Class information for:
Level 1: CONDENSED GASES//ELECTRONIC SPUTTERING//PLASMA DESORPTION MASS SPECTROMETRY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
10738 971 25.5 53%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
192 20771 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CONDENSED GASES Author keyword 8 100% 1% 5
2 ELECTRONIC SPUTTERING Author keyword 7 33% 2% 18
3 PLASMA DESORPTION MASS SPECTROMETRY Author keyword 6 34% 2% 15
4 XY TOF Author keyword 6 100% 0% 4
5 SPONTANEOUS DESORPTION Author keyword 4 67% 0% 4
6 SECONDARY IONS Author keyword 3 33% 1% 7
7 SURFACE TRACKS Author keyword 3 50% 0% 4
8 GROWTH OF FILMS Author keyword 2 67% 0% 2
9 SECONDARY ION EMISSION Author keyword 2 19% 1% 10
10 OFD Address 2 50% 0% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 CONDENSED GASES 8 100% 1% 5 Search CONDENSED+GASES Search CONDENSED+GASES
2 ELECTRONIC SPUTTERING 7 33% 2% 18 Search ELECTRONIC+SPUTTERING Search ELECTRONIC+SPUTTERING
3 PLASMA DESORPTION MASS SPECTROMETRY 6 34% 2% 15 Search PLASMA+DESORPTION+MASS+SPECTROMETRY Search PLASMA+DESORPTION+MASS+SPECTROMETRY
4 XY TOF 6 100% 0% 4 Search XY+TOF Search XY+TOF
5 SPONTANEOUS DESORPTION 4 67% 0% 4 Search SPONTANEOUS+DESORPTION Search SPONTANEOUS+DESORPTION
6 SECONDARY IONS 3 33% 1% 7 Search SECONDARY+IONS Search SECONDARY+IONS
7 SURFACE TRACKS 3 50% 0% 4 Search SURFACE+TRACKS Search SURFACE+TRACKS
8 GROWTH OF FILMS 2 67% 0% 2 Search GROWTH+OF+FILMS Search GROWTH+OF+FILMS
9 SECONDARY ION EMISSION 2 19% 1% 10 Search SECONDARY+ION+EMISSION Search SECONDARY+ION+EMISSION
10 SECONDARY ION 2 25% 1% 7 Search SECONDARY+ION Search SECONDARY+ION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 FROZEN GASES 20 100% 1% 9
2 NONOVERLAPPING SUBSPIKES 14 100% 1% 7
3 ION INDUCED DESORPTION 13 61% 1% 14
4 INDUCED SURFACE TRACKS 11 100% 1% 6
5 VOLATILE SOLIDS 11 69% 1% 9
6 LOW ENERGY CASCADES 10 73% 1% 8
7 LARGE ORGANIC MOLECULES 10 33% 3% 25
8 FROZEN H2O 9 83% 1% 5
9 ATOMIC EJECTION 8 70% 1% 7
10 INDUCED DESORPTION 7 20% 3% 33

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
FAST HEAVY-ION INDUCED DESORPTION 1989 54 58 88%
CF-252 PLASMA DESORPTION MASS-SPECTROMETRY 1985 273 94 74%
Particle-induced desorption in mass spectrometry .1. Mechanisms and processes 1995 20 140 55%
SPUTTERING OF FROZEN GASES 1987 51 53 85%
PRINCIPLES OF CF-252 PLASMA DESORPTION MASS-SPECTROMETRY APPLIED TO PROTEIN-ANALYSIS 1990 13 6 83%
SAMPLE PREPARATION FOR PLASMA DESORPTION MASS-SPECTROMETRY 1990 8 8 100%
CF-252 PLASMA DESORPTION MASS-SPECTROMETRY - LARGE MOLECULES, SOFTWARE, AND THE ESSENCE OF TIME 1983 88 9 56%
Plasma desorption mass spectrometry of natural substances .1. Characteristics of the method and its applications to the analysis of proteins and peptides. 1996 0 103 76%
DESORPTION OF ORGANIC-MOLECULES FROM SOLID AND LIQUID SURFACES INDUCED BY PARTICLE IMPACT 1991 2 85 69%
MASS-SPECTROMETRY WITH IONIZATION INDUCED BY FISSION FRAGMENTS OF CF-252 NUCLEI 1991 0 69 72%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 OFD 2 50% 0.3% 3
2 AT VAC 1 100% 0.2% 2
3 DVEE 1 50% 0.2% 2
4 INGN IST FIS 1 50% 0.2% 2
5 RCMAS 1 40% 0.2% 2
6 CHEM STRUCT REACT 1 50% 0.1% 1
7 LACAM 1 50% 0.1% 1
8 OPT FLUID MECH 1 50% 0.1% 1
9 PHYS NUCL ORSAYIN2P3 1 50% 0.1% 1
10 ALLGEMEINE PHYS 134 0 33% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000182234 ACTIVATION SPECTROSCOPY//RARE GAS SOLIDS//EXCITON INDUCED DEFECTS
2 0.0000171050 CHARGE REMOTE FRAGMENTATION//FAST ATOM BOMBARDMENT//INTERNAL CALIBRANT
3 0.0000152331 MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT
4 0.0000139690 ION MIRROR//ORTHOGONAL ACCELERATION//TIME OF FLIGHT DESIGN
5 0.0000124541 SWIFT HEAVY IONS//THERMAL SPIKE//THERMAL SPIKE MODEL
6 0.0000118484 KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING
7 0.0000085127 FUNCT LASER TERAHERTZ TECHNOL//BEARING AREA CURVE//CRYSTALLINE PLATES
8 0.0000079230 EMISSION STATISTICS//PARTICLE INDUCED ELECTRON EMISSION//KINETIC ELECTRON EMISSION
9 0.0000073326 MAT CHARACTERIZAT PREPARAT IL//ADV ENGN MAT IL//STATIC SECONDARY ION MASS SPECTROMETRY
10 0.0000061643 LAMMS//LASER MICROPROBE MASS SPECTROMETRY//FOURIER TRANSFORM LASER MICROPROBE MASS SPECTROMETRY