% |
Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods | 2011 | 80 | 318 | 36% |
Atomic force microscopy as a tool for atom manipulation | 2009 | 67 | 98 | 58% |
Theories of scanning probe microscopes at the atomic scale | 2003 | 276 | 190 | 37% |
Force measurements with the atomic force microscope: Technique, interpretation and applications | 2005 | 1232 | 1081 | 7% |
Mechanical characterization of polymeric thin films by atomic force microscopy based techniques | 2013 | 13 | 135 | 53% |
Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy | 2010 | 22 | 59 | 69% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | DISSENY PROGRAMACIO SISTEMES ELECT | 37 | 100% | 0.5% | 14 |
2 | FUTURE ENERGY IFES | 21 | 90% | 0.3% | 9 |
3 | PHYS ELECT CORRELAT MAGNETISM | 11 | 78% | 0.3% | 7 |
4 | ENERGY NANOSCI LENS | 8 | 56% | 0.4% | 10 |
5 | ENERGY NANOSCI | 7 | 26% | 0.8% | 22 |
6 | BIOELECT NANOBIOENGN GRP | 6 | 80% | 0.1% | 4 |
7 | SIC BIO | 6 | 80% | 0.1% | 4 |
8 | DISSENY | 6 | 100% | 0.1% | 4 |
9 | PROGRAMACIO SISTEMES ELECT | 6 | 100% | 0.1% | 4 |
10 | SECT NANOSTRUCT PHYS | 6 | 100% | 0.1% | 4 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000256072 | NANONEWTON//SPRING CONSTANT//NORMAL SPRING CONSTANT |
2 | 0.0000184264 | TIP CHARACTERIZATION//TIP CHARACTERIZER//SIDEWALL MEASUREMENT |
3 | 0.0000163140 | TUNNELING ACOUSTIC MICROSCOPY//SAW IMAGING//MICRODISPLACEMENT MEASUREMENT |
4 | 0.0000118385 | DNA NETWORK//FOR UNGSZENTRUM IBI STRUCT BIOL 2//CRYO AFM |
5 | 0.0000114525 | SCANNING CAPACITANCE MICROSCOPY//KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY |
6 | 0.0000109773 | CARBON NANOTUBE PROBES//CARBON NANOTUBE TIPS//HIGH DENSITY INFORMATION STORAGE |
7 | 0.0000102358 | MIGRATION VOLUME//SIMPLE CUBIC CRYSTAL//CONCENTRATION DIFFUSION EQUATION |
8 | 0.0000092713 | ATOMIC SCALE FRICTION//TOMLINSON MODEL//NANOTRIBOLOGY |
9 | 0.0000086913 | MAGNETIC FORCE MICROSCOPY//TYPE I MAGNETIC CONTRAST//MAGNETIC FORCE MICROSCOPY TIP |
10 | 0.0000086291 | LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//I S CHARACTERISTICS |