Class information for:
Level 1: IN SITU RESISTIVITY//CIENCIAS CONSTRUCC//ELECTRON SURFACE SCATTERING

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
10782 967 21.0 41%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2332 4012 FIZIKA NIZKIKH TEMPERATUR//ULTRA HIGH PURITY ALUMINUM//CITYMAC

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IN SITU RESISTIVITY Author keyword 6 71% 1% 5
2 CIENCIAS CONSTRUCC Address 2 44% 0% 4
3 ELECTRON SURFACE SCATTERING Author keyword 2 50% 0% 3
4 CALLENDAR VAN DUSEN Author keyword 1 100% 0% 2
5 DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES Author keyword 1 100% 0% 2
6 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS Author keyword 1 100% 0% 2
7 ELECTROCOMPONENT SCIENCE AND TECHNOLOGY Journal 1 12% 1% 10
8 MC CO LTD Address 1 40% 0% 2
9 COPPER NANOROD Author keyword 1 50% 0% 1
10 ELECTRONIC PROPERTIES AND MATERIALS Author keyword 1 50% 0% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 IN SITU RESISTIVITY 6 71% 1% 5 Search IN+SITU+RESISTIVITY Search IN+SITU+RESISTIVITY
2 ELECTRON SURFACE SCATTERING 2 50% 0% 3 Search ELECTRON+SURFACE+SCATTERING Search ELECTRON+SURFACE+SCATTERING
3 CALLENDAR VAN DUSEN 1 100% 0% 2 Search CALLENDAR+VAN+DUSEN Search CALLENDAR+VAN+DUSEN
4 DIELECTRIC CONSTANTS FROM DC TO MICROWAVE FREQUENCIES 1 100% 0% 2 Search DIELECTRIC+CONSTANTS+FROM+DC+TO+MICROWAVE+FREQUENCIES Search DIELECTRIC+CONSTANTS+FROM+DC+TO+MICROWAVE+FREQUENCIES
5 ELECTRICAL RESISTIVITY OF METALLIC THIN FILMS 1 100% 0% 2 Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS Search ELECTRICAL+RESISTIVITY+OF+METALLIC+THIN+FILMS
6 COPPER NANOROD 1 50% 0% 1 Search COPPER+NANOROD Search COPPER+NANOROD
7 ELECTRONIC PROPERTIES AND MATERIALS 1 50% 0% 1 Search ELECTRONIC+PROPERTIES+AND+MATERIALS Search ELECTRONIC+PROPERTIES+AND+MATERIALS
8 IRIDIUM FILMS 1 50% 0% 1 Search IRIDIUM+FILMS Search IRIDIUM+FILMS
9 METALLIC NANOFILMS 1 50% 0% 1 Search METALLIC+NANOFILMS Search METALLIC+NANOFILMS
10 MOCVD CO 1 50% 0% 1 Search MOCVD+CO Search MOCVD+CO

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 EXTERNAL SURFACES 16 40% 3% 31
2 RESISTIVITY MODEL 10 61% 1% 11
3 METALLIC FILMS 9 15% 5% 53
4 SURFACE INDUCED RESISTIVITY 8 75% 1% 6
5 POLYCRYSTALLINE FILMS 7 18% 4% 35
6 INDUCED RESISTIVITY 6 80% 0% 4
7 UNLIKE SURFACES 6 80% 0% 4
8 ULTRATHIN METALLIC FILMS 4 39% 1% 9
9 ELECTRICAL RESISTIVITY MODEL 3 31% 1% 9
10 MESOSCOPIC BEHAVIOR 3 100% 0% 3

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELECTROCOMPONENT SCIENCE AND TECHNOLOGY 1 12% 1% 10

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Size-Dependent Resistivity in Nanoscale Interconnects 2009 51 53 30%
Study of the thermal, electrical and thermoelectric properties of metallic nanofilms 2013 5 66 20%
A review of characterization and physical property studies of metallic nanoparticles 2001 71 39 15%
SOME TRANSPORT-PROPERTIES OF TRANSITION-METAL FILMS 1985 15 50 78%
EFFECT OF DEFECT STRUCTURE ON THE ELECTRICAL-CONDUCTION MECHANISM IN METALLIC THIN-FILMS 1985 8 21 86%
THE RESISTIVITY, TEMPERATURE-COEFFICIENT OF RESISTIVITY AND THERMOELECTRIC-POWER OF THIN CONTINUOUS METAL-FILMS .1. A SURVEY AND CRITICAL-APPRAISAL OF THE APPLICATION OF PROCESSING METHODS TO EXPERIMENTAL-DATA 1987 1 36 92%
ELECTRICAL-PROPERTIES OF LOW-TEMPERATURE-CONDENSED FINE-CRYSTALLINE AND AMORPHOUS FILMS OF METALS 1982 12 25 40%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CIENCIAS CONSTRUCC 2 44% 0.4% 4
2 MC CO LTD 1 40% 0.2% 2
3 MAT DEVICES INTEGRATED SYST 1 50% 0.1% 1
4 NCN 1 29% 0.2% 2
5 MAGNETISM THEORY 1 20% 0.3% 3
6 PROC TECHNOL MODELING DESIGN TECHNOL SOLUT 0 33% 0.1% 1
7 CIENCIAS FISICAS MATEMAT 0 25% 0.1% 1
8 LEPCM 0 11% 0.2% 2
9 PROBLEMS MICROELECT TECHNOL HIGH PUR 0 20% 0.1% 1
10 SPINTRON MEDIA INTER E 0 17% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000133433 AL SI MODIFICATION//DEFORMATION REGIONS//FB PHYS CHEM
2 0.0000089543 ULTRA HIGH PURITY ALUMINUM//ULTRA HIGH VACUUM MELTING//GLOW DISCHARGE MASS SPECTROMETRY GDMS ANALYSIS
3 0.0000084222 QUANTUM WELL STATES//ELECTRONIC GROWTH//QUANTUM SIZE EFFECTS
4 0.0000080018 DIRECT FORCE//WISSEN BEREICH THEORET PHYS//SCI PHYS ASTRON
5 0.0000067628 SENSORS SUR E TECHNOL PARTNERSHIP//SMART MAT MEMS//THIN FILM THERMOCOUPLES
6 0.0000066566 RESISTIVE FILMS//RELATIVE RESISTANCE CHANGE//MINIST HIGH TEMP MAT TESTS
7 0.0000057528 DIELECTRIC CAPACITOR//ROUGHNESS ACCESSIBILITY//CONDUCTOR AND DIELECTRIC LOSSES
8 0.0000054104 BOUNDARY VALUE PROBLEM WITH MOVING BOUNDS//HYDROGEN THERMODESORPTION//KINETICS OF HYDROGEN DESORPTION
9 0.0000052549 BRILLOUIN SCATTERING SPECTROSCOPY//SUPERMODULUS EFFECT//AG FE MULTILAYERS
10 0.0000049852 AL SB//ALSB//BILAYER MIXING