Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
10936 | 954 | 27.2 | 64% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1854 | 5551 | ATOMIC LAYER DEPOSITION//CHEMICAL VAPOR DEPOSITION//MOLECULAR LAYER DEPOSITION MLD |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | PERFLUORINATED CARBOXYLATES | Author keyword | 11 | 65% | 1% | 11 |
2 | COPPER CVD | Author keyword | 6 | 71% | 1% | 5 |
3 | IR AND NMR | Author keyword | 6 | 71% | 1% | 5 |
4 | ZENTRUM MIKROTECHNOL | Address | 6 | 41% | 1% | 11 |
5 | COPPER FILMS | Author keyword | 4 | 30% | 1% | 12 |
6 | CU CVD | Author keyword | 4 | 75% | 0% | 3 |
7 | LOW INDEX SINGLE CRYSTAL SI SURFACES | Author keyword | 3 | 100% | 0% | 3 |
8 | CNRS 7071 | Address | 3 | 60% | 0% | 3 |
9 | AGI COMPLEXES | Author keyword | 2 | 25% | 1% | 8 |
10 | AUI COMPLEXES | Author keyword | 2 | 67% | 0% | 2 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PERFLUORINATED CARBOXYLATES | 11 | 65% | 1% | 11 | Search PERFLUORINATED+CARBOXYLATES | Search PERFLUORINATED+CARBOXYLATES |
2 | COPPER CVD | 6 | 71% | 1% | 5 | Search COPPER+CVD | Search COPPER+CVD |
3 | IR AND NMR | 6 | 71% | 1% | 5 | Search IR+AND+NMR | Search IR+AND+NMR |
4 | COPPER FILMS | 4 | 30% | 1% | 12 | Search COPPER+FILMS | Search COPPER+FILMS |
5 | CU CVD | 4 | 75% | 0% | 3 | Search CU+CVD | Search CU+CVD |
6 | LOW INDEX SINGLE CRYSTAL SI SURFACES | 3 | 100% | 0% | 3 | Search LOW+INDEX+SINGLE+CRYSTAL+SI+SURFACES | Search LOW+INDEX+SINGLE+CRYSTAL+SI+SURFACES |
7 | AGI COMPLEXES | 2 | 25% | 1% | 8 | Search AGI+COMPLEXES | Search AGI+COMPLEXES |
8 | AUI COMPLEXES | 2 | 67% | 0% | 2 | Search AUI+COMPLEXES | Search AUI+COMPLEXES |
9 | PERFLUORINATED CARBOXYLATE | 2 | 67% | 0% | 2 | Search PERFLUORINATED+CARBOXYLATE | Search PERFLUORINATED+CARBOXYLATE |
10 | DIRECT LIQUID INJECTION | 2 | 31% | 1% | 5 | Search DIRECT+LIQUID+INJECTION | Search DIRECT+LIQUID+INJECTION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HEXAFLUOROACETYLACETONATE | 58 | 60% | 7% | 64 |
2 | PERFLUORINATED CARBOXYLATES | 27 | 71% | 2% | 22 |
3 | VINYLTRIMETHYLSILANE | 24 | 60% | 3% | 26 |
4 | TRIMETHYLVINYLSILANE | 23 | 70% | 2% | 19 |
5 | DEVICE QUALITY COPPER | 20 | 100% | 1% | 9 |
6 | HELIUM CARRIER GAS | 14 | 100% | 1% | 7 |
7 | HEXAFLUOROACETYLACETONATE COMPLEXES | 13 | 80% | 1% | 8 |
8 | HFACCU1 5 COD | 12 | 86% | 1% | 6 |
9 | ALD PROCESSES | 11 | 67% | 1% | 10 |
10 | CUDPM2 | 11 | 78% | 1% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Current trends in patterning with copper | 2002 | 88 | 134 | 59% |
Copper(I), silver(I) and gold(I) carboxylate complexes as precursors in chemical vapour deposition of thin metallic films | 2005 | 89 | 79 | 52% |
Why is coordination chemistry stretching the limits of micro-electronics technology? | 1998 | 96 | 38 | 71% |
Precursors and chemistry for the atomic layer deposition of metallic first row transition metal films | 2013 | 13 | 99 | 40% |
CHEMICAL-VAPOR-DEPOSITION OF COPPER FROM (HFAC)CUL COMPOUNDS | 1995 | 67 | 53 | 74% |
FTIR STUDIES OF THE ADSORPTION/DESORPTION BEHAVIOR OF COPPER CHEMICAL-VAPOR-DEPOSITION PRECURSORS ON SILICA .1. BIS(1,1,1,5,5,5-HEXAFLUOROACETYLACETONATO)COPPER(II) | 1994 | 30 | 42 | 83% |
Metal ALD and pulsed CVD: Fundamental reactions and links with solution chemistry | 2013 | 8 | 161 | 21% |
Preparation of thin copper films from the vapour phase of volatile copper(I) and copper(II) derivatives by the CVD method | 2000 | 6 | 287 | 61% |
CHEMICAL-VAPOR-DEPOSITION OF METALS .2. OVERVIEW OF SELECTIVE CVD OF METALS | 1995 | 18 | 48 | 44% |
SELECTIVE METALLIZATION BY CHEMICAL-VAPOR-DEPOSITION | 1993 | 68 | 83 | 28% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ZENTRUM MIKROTECHNOL | 6 | 41% | 1.2% | 11 |
2 | CNRS 7071 | 3 | 60% | 0.3% | 3 |
3 | LEHRSTUHL MIKROTECHNOL | 2 | 67% | 0.2% | 2 |
4 | PHYS 1SC25 | 1 | 100% | 0.2% | 2 |
5 | SCI MAT ENGN | 1 | 16% | 0.7% | 7 |
6 | ADV MAT PROCLAMP | 1 | 50% | 0.1% | 1 |
7 | CHEM CRYSTALLOG SERV | 1 | 50% | 0.1% | 1 |
8 | CHEM SCI MAT SCI ENGN | 1 | 50% | 0.1% | 1 |
9 | CHEM TECHNOL MAT CHARACTERIZAT | 1 | 50% | 0.1% | 1 |
10 | DTGSI | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000195350 | NIPF34//SI3H8//VOLATILE COMPLEXES |
2 | 0.0000157176 | DIFFUSION BARRIER//CU METALLIZATION//TANTALUM NITRIDE |
3 | 0.0000148018 | IRIDIUM COATING//IRIDIUM COATINGS//IR COATING |
4 | 0.0000120446 | INDUCTIVELY COUPLED PLASMA REACTIVE ION ETCHING//TI HARD MASK//CL 2 BASED PLASMA |
5 | 0.0000113062 | SUPERCRITICAL FLUID DEPOSITION//TBP HNO3 COMPLEX//SUPERCRITICAL DEPOSITION |
6 | 0.0000111161 | LASER MICRO CLADDING//FREEFORM FABRICAT S//DIMETHYLALUMINUM HYDRIDE |
7 | 0.0000095850 | LANTHANIDE BETA DIKETONATES//BETA DIKETONATES//BETA DIKETONATE CHELATES |
8 | 0.0000088255 | ELECTROLESS COPPER PLATING//ELECTROLESS COPPER DEPOSITION//ELECTROLESS DEPOSITION |
9 | 0.0000087017 | ATOMIC LAYER DEPOSITION//MOLECULAR LAYER DEPOSITION MLD//MOLECULAR LAYER DEPOSITION |
10 | 0.0000086826 | CVD W//FEATURE SCALE MODEL//FOCUS NEW YORK |