Class information for:
Level 1: WHITE LIGHT INTERFEROMETRY//COMMUNITY TABUK//PRECIS MECH CONTROL

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
11691 898 15.7 62%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1503 6998 PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY//COORDINATE MEASURING MACHINES//COORDINATE METROLOGY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 WHITE LIGHT INTERFEROMETRY Author keyword 6 13% 5% 46
2 COMMUNITY TABUK Address 6 71% 1% 5
3 PRECIS MECH CONTROL Address 5 26% 2% 16
4 DYNAMIC PROFILOMETRY Author keyword 4 75% 0% 3
5 SPECTRAL INTERFEROGRAM ANALYSIS Author keyword 4 75% 0% 3
6 ABSOLUTE POSITION MEASUREMENT Author keyword 3 100% 0% 3
7 ELLIPSO HEIGHT TOPOMETRY Author keyword 3 100% 0% 3
8 VERTICAL SCANNING INTERFEROMETRY VSI Author keyword 3 100% 0% 3
9 WHITE LIGHT SCANNING INTERFEROMETRY Author keyword 3 37% 1% 7
10 LENGTH Address 3 33% 1% 7

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 WHITE LIGHT INTERFEROMETRY 6 13% 5% 46 Search WHITE+LIGHT+INTERFEROMETRY Search WHITE+LIGHT+INTERFEROMETRY
2 DYNAMIC PROFILOMETRY 4 75% 0% 3 Search DYNAMIC+PROFILOMETRY Search DYNAMIC+PROFILOMETRY
3 SPECTRAL INTERFEROGRAM ANALYSIS 4 75% 0% 3 Search SPECTRAL+INTERFEROGRAM+ANALYSIS Search SPECTRAL+INTERFEROGRAM+ANALYSIS
4 ABSOLUTE POSITION MEASUREMENT 3 100% 0% 3 Search ABSOLUTE+POSITION+MEASUREMENT Search ABSOLUTE+POSITION+MEASUREMENT
5 ELLIPSO HEIGHT TOPOMETRY 3 100% 0% 3 Search ELLIPSO+HEIGHT+TOPOMETRY Search ELLIPSO+HEIGHT+TOPOMETRY
6 VERTICAL SCANNING INTERFEROMETRY VSI 3 100% 0% 3 Search VERTICAL+SCANNING+INTERFEROMETRY+VSI Search VERTICAL+SCANNING+INTERFEROMETRY+VSI
7 WHITE LIGHT SCANNING INTERFEROMETRY 3 37% 1% 7 Search WHITE+LIGHT+SCANNING+INTERFEROMETRY Search WHITE+LIGHT+SCANNING+INTERFEROMETRY
8 GROUP REFRACTIVE INDEX 3 35% 1% 6 Search GROUP+REFRACTIVE+INDEX Search GROUP+REFRACTIVE+INDEX
9 FULL FIELD HETERODYNE INTERFEROMETRY 2 67% 0% 2 Search FULL+FIELD+HETERODYNE+INTERFEROMETRY Search FULL+FIELD+HETERODYNE+INTERFEROMETRY
10 HETERODYNE BEAT SIGNAL 2 67% 0% 2 Search HETERODYNE+BEAT+SIGNAL Search HETERODYNE+BEAT+SIGNAL

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 WHITE LIGHT INTERFEROMETRY 24 27% 8% 75
2 FRINGE ORDER 17 79% 1% 11
3 MIRAU 15 88% 1% 7
4 TRANSPARENT PLATES 11 50% 2% 16
5 THICKNESS PROFILE 10 52% 1% 13
6 PROFILOMETRY 9 11% 9% 79
7 MIRAU CORRELATION MICROSCOPE 9 83% 1% 5
8 SURFACE PROFILOMETRY 8 70% 1% 7
9 INTERFERENCE MICROSCOPY 8 21% 4% 35
10 SCANNING INTERFEROMETRY 8 35% 2% 18

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Spatial Statistical Optics and Spatial Correlation Holography: A Review 2014 3 17 41%
Spatial and temporal coherence effects in interference microscopy and full-field optical coherence tomography 2012 14 72 56%
Bandwidth characteristics and comparisons of surface texture measuring instruments 2010 13 14 50%
Imagery by using coherent properties of probing radiation 1999 1 2 50%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 COMMUNITY TABUK 6 71% 0.6% 5
2 PRECIS MECH CONTROL 5 26% 1.8% 16
3 LENGTH 3 33% 0.8% 7
4 HGEBIET MESSTECH 2 67% 0.2% 2
5 REG JOINT PROJECT 2 67% 0.2% 2
6 INFORMAT PHOTON WAVE SIGNAL PROC 2 29% 0.7% 6
7 PRECIS MEASUREMENT GRP 1 31% 0.4% 4
8 PROBLEMS PRECIS MECH CONTROL 1 31% 0.4% 4
9 PRECIS ENGN METROL 1 100% 0.2% 2
10 ENGN MEASUREMENT 1 23% 0.6% 5

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000260760 ABSOLUTE LENGTH MEASUREMENT//GAUGE BLOCK//ULTRAFAST OPT ULTR RECIS GRP
2 0.0000167889 LASER INTERFERENCE MICROSCOPY//COHERENT PHASE MICROSCOPY//DYNAMIC PHASE MICROSCOPY
3 0.0000136613 LASER DYE SOLVENTS//SUB WAVELENGTH DIFFRACTION GRATING//DISPERSION FORMULAS
4 0.0000107729 PL COMP MECH//SPECKLE INTERFEROMETRY//SHEAROGRAPHY
5 0.0000101165 OPTICAL COHERENCE TOMOGRAPHY//ADV IMAGING GRP//COMPUTAT OPT GRP
6 0.0000078963 COLLIMATION TESTING//OPTICAL TESTING INSTRUMENTS//OPT LICADA
7 0.0000077373 INTENSITY LOSS//AXIAL SCALING//REFLECTANCE MICROSCOPY
8 0.0000074150 PROC MEASUREMENT SENSOR TECHNOL//NANOMETROLOGY//MICRO CMM
9 0.0000069579 MED OPT PHOTON//OPTICAL PROJECTION SYSTEM//SENSORIZED PLATFORM
10 0.0000066085 ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT