Class information for:
Level 1: NOISE PARAMETERS//HIGH FREQUENCY HF NOISE//KINK PHENOMENON

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
10789 967 15.8 48%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
97 24964 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 NOISE PARAMETERS Author keyword 26 40% 5% 51
2 HIGH FREQUENCY HF NOISE Author keyword 15 88% 1% 7
3 KINK PHENOMENON Author keyword 15 88% 1% 7
4 CHANNEL THERMAL NOISE Author keyword 11 54% 1% 14
5 INDUCED GATE NOISE Author keyword 9 43% 2% 17
6 RF MOSFETS Author keyword 9 67% 1% 8
7 SUBSTRATE RESISTANCE Author keyword 8 40% 2% 16
8 RF MOSFET Author keyword 7 46% 1% 12
9 RF NOISE Author keyword 7 38% 2% 15
10 DE EMBEDDING Author keyword 7 21% 3% 30

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
LCSH search Wikipedia search
1 NOISE PARAMETERS 26 40% 5% 51 Search NOISE+PARAMETERS Search NOISE+PARAMETERS
2 HIGH FREQUENCY HF NOISE 15 88% 1% 7 Search HIGH+FREQUENCY+HF+NOISE Search HIGH+FREQUENCY+HF+NOISE
3 KINK PHENOMENON 15 88% 1% 7 Search KINK+PHENOMENON Search KINK+PHENOMENON
4 CHANNEL THERMAL NOISE 11 54% 1% 14 Search CHANNEL+THERMAL+NOISE Search CHANNEL+THERMAL+NOISE
5 INDUCED GATE NOISE 9 43% 2% 17 Search INDUCED+GATE+NOISE Search INDUCED+GATE+NOISE
6 RF MOSFETS 9 67% 1% 8 Search RF+MOSFETS Search RF+MOSFETS
7 SUBSTRATE RESISTANCE 8 40% 2% 16 Search SUBSTRATE+RESISTANCE Search SUBSTRATE+RESISTANCE
8 RF MOSFET 7 46% 1% 12 Search RF+MOSFET Search RF+MOSFET
9 RF NOISE 7 38% 2% 15 Search RF+NOISE Search RF+NOISE
10 DE EMBEDDING 7 21% 3% 30 Search DE+EMBEDDING Search DE+EMBEDDING

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 DEEP SUBMICRON MOSFETS 26 50% 4% 37
2 SCATTERING PARAMETER S 22 20 100% 1% 9
3 RF MOSFETS 17 72% 1% 13
4 DE EMBEDDING METHOD 15 82% 1% 9
5 HIGH FREQUENCY NOISE 14 39% 3% 28
6 INTERNAL TOPOLOGY 8 100% 1% 5
7 DEVICE NOISE 6 58% 1% 7
8 SUBSTRATE RESISTANCE 6 58% 1% 7
9 PAD PARASITICS 5 60% 1% 6
10 RF IC DESIGN 5 34% 1% 11

Journals

Reviews



Title Publ. year Cit. Active references % act. ref.
to same field
Compact noise models for MOSFETs 2006 41 68 63%
Wave-based approach for microwave noise characterization 2008 1 22 95%
RF MOSFET: recent advances, current status and future trends 2003 21 16 25%
On the noise resistance of field-effect transistors at microwave frequencies 2001 0 15 67%
Green's functions approach to mos physics-based compact noise modelling 2001 1 2 50%
Nanoscale FETs 2012 0 109 30%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 UNITA TORINO POLITECN 3 57% 0.4% 4
2 FLUCTUAT PHENOMENA 3 60% 0.3% 3
3 RF INTEGRATED SYST CIRCUITS GRP 3 60% 0.3% 3
4 FG MIKROWELLENTECH 2 67% 0.2% 2
5 CMOS DEVICE DESIGN 1 100% 0.2% 2
6 IC DESIGN EXCELLENCE 1 29% 0.4% 4
7 DICIEAMA 1 27% 0.4% 4
8 TSC 1 14% 0.7% 7
9 ATD MODELING 1 40% 0.2% 2
10 ROBUST POWER SEMICOND SYST 1 40% 0.2% 2

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000200229 SCATTERING PARAMETER MEASUREMENT//SCATTERING MATRIX MEASUREMENT//MICROWAVE NETWORK ANALYZER
2 0.0000172189 NONQUASI STATIC NQS EFFECT//QUCS//RSCE
3 0.0000167747 LARGE SIGNAL MODEL//NONLINEAR MEASUREMENTS//MESFETS
4 0.0000110857 LOW NOISE AMPLIFIER LNA//LOW NOISE AMPLIFIER//PASSIVE MIXER
5 0.0000099528 SPIRAL INDUCTOR//MASTERSLICE//INDUCTOR MODEL
6 0.0000088145 SIMULAT OPTIMIZAT SYST//ENGN OPTIMIZAT MODELING//SPACE MAPPING
7 0.0000081087 DOUBLE GATE MOSFET//FINFET//SHORT CHANNEL EFFECTS
8 0.0000078544 DISTRIBUTED AMPLIFIER//DISTRIBUTED AMPLIFIERS//DISTRIBUTED AMPLIFIER DA
9 0.0000071220 REAL FREQUENCY TECHNIQUES//BROADBAND MATCHING//REAL FREQUENCY TECHNIQUE
10 0.0000062005 PARTIAL ELEMENT EQUIVALENT CIRCUIT PEEC//ON CHIP CIRCUITS//PARTIAL ELEMENT EQUIVALENT CIRCUIT