Prepare pristine samples for SEM (EBSD) with the new Ion Beam polisher
The new ion beam polisher is a useful sample preparation tool for materials that are environment- and beam-sensitive, such as metals, polymers, ceramics and composites. For these materials, pristine, damage free samples can be produced by the ion beam technique. The ion beam technique also enables the preparation of smooth surfaces when the material is a hard metal.
A new JEOL Ion Beam Cross Section Polisher (CP) has just been installed in the Hultgren Laboratory.
This ion beam polisher is intended to complement and extend the Hultgren Laboratory's mechanical and electron sample preparation tools for Scanning Electron Microscopy (SEM), especially when using the SEM instrument in Electron backscatter diffraction (EBSD) mode.
This ion beam polisher prepares pristine samples of materials that are environment- and beam-sensitive, such as metals, polymers, ceramics and composites - without inadvertently damaging or changing the material.
For more information about the device, see the supplier's information here .
To use this sample preparation tool, apply for your license in the LIMS system .