Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
11259 | 929 | 17.6 | 47% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
913 | 10550 | EL2//NONIONIZING ENERGY LOSS NIEL//DX CENTERS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | MAGNET SENSOR | Address | 24 | 82% | 2% | 14 |
2 | GROUP III V EXCEPT NITRIDES | Author keyword | 4 | 75% | 0% | 3 |
3 | COPPER VACANCY COMPLEX | Author keyword | 1 | 100% | 0% | 2 |
4 | M3 M4 DEFECTS | Author keyword | 1 | 100% | 0% | 2 |
5 | RADIATION RESISTANT HALL SENSORS | Author keyword | 1 | 100% | 0% | 2 |
6 | OBNINSK BRANCH | Address | 1 | 11% | 1% | 10 |
7 | RJA LEVESQUE | Address | 1 | 40% | 0% | 2 |
8 | DEEP LEVEL TRANSIENT SPECTROSCOPY DLTS | Author keyword | 1 | 12% | 1% | 7 |
9 | AS VACANCY | Author keyword | 1 | 50% | 0% | 1 |
10 | COMPLEX DOPING | Author keyword | 1 | 50% | 0% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AS GROWN GAAS | 19 | 51% | 3% | 27 |
2 | EL2 DEFECT | 7 | 30% | 2% | 21 |
3 | ENCAPSULATED CZOCHRALSKI GAP | 6 | 80% | 0% | 4 |
4 | GROWN N GAAS | 6 | 80% | 0% | 4 |
5 | NATIVE VACANCIES | 6 | 53% | 1% | 8 |
6 | IRRADIATION INDUCED DEFECTS | 5 | 20% | 3% | 24 |
7 | IRRADIATED GAP | 5 | 63% | 1% | 5 |
8 | METASTABLE VACANCY | 4 | 67% | 0% | 4 |
9 | TRANSMUTED IMPURITIES | 3 | 100% | 0% | 3 |
10 | ANTISITE RELATED DEFECTS | 3 | 60% | 0% | 3 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Positron annihilation spectroscopy of defects in semiconductors | 1998 | 70 | 78 | 28% |
IRRADIATION-INDUCED DEFECTS IN GAAS | 1985 | 329 | 34 | 56% |
Structural analysis of intrinsic defects in GaAs and A1(x)Gal(1-x)As by magnetooptically detected magnetic resonance spectroscopy | 1999 | 14 | 80 | 44% |
Modification of semiconductors with proton beams. A review | 2000 | 18 | 49 | 20% |
Radiation doping methods of semiconductor materials: The nuclear doping by charged particles | 1996 | 2 | 9 | 100% |
TRANSMUTATION DOPING OF SEMICONDUCTORS BY CHARGED-PARTICLES (REVIEW) | 1992 | 4 | 10 | 100% |
POSITRON-ANNIHILATION SPECTROSCOPY OF VACANCY-RELATED DEFECTS IN SEMICONDUCTORS | 1992 | 1 | 22 | 55% |
RADIATION DEFECTS IN SEMICONDUCTOR COMPOUND-II, COMPOUND-IV, COMPOUND-V2 | 1986 | 7 | 14 | 64% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MAGNET SENSOR | 24 | 82% | 1.5% | 14 |
2 | OBNINSK BRANCH | 1 | 11% | 1.1% | 10 |
3 | RJA LEVESQUE | 1 | 40% | 0.2% | 2 |
4 | RADIOISOTOPE RADIAT PL TEAM | 1 | 50% | 0.1% | 1 |
5 | KUZNETSOV PHYSICOTECH | 0 | 15% | 0.3% | 3 |
6 | PLASMA PHYS AS CR | 0 | 11% | 0.4% | 4 |
7 | COMPOUND SEMICOND MICROELE | 0 | 33% | 0.1% | 1 |
8 | UEPEM | 0 | 33% | 0.1% | 1 |
9 | LETICEA TECHNOL AVANCEES | 0 | 11% | 0.2% | 2 |
10 | NANO SCALE QUANTUM DEVICES | 0 | 20% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000216967 | EL2//CARBON ACCEPTOR//SEMI INSULATING GALLIUM ARSENIDE |
2 | 0.0000159713 | FE DOPED INP//PHOSPHORUS VAPOR PRESSURE//WAFER ANNEALING |
3 | 0.0000142657 | NONIONIZING ENERGY LOSS NIEL//DISPLACEMENT DAMAGE DOSE//NONIONIZING ENERGY LOSS |
4 | 0.0000125342 | SURFACE AND INTERFACE PHENOMENA//TELECOMMUN ADVANCEMENTS ORG//SENDAI |
5 | 0.0000125329 | DOT IN A WELL STRUCTURES//EXCITATION POWER DEPENDENCES//RECOMBINATION BARRIER |
6 | 0.0000105065 | LOCAL VIBRATION MODES//DIRECT FAST SCARLET 4BS//GAAS C |
7 | 0.0000101708 | POSITRON BEAM//SLOW POSITRON BEAM//POSITRON MICROSCOPE |
8 | 0.0000078945 | STATE SCI EXPT TECH INFORMAT PROTECT PRO//CN PPP//WIDE GAP NANOCRYSTALS |
9 | 0.0000073288 | LT GAAS//LOW TEMPERATURE GROWN GAAS//LOW TEMPERATURE GAAS |
10 | 0.0000072016 | GAP N//PICOSECOND TIMING RESOLUTION//SI H BOND DISSOCIATION |